Electron Microscope Series
Electron Microscope Series, Total:192 items.
The international standard classification for "Electron Microscope Series" includes: Optical equipment , Chemical analysis , Ophthalmic equipment .
The Chinese standard classification for "Electron Microscope Series" includes: Magnifier and microscope , Electron optics and other physical optics instrument , Chemical Measurement , Basic standards and general methods , Medical optical instrument and endoscope , General and microsurgical devices .
机械工业部
- JB/T 8230.10-1995 Microscope condenser series
- JB/T 8230.2-1995 Microscope objective lens series
- JB/T 8230.9-1995 Microscope eyepiece series
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB 9246-1988 Microscopes--Series of oculars(eyepieces)
- GB/T 27668-2023 Microscopes—Vocabulary for light microscopy
- GB 9247-1988 Microscopes--Series of condensers
- GB/T 22058-2008 Microscopes - Marking of stereomicroscopes
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 9247-1996 Microscopes-Condensers
- GB/T 2609-2006 Microscopes - Objectives
- GB/T 2609-1996 Microscopes--Objectives
- GB/T 9246-2008 Microscopes—Oculars (eyepieces)
- GB/T 9247-2008 Microscopes—Condensers
- GB 7667-2003 The dose of X-rays leakage from electron microscope
- GB/T 9246-1996 Microscopes-Oculars (eyepieces)
- GB 2609-1981 Object lens for microscopes series
- GB/T 2609-2015 Microscopes―Objectives
- GB 7667-1996 The dose of X-rays leakage from electron microscope
- GB/T 22061-2008 Microscopes - Reference system of polarized light microscopy
Professional Standard - Machinery
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 5481-1991 Lamp Filament of Electron Microscope
- JB/T 7398.13-1994 Specimens slides for microscopes and biological microscopes
- JB/T 5480-1991 Diaphragm of Electron Microscope
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5383-1991 Specification for Transmission Electron Microscope
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
Professional Standard - Education
- JY/T 010-1996 General rules for analytical scanning electron microscopy
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 011-1996 General rules for transmission electron microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
National Metrological Verification Regulations of the People's Republic of China
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
Professional Standard - Medicine
- YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
- YY 0067-1992 Micro-circulation microscopes
- YY 0067-2007 Micro-circulation microscopes
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
国家食品药品监督管理局
- YY/T 0067-2007 Micro-circulation microscopes
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
国家能源局
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
Professional Standard - Petroleum
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
British Standards Institution (BSI)
- BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS 7012-12:1997 Light microscopes. Reference system of polarized light microscopy
- BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- BS EN ISO 14880-1:2016 Optics and photonics. Microlens arrays. Vocabulary and general properties
- BS ISO 10934:2020 Microscopes. Vocabulary for light microscopy
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
- BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
- BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
- BS ISO 19012-4:2024 Microscopes. Designation of microscope objectives - Polarization characteristics
- BS EN ISO 14880-2:2007 Optics and photonics - Microlens arrays - Test methods for wavefront aberrations
- BS 7012-10.2:1997 Light microscopes - Minimum requirements for stereo microscopes - High performance microscopes
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Test methods for geometrical properties
- BS 7012-14:1997 Light microscopes. Marking of stereomicroscopes
- 19/30387825 DC BS ISO 10934. Microscopes. Vocabulary for light microscopy
- BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
- BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- 24/30466813 DC BS ISO 10934 Microscopes - Vocabulary for light microscopy
- BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
- BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
- BS ISO 9344:2011 Microscopes. Graticules for eyepieces
- BS ISO 9344:2016 Microscopes. Graticules for eyepieces
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- ISO 14880-1:2001 Microlens array - Part 1: Vocabulary
- ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 8036:2015 Microscopes - Immersion liquids for light microscopy
- ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 9344:2011 Microscopes - Graticules for eyepieces
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO/PRF 19012-4:2024 Microscopes
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 8576:1996 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
- ISO 19012-2:2013 Microscopes - Designation of microscope objectives - Part 2: Chromatic correction
- ISO 14880-1:2001/Cor 2:2005 Optics and photonics - Microlens arrays - Part 1: Vocabulary; Technical Corrigendum 2
- ISO 14880-1:2016 Optics and photonics - Microlens arrays - Part 1: Vocabulary and general properties
