How Electron Microscopes Are Used

How Electron Microscopes Are Used, Total:137 items.

The international standard classification for "How Electron Microscopes Are Used" includes: Optics and optical measurements in general , Ophthalmic equipment , Chemical analysis , Optical equipment .

The Chinese standard classification for "How Electron Microscopes Are Used" includes: Electron optics and other physical optics instrument , Magnifier and microscope , Chemical Measurement , Medical optical instrument and endoscope , Basic standards and general methods .

Professional Standard - Machinery

JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
JB/T 5480-1991 Diaphragm of Electron Microscope
JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
JB/T 9333-1999 Microscopes -- Immersion oil for general use in light microscopy
JB/T 5481-1991 Lamp Filament of Electron Microscope
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5477-1991 Microscope - Immersion Oil for Fluorescence Microscopy
JB/T 9352-1999 Test method for the transmission electron microscope
JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
JB/T 7398.13-1994 Specimens slides for microscopes and biological microscopes
JB/T 5383-1991 Specification for Transmission Electron Microscope

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
JY/T 011-1996 General rules for transmission electron microscopy
JY/T 0581-2020 General analysis rules for transmission electron microscope

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Group Standards of the People's Republic of China

T/CSTM 00162-2020 Calibration methods for transmission electron microscope

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Professional Standard - Medicine

YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 26600-2011 Microscopes—Immersion liquids for light microscopy
GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 26600-2024 Microscopes—Immersion liquid for light microscopy

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy

International Organization for Standardization (ISO)

ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 9344:2016 Microscopes - Graticules for eyepieces
ISO 21073:2019 Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope

GSO

OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 14648-2:2015 Micrographics -- Quality control of COM recorders that generate images using a single internal display system -- Part 2: Method of use
OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
OS GSO ISO 10936-2:2016 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
GSO ISO 10936-2:2016 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
BH GSO ISO 10936-2:2017 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
GSO ISO 10934-1:2013 Optics and optical instruments -- Vocabulary for microscopy -- Part 1: Light microscopy

British Standards Institution (BSI)

BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
BS ISO 8036:2015 Microscopes. Immersion liquids for light microscopy
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS ISO 18221:2016 Microscopes. Microscopes with digital imaging displays. Information provided to the user regarding imaging performance
BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
BS 7012-10.1:1998 Light microscopes - Minimum requirements for stereo microscopes - Stereo microscopes for general use
BS ISO 9344:2011 Microscopes. Graticules for eyepieces
BS ISO 9344:2016 Microscopes. Graticules for eyepieces
24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
BS EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Test methods for geometrical properties
BS ISO 21073:2019 Microscopes. Confocal microscopes. Optical data of fluorescence confocal microscopes for biological imaging
BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
BS 7012-8:1997 Light microscopes - Graticules for eyepieces
BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS T 10936-2:2014 Operation microscopes.Part 2: Light hazard from operation microscopes used in ocular surgery
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 2400:1988 Immersion oil for microscope
JIS T 7317:1988 Operation microscopes

German Institute for Standardization

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Korean Agency for Technology and Standards (KATS)

KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS I 0051-2019 General rules for scanning electron microscopy
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS B 5605-1987 Biological Microscopes for Immersion Objectives
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS P 1232-2008 Operation microscopes

KR-KS

KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary

Association of German Mechanical Engineers

VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
DVS 2803-1974 Electron-beam welding in microscopy (survey)

VDI - Verein Deutscher Ingenieure

VDI/VDE 2656 Blatt 1-2006 Bestimmung geometrischer Messgroessen mit Rastersondermikroskopen - Kalibrierung von Messsystemen

SCC

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
AWWA JAW3027 Journal AWWA — Coagulation Mechanisms: An Electron Microscopic Study Using Aluminum Sulfate
VDI/VDE 2656 BLATT 1-2019 Determination of geometric measurements with scanning probe microscopes - calibration of measuring systems
DANSK DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
BS PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
DANSK DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
08/30165284 DC BS ISO 10936-2. Optics and photonics. Operation microscopes. Part 2. Light hazard from operation microscopes used in ocular surgery
DIN 58889:1986 Lenses and oculars for microscops - Marking
09/30202372 DC BS ISO 10936-2. Optics and photonics. Operation microscopes. Part 2. Light hazard from operation microscopes used in ocular surgery

Aeronautical Radio Inc.

ARINC 419-3 SECTION 3.0 How to Use This Document

Association Francaise de Normalisation

NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
FD T16-209:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
NF ISO 21073:2020 Microscopes - Microscopes confocaux - Données optiques des microscopes confocaux à fluorescence pour l'imagerie biologique
NF S10-500*NF ISO 21073:2020 Microscopes - Confocal microscopes - Optical data of fluorescence confocal microscopes for biological imaging

American Society for Testing and Materials (ASTM)

ASTM E285-08(2015) Standard Test Method for Oxyacetylene Ablation Testing of Thermal Insulation Materials
ASTM E2859-11(2017) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E2859-11(2023) Standard Guide for Size Measurement of Nanoparticles Using Atomic Force Microscopy
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

Danish Standards Foundation

DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components

HU-MSZT

MSZ 3282-1968 Melting point detection using microscopic and microscopic methods

IT-UNI

UNI 7329-1974 Examination with electron microscope of metallic materials by the replica technique. Preparation of replicas for microstructure examination.

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components

Military Standards (MIL-STD)

DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS

International Electrotechnical Commission (IEC)

ISO TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy

RU-GOST R

GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols