Atomic Force Microscopy and Scanning Tunneling Microscopy
Atomic Force Microscopy and Scanning Tunneling Microscopy, Total:30 items.
The international standard classification for "Atomic Force Microscopy and Scanning Tunneling Microscopy" includes: Chemical analysis .
The Chinese standard classification for "Atomic Force Microscopy and Scanning Tunneling Microscopy" includes: Chemical Measurement , Electron optics and other physical optics instrument , Basic standards and general methods .
Group Standards of the People's Republic of China
- T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
Professional Standard - Education
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
American Society for Testing and Materials (ASTM)
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Korean Agency for Technology and Standards (KATS)
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
- KS I 0051-1999 General rules for scanning electron microscopy
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
Gosstandart of Russia
- GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
British Standards Institution (BSI)
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GCC Standardization Organization
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
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