titan electron microscope
titan electron microscope, Total:144 items.
The international standard classification for "titan electron microscope" includes: Optics and optical measurements in general , Ophthalmic equipment , Chemical analysis , Optical equipment .
The Chinese standard classification for "titan electron microscope" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Chemical Measurement , Medical optical instrument and endoscope , Basic standards and general methods .
Professional Standard - Machinery
- JB/T 8230.4-1997 Microscope Cover Glass
- JB/T 5383-1991 Specification for Transmission Electron Microscope
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 9333-1999 Microscopes -- Immersion oil for general use in light microscopy
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
- JB/T 5480-1991 Diaphragm of Electron Microscope
- JB/T 8230.3-1997 Microscope slides
- JB/T 5481-1991 Lamp Filament of Electron Microscope
- JB/T 5477-1991 Microscope - Immersion Oil for Fluorescence Microscopy
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 7398.13-1994 Specimens slides for microscopes and biological microscopes
Professional Standard - Education
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 011-1996 General rules for transmission electron microscopy
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
- JY/T 010-1996 General rules for analytical scanning electron microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
Professional Standard - Medicine
- YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 42886-2023 Microscopes—Microscopes with digital imaging displays—Information provided to the user regarding imaging performance
- GB 7667-1996 The dose of X-rays leakage from electron microscope
- GB/T 26600-2024 Microscopes—Immersion liquid for light microscopy
- GB 6273-1986 Cover glasses for microscopes
- GB/T 26600-2011 Microscopes—Immersion liquids for light microscopy
- GB 7667-2003 The dose of X-rays leakage from electron microscope
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
Taiwan Provincial Standard of the People's Republic of China
- CNS 3063-1985 Slide Glasses for Microscope
- CNS 11420-1985 Cover Glass for Microscope
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
国家能源局
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
Professional Standard - Petroleum
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SCC
- BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
- BS ISO 19012-1:2007 Optics and photonics. Designation of microscope objectives-Flatness of field/plan
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- 12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
- DIN 58889:1986 Lenses and oculars for microscops - Marking
- ISO 8036:2015 Plus Redline Microscopes - Immersion liquids for light microscopy (includes Redline Version)
GSO
- BH GSO ISO 19012-1:2016 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 9344:2016 Microscopes - Graticules for eyepieces
- ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
- BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
- BS ISO 9344:2016 Microscopes. Graticules for eyepieces
- BS ISO 9344:2011 Microscopes. Graticules for eyepieces
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
- BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS 7012-8:1997 Light microscopes - Graticules for eyepieces
- BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- 18/30339977 DC BS ISO 21073. Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 2400:1988 Immersion oil for microscope
- JIS T 7317:1988 Operation microscopes
Korean Agency for Technology and Standards (KATS)
- KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
- KS B ISO 19012-1-2021 Optics and photonics－Designation of microscope objectives－Part 1：Flatness of field/Plan
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
- KS I 0051-1999 General rules for scanning electron microscopy
- KS B 5605-1987 Biological Microscopes for Immersion Objectives
- KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
- KS P 1232-2008 Operation microscopes
- KS B 5611-1987 Biological microscopes for dry objectives
- KS B 5611-2004 Biological microscopes for dry objectives
- KS M 2617-2022 Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
- KS M 2617-2007(2017) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
- KS L 2010-2019 Slide glasses for microscope
- KS B ISO 11884-2-2011(2021) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
- KS B ISO 11884-2-2011(2016) Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
- KS M 2617-2007(2022) Optics and optical instruments－Microscopes－Immersion oil for general use in light microscopy
- KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
- KS B ISO 11884-2:2011 Optics and photonics－Minimum requirements for stereomicroscope－Part 2：High performance microscopes
KR-KS
- KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
Association Francaise de Normalisation
- NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
- NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
- IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
Association of German Mechanical Engineers
- DVS 2803-1974 Electron-beam welding in microscopy (survey)
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components
Military Standards (MIL-STD)
- DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
- DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
German Institute for Standardization
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
- DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
- DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
American Society for Testing and Materials (ASTM)
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM D7201-06(2011) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
- ASTM D1245-84(2003) Standard Practice for Examination of Water-Formed Deposits by Chemical Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
RU-GOST R
- GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
IN-BIS
- IS 12452-1988 Specifications for packaging of export microscopes
- IS 8275-1976 Specification for binocular eyepieces for microscopes
International Electrotechnical Commission (IEC)
- IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components