GSO
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- BH GSO ISO 8576:2016 Optics and optical instruments -- Microscopes -- Reference system of polarized light microscopy
- OS GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 2400:2010 Microscopes -- Immersion liquids for light microscopy
- JIS B 7148:1992 Microscope eyepieces
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS B 7150:1993 Micrometer microscopes
- JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
- JIS B 7147:1993 Biological microscope objectives
- JIS B 7141:1994 Microscope -- Screw thread for objectives
- JIS B 7141:2003 Microscope -- Screw thread for objectives
Korean Agency for Technology and Standards (KATS)
- KS D ISO 22493-2012(2017) Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS I 0051-2019 General rules for scanning electron microscopy
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS B ISO 8576-2006(2016) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
- KS I 0051-1999 General rules for scanning electron microscopy
- KS D ISO 16700:2013 Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
- KS B 5601-1995 Micrometer microscopes
- KS B 5601-1995(2021) Micrometer microscopes
- KS B ISO 8576:2006 Optics and optical instruments-Microscopes-Reference system of polarized light microscopy
- KS B 5601-2021 Micrometer microscopes
- KS D 2714-2016(2021) Scanning probe microscope-Method for lateral force microscope
- KS B ISO 8576-2006(2021) Optics and optical instruments — Microscopes —Reference system of polarized light microscopy
- KS B ISO 19012-1:2016 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
- KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
- KS B ISO 11884-2-2011(2021) Optics and photonics-Minimum requirements for stereomicroscope-Part 2:High performance microscopes
- KS B 5615-1997 Biological microscope objectives
- KS B 5615-2016(2021) Biological microscope objectives
- KS D 2714-2021 Scanning probe microscope-Method for lateral force microscope
- KS L 2010-2009(2019) Slide glasses for microscope
- KS D 2714-2016 Scanning probe microscope-Method for lateral force microscope
- KS B ISO 11884-2-2011(2016) Optics and photonics-Minimum requirements for stereomicroscope-Part 2:High performance microscopes
- KS B 5617-2013 Stage micrometer for biological microscope
- KS B 5616-2013 Biological microscope eyepieces
- KS B 5615-2021 Biological microscope objectives
- KS B 5616-2018 Biological microscope eyepieces
- KS B 5615-2016 Biological microscope objectives
- KS B 5616-1981 Biological Microscope Eyepieces
- KS B 5617-1993 Stage micrometer for biological microscope
SCC
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- 12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
- AENOR UNE 1059:1956 Microcopy.
- BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
Association Francaise de Normalisation
- NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
- NF S10-132-1:2005 Microlens array - Part 1 : vocabulary.
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- NF S10-132-1:2016 Optics and photonics - Microlens arrays - Part 1 : vocabulary and general properties
KR-KS
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS B ISO 8576-2023 Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
- KS B 5616-2023 Biological microscope eyepieces
European Committee for Standardization (CEN)
- EN ISO 14880-1:2005 Optics and photonics - Microlens array - Part 1: Vocabulary
- EN ISO 14880-1:2019 Optics and photonics - Microlens arrays - Part 1: Vocabulary (ISO 14880-1:2019)
German Institute for Standardization
- DIN EN ISO 14880-1:2005 Microlens array - Part 1: Vocabulary (ISO 14880-1:2001 + Corr. 1:2003); German version EN ISO 14880-1:2005
- DIN ISO 8576:2002-06 Optics and optical instruments - Microscopes - Reference system of polarized light microscopy (ISO 8576:1996)
- DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
- DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
- DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
Association of German Mechanical Engineers
- DVS 2803-1974 Electron-beam welding in microscopy (survey)
Military Standards (MIL-STD)
- DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
- DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
- DOD A-A-51689-1986 DISK, MICROMETER, MICROSCOPE EYEPIECE
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
- IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
American Society for Testing and Materials (ASTM)
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
HU-MSZT
- MNOSZ 5534-1956 Microscope light mirror
- MNOSZ 15577-1953 microscope light
RU-GOST R
- GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
International Electrotechnical Commission (IEC)
- IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components
American Society of Mechanical Engineers (ASME)
- ASME B1.11-1958 Microscope Objective Thread Errata - July 1972
- ASME B1.11-1958(R2016) Microscope Objective Thread Errata - July 1972
American National Standards Institute (ANSI)
- ANSI B1.11-1958 Microscope Objective Thread
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components
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