Scanning electron microscope tester

Scanning electron microscope tester, Total:59 items.

The international standard classification for "Scanning electron microscope tester" includes: Chemical analysis , Protection against crime , Other standards related to analytical chemistry , Linear and angular measurements in general , Metallic coatings , Textile fibres .

The Chinese standard classification for "Scanning electron microscope tester" includes: Electron optics and other physical optics instrument , Chemical Measurement , Basic standards and general methods , Crime judging technology , Electrochemical, thermochemistry and optical profile type analyzer , Material Protection .

Professional Standard - Machinery

JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

Group Standards of the People's Republic of China

T/ZZB 0608-2018 3D dental scanner
T/NLIA 004-2021 In-situ SEM tensile test method for additive manufactured aluminum alloy
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images

Military Standard of the People's Republic of China-General Armament Department

GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy
GJB 2666-1996 Specification for scanning reflective beryllium mirrors
GJB 2666A-2018 Specification for scanning reflective beryllium mirrors

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 16594-1996 Micron grade lenght measurement by SEM
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS
GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

GJB 5891.6-2006 Test method of loading material for initiating explosive device Part 6: Measurement of grain size Scanning electron microscopy

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Inner Mongolia Provincial Standard of the People's Republic of China

DB15/T 981-2016 Carded cashmere hand row length test method drawing board electronic scanner method

工业和信息化部/国家能源局

JB/T 13176-2017 Differential scanning calorimeters

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 40826-2021 Test method for hand-arranging staple length of dehaired cashmere—Flatbed scanner method

Korean Agency for Technology and Standards (KATS)

KS I 0051-1999 General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS C IEC TR 61948-3:2017 Nuclear medicine instrumentation ─ Routine tests ─ Part 3: Positron emission tomographs
KS A ISO 16067-2-2005(2020) Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS C IEC TR 61948-3:2020 Nuclear medicine instrumentation — Routine tests —Part 3: Positron emission tomographs
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope

SCC

AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy

American Society for Testing and Materials (ASTM)

ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

Indonesia Standards

SNI IEC/TR 61948-3:2012 Nuclear medicine instrumentation - Routine test - Part 3: Positron emission tomographs

KR-KS

KS C IEC TR 61948-3-2020 Nuclear medicine instrumentation — Routine tests —Part 3: Positron emission tomographs
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

British Standards Institution (BSI)

BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
BS EN 3475-414:2006 Aerospace series. Cables, electrical, aircraft use. Test methods. Differential scanning calorimeter (DSC test)
BS EN 3475-414:2005 Cables, electrical, aircraft use - Test methods - Part 414: Differential scanning calorimeter (DSC test)
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

GSO

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners

ATIS - Alliance for Telecommunications Industry Solutions

0300102-2011 Scanner Testing Results per ATIS-0300085@ BCSC Test Specification for Product Label Scanning

Alliance of Telecommunications Industry Solutions （ATIS)

ATIS 0300102-2011 Scanner Testing Results per ATIS-0300085, BCSC Test Specification for Product Label Scanning

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