What are the electron microscopes

What are the electron microscopes, Total:89 items.

The international standard classification for "What are the electron microscopes" includes: Chemical analysis , Optical equipment , Protection against crime .

The Chinese standard classification for "What are the electron microscopes" includes: Electron optics and other physical optics instrument , Chemical Measurement , Basic standards and general methods , Crime judging technology .

Professional Standard - Machinery

JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5383-1991 Specification for Transmission Electron Microscope

Professional Standard - Education

JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 011-1996 General rules for transmission electron microscopy
JY/T 0581-2020 General analysis rules for transmission electron microscope
JY/T 010-1996 General rules for analytical scanning electron microscopy

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy

Group Standards of the People's Republic of China

T/CSTM 00162-2020 Calibration methods for transmission electron microscope

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB 7667-1996 The dose of X-rays leakage from electron microscope

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy

Professional Standard - Petroleum

SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
DB31/T 315-2004 Calibration method of magnification of transmission electron microscope

国家能源局

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope

Professional Standard - Public Safety Standards

GA/T 909-2010 Collecting and packaging method for trace evidence—Gunshot residue(SEM/EDS examination)

SCC

ISO 8036:2015 Plus Redline Microscopes - Immersion liquids for light microscopy (includes Redline Version)
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO 5061:2002 Animal feeding stuffs - Determination of castor oil seed husks - Microscope method
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy

GSO

OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 5061:2002 Animal feeding stuffs - Determination of castor oil seed husks - Microscope method
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Test methods for geometrical properties
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method

American Society for Testing and Materials (ASTM)

ASTM D7201-06(2020) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
ASTM D7201-06(2011) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

Korean Agency for Technology and Standards (KATS)

KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification

KR-KS

KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.

Association of German Mechanical Engineers

DVS 2803-1974 Electron-beam welding in microscopy (survey)

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components

RU-GOST R

GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols

International Electrotechnical Commission (IEC)

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

Others: What are the electron microscopes,Does electron microscopy include transmission?,What does an electron microscope consist of,Electron microscopes include,What kind of chromatograms include,What does an electron microscope include,What kind of scanning electron microscope,What are the types of electron microscopes?,What are the atomic absorption methods?