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Database: 365,228(8 Aug 2026)

Electron Microscope Series

Electron Microscope Series, Total:192 items.

The international standard classification for "Electron Microscope Series" includes: Optical equipment , Chemical analysis , Ophthalmic equipment .

The Chinese standard classification for "Electron Microscope Series" includes: Magnifier and microscope , Electron optics and other physical optics instrument , Chemical Measurement , Basic standards and general methods , Medical optical instrument and endoscope , General and microsurgical devices .


机械工业部

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

Professional Standard - Machinery

Professional Standard - Education

  • JY/T 010-1996 General rules for analytical scanning electron microscopy
  • JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
  • JY/T 0581-2020 General analysis rules for transmission electron microscope
  • JY/T 011-1996 General rules for transmission electron microscopy

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

Group Standards of the People's Republic of China

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

Professional Standard - Medicine

  • YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
  • YY 0067-1992 Micro-circulation microscopes
  • YY 0067-2007 Micro-circulation microscopes

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy

国家食品药品监督管理局

Shanghai Provincial Standard of the People's Republic of China

  • DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
  • DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

国家能源局

  • SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Petroleum

  • SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
  • SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
  • SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples

British Standards Institution (BSI)

  • BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
  • BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
  • 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
  • BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
  • BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
  • BS EN ISO 14880-1:2016 Optics and photonics. Microlens arrays. Vocabulary and general properties
  • BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
  • 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
  • BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
  • BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
  • BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
  • BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
  • BS EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Test methods for wavefront aberrations
  • BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
  • 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
  • BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • BS EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Test methods for geometrical properties
  • BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
  • 19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
  • BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
  • BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
  • 24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
  • BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
  • BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
  • BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
  • BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
  • BS ISO 9344:2011 Microscopes. Graticules for eyepieces
  • BS ISO 9344:2016 Microscopes. Graticules for eyepieces

International Organization for Standardization (ISO)

  • ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
  • ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
  • ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
  • ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
  • ISO 14880-1:2001 Microlens array - Part 1: Vocabulary
  • ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
  • ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
  • ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
  • ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
  • ISO 9344:2011 Microscopes - Graticules for eyepieces
  • ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
  • ISO/PRF 19012-4:2024 Microscopes
  • ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
  • ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
  • ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
  • ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
  • ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
  • ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
  • ISO 14880-1:2001/Cor 2:2005 Optics and photonics - Microlens arrays - Part 1: Vocabulary; Technical Corrigendum 2
  • ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties

GSO

  • OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
  • OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
  • BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
  • OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
  • GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
  • BH GSO ISO 8576:2016 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
  • OS GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces

Japanese Industrial Standards Committee (JISC)

Korean Agency for Technology and Standards (KATS)

SCC

Association Francaise de Normalisation

  • NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
  • NF S10-132-1:2005 Microlens array - Part 1 : vocabulary.
  • NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
  • NF S10-132-1:2016 Optics and photonics - Microlens arrays - Part 1 : vocabulary and general properties

KR-KS

European Committee for Standardization (CEN)

German Institute for Standardization

  • DIN EN ISO 14880-1:2005 Microlens array - Part 1: Vocabulary (ISO 14880-1:2001 + Corr. 1:2003); German version EN ISO 14880-1:2005
  • DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
  • DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
  • DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
  • DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern

Association of German Mechanical Engineers

Military Standards (MIL-STD)

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

American Society for Testing and Materials (ASTM)

  • ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
  • ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

HU-MSZT

RU-GOST R

  • GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
  • GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes

International Electrotechnical Commission (IEC)

  • IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

American Society of Mechanical Engineers (ASME)

American National Standards Institute (ANSI)

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association