SEM radiation

SEM radiation, Total:115 items.

The international standard classification for "SEM radiation" includes: Protection against crime , Other standards related to analytical chemistry , Optical equipment , Linear and angular measurements in general , Metallic coatings , Linear and angular measurements , Chemical analysis .

The Chinese standard classification for "SEM radiation" includes: Crime judging technology , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Material Protection , Chemical Measurement , Basic standards and general methods .

Military Standard of the People's Republic of China-General Armament Department

GJB 2666-1996 Specification for scanning reflective beryllium mirrors
GJB 2666A-2018 Specification for scanning reflective beryllium mirrors

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 17722-1999 Gold-plated thickness measurement by SEM
GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
GB/T 16594-1996 Micron grade lenght measurement by SEM
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry

National Metrological Technical Specifications of the People's Republic of China

JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Machinery

JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 6842-1993 Test Method of Scanning Electron Microscope

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
SN/T 3009-2011 Identification of Seawater Corrosion on Metallic Surface by SEM
SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export-Part 1:X-ray diffraction and scan electron microscopy method

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Group Standards of the People's Republic of China

T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/CIRA 42-2022 Electron accelerator beam scanning uniformity detection method for aluminum rods used in radiation processing

Professional Standard - Public Safety Standards

GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Fujian Provincial Standard of the People's Republic of China

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

未注明发布机构

DIN EN 16016-4 E:2009-11 Non destructive testing - Radiation methods - Computed tomography - Part 4: Qualification

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

British Standards Institution (BSI)

PD IEC/TS 61967-3:2014 Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. Surface scan method
BS PD IEC/TS 61967-3:2014 Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. Surface scan metho
BS DD IEC/TS 61967-3:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHzto 1 GHz - Measurement of radiated emissions - Surface scan method
BS ISO 15708-1:2017 Non-destructive testing. Radiation methods for computed tomography. Terminology
BS ISO 15708-4:2017 Non-destructive testing. Radiation methods for computed tomography. Qualification
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS EN 16016-1:2011 Non destructive testing. Radiation methods. Computed tomography. Terminology
BS EN 16016-4:2011 Non destructive testing. Radiation methods. Computed tomography. Qualification
PD IEC/TS 62132-9:2014 Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. Surface scan method
BS PD IEC/TS 62132-9:2014 Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. Surface scan method
BS ISO 15708-3:2017 Non-destructive testing. Radiation methods for computed tomography. Operation and interpretation
BS EN 16016-3:2011 Non destructive testing. Radiation methods. Computed Tomography. Operation and interpretation
BS EN ISO 15708-1:2019 Non-destructive testing. Radiation methods for computed tomography. Terminology
BS EN ISO 15708-4:2019 Non-destructive testing. Radiation methods for computed tomography. Qualification

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy

American Society for Testing and Materials (ASTM)

ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

International Electrotechnical Commission (IEC)

IEC TS 61967-3:2014 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC 47A/912/CD:2013 IEC/TS 61967-3, Ed. 2: Integrated Circuits - Measurement of Electromagnetic Emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC TS 61967-3:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 3: Measurement of radiated emissions - Surface scan method
IEC 47A/880/CD:2012 Integrated Circuits - Measurement of Electromagnetic Emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC 47A/900/CD:2013 IEC/TS 61967-3, Ed. 2: Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC 47A/925/DTS:2014 IEC/TS 61967-3, Ed. 2: Integrated Circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 15708-4:2017 Non-destructive testing - Radiation methods for computed tomography - Part 4: Qualification
ISO 15708-1:2002 Non-destructive testing - Radiation methods - Computed tomography - Part 1: Principles
ISO 15708-1:2017 Non-destructive testing - Radiation methods for computed tomography - Part 1: Terminology

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc.

ASHRAE SF-98-29-1-1998 Measurement of Radiant Heat Gain from Office Equipment Using a Scanning Radiometer (RP-822)

SCC

13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
DIN IEC /TS 61967-3:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method

GSO

GSO ISO/ASTM 51608:2015 Practice for dosimetry in an X-ray (bremsstrahlung) facility for radiation processing at energies between 50 keV and 7.5 MeV
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO IEC/TS 61967-3:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
OS GSO IEC/TS 61967-3:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

Korean Agency for Technology and Standards (KATS)

KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS P 8141-2022 Eye protectors for radiations
KS B ISO 15708-1:2008 Non-destructive testing－Radiation methods－Computed tomography－Part 1：Principles
KS P 8141-2012(2022) Eye protectors for radiations

German Institute for Standardization

DIN IEC/TS 61967-3:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
DIN IEC/TS 61967-3:2012 Integrated Circuits - Measurement of Electromagnetic Emissions - Part 3: Measurement of radiated emissions - Surface scan methodIntegrated circuits (IEC 47A/880/CD:2012)
DIN 6871-1:2003-02 Cyclotron systems for positron emissions tomography - Part 1: Requirements for constructional radiation protection

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

Society of Automotive Engineers (SAE)

SAE J1752-2-2003 Measurement of Radiated Emissions from Integrated CircuitsSurface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE J1752/2-2011 Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE J1752/2-2003 Measurement of Radiated Emissions from Integrated Circuits -- Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE J1752/2-1995 Measurement of Radiated Emissions From Integrated Circuits-Surface Scan Method (Loop Probe Method) 10 Mhz to 3 Ghz
SAE J1752/2-2016 Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

SAE - SAE International

SAE J1752-2-2016 Measurement of Radiated Emissions from Integrated Circuits-Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

Association of German Mechanical Engineers

VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method

ECIA - Electronic Components Industry Association

502-A-1989 Recommended Practice for Measurement of X-Radiation from Non-Raster-Scanned Direct-View Cathode Ray Tubes

CEN - European Committee for Standardization

EN ISO 15708-1:2019 Non-destructive testing - Radiation methods for computed tomography - Part 1: Terminology
EN ISO 15708-4:2019 Non-destructive testing - Radiation methods for computed tomography - Part 4: Qualification

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