Scanning electron microscope particle size analyzer

Scanning electron microscope particle size analyzer, Total:124 items.

The international standard classification for "Scanning electron microscope particle size analyzer" includes: Linear and angular measurements in general , Metallic coatings , Optical equipment , Linear and angular measurements , Other standards related to analytical chemistry , Chemical analysis .

The Chinese standard classification for "Scanning electron microscope particle size analyzer" includes: Electron optics and other physical optics instrument , Material Protection , Electrochemical, thermochemistry and optical profile type analyzer , Optical Measurement , Synthetic materials in general , Chemical Measurement , Basic standards and general methods .

Military Standard of the People's Republic of China-General Armament Department

GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy
GJB 2666-1996 Specification for scanning reflective beryllium mirrors

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

GJB 5891.6-2006 Test method of loading material for initiating explosive device Part 6: Measurement of grain size Scanning electron microscopy

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 16594-1996 Micron grade lenght measurement by SEM
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
GB/T 28873-2012 General guide of environmental scanning electron microscopy for biological effects on topography induced by nanoparticles
GB/T 43196-2023 Nanotechnologies—Measurements of particle size and shape distributions by scanning electron microscopy
GB/T 17722-1999 Gold-plated thickness measurement by SEM
GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
GB/T 25189-2010 Microbeam analysis—Determination method for quantitative analysis parameters of SEM-EDS

Inner Mongolia Provincial Standard of the People's Republic of China

DB15/T 3564-2024 Quantitative analysis of cashmere, sheep wool and their mixtures, scanning electron microscope fine-grained image recognition method

National Metrological Technical Specifications of the People's Republic of China

JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Machinery

JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 7503-1994 Thickness of Cross Section of Metal Coatings Scanning Electron Microscope Measuring Method
JB/T 5478-1991 Manual Scanning Photoelectric Direct-reading Spectrometer

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air
GB/T 38783-2020 Method of coating thickness determination for precious metalcomposites by scanning electron microscope
GB/T 35097-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrosmetry—Determination of numberical concentration of inorganic fibrous particles in ambient air

Group Standards of the People's Republic of China

T/CMAIA 002-2023 3D intelligent skin scanner
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
T/ZZB 0608-2018 3D dental scanner

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

工业和信息化部/国家能源局

JB/T 13176-2017 Differential scanning calorimeters

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

SCC

AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
NS-EN ISO 19749:2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
DANSK DS/EN ISO 19749:2023 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
DIN EN ISO 19749 E:2022 Draft Document - Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German and English version prEN ISO 19749:2022
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
DANSK DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
VDI 3861 BLATT 2-2008 Measuring emissions — Measuring inorganic fibrous particles in flowing clean gas — Scanning electron microscopic method
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
AENOR UNE-EN ISO 9220:1996 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)

GOST

GOST R ISO 14966-2022 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method

American Society for Testing and Materials (ASTM)

ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

British Standards Institution (BSI)

BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS ISO 16067-2:2004 Photography. Electronic scanners for photographic images. Spatial resolution measurements. Film scanners
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 16067-1:2003 Photography. Spatial resolution measurements for electronic scanners for photographic images. Scanners for reflective media

International Organization for Standardization (ISO)

ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 14966:2002/cor 1:2007 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method; Technical Corrigendum 1
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 16067-2:2004 Photography - Electronic scanners for photographic images - Spatial resolution measurements - Part 2: Film scanners

Association Francaise de Normalisation

NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF EN ISO 19749:2023 Nanotechnologies - Determination of particle size and shape distribution by scanning electron microscopy
XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness

Danish Standards Foundation

DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

GSO

GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 16067-2:2013 Photography - Electronic scanners for photographic images - Spatial resolution measurements -- Part 2: Film scanners
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness

KR-KS

KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

European Committee for Standardization (CEN)

EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Korean Agency for Technology and Standards (KATS)

KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS A ISO 16067-2-2005(2020) Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS A ISO 16067-2-2020 Photography－Electronic scanners for photographic images－Spatial resolution measurement－Part 2：Film scanners
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope

SE-SIS

SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

VDI - Verein Deutscher Ingenieure

VDI 3861 Blatt 2-1994 Messen anorganischer faserfoermiger Partikeln im stroemenden Reingas - Rasterelektronenmikroskopisches Verfahren
VDI 3861 Blatt 2-1996 Messen anorganischer faserfoermiger Partikeln im stroemenden Reingas - Rasterelektronenmikroskopisches Verfahren
VDI 3861 Blatt 2-2006 Messen von Emissionen - Messen anorganischer faserfoermiger Partikeln im stroemenden Reingas - Rasterelektronenmikroskopisches Verfahren

ES-UNE

UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

German Institute for Standardization

DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023

Association of German Mechanical Engineers

VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method

Lithuanian Standards Office

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)