Field emission scanning electron microscopy testing

Field emission scanning electron microscopy testing, Total:191 items.

The international standard classification for "Field emission scanning electron microscopy testing" includes: Protection against crime , Other standards related to analytical chemistry , Optical equipment , Chemical analysis , Linear and angular measurements in general , Metallic coatings , Linear and angular measurements , Other methods of testing of metals , Man-made fibres , Other standards related to optics and optical measurements , Glass products , Physics. Chemistry , Emission .

The Chinese standard classification for "Field emission scanning electron microscopy testing" includes: Electron optics and other physical optics instrument , Material Protection , Chemical Measurement , Crime judging technology , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , Metal physical property test method , Chemical fibre in general , Optical Measurement , Industrial technical glass , Artificial lens , Technical management , Electromagnetic compatibility .

Military Standard of the People's Republic of China-General Armament Department

GJB 737.11-1993 Test methods for pyrotechnic chemicals Particle size determination Scanning electron microscopy
GJB 2666-1996 Specification for scanning reflective beryllium mirrors
GJB 2666A-2018 Specification for scanning reflective beryllium mirrors

Professional Standard - Machinery

JB/T 7503-1994 Thickness of Cross Section of Metal Coatings Scanning Electron Microscope Measuring Method
JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

Group Standards of the People's Republic of China

T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy
T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images
T/NLIA 004-2021 In-situ SEM tensile test method for additive manufactured aluminum alloy
T/JSP 01-2025 Testing and Judgment of Graphene Materials in Cold Sprayed Zinc Paint Using Scanning Electron Microscopy-X-ray Energy Dispersive Spectroscopy Analysis
T/CSTM 00229-2020 Identification of graphene materials in coatings materials Scanning Electron Microscope-Energy Dispersive Spectrometer method
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SAS 0003-2018 Bismuth germanate scintillation crystals for positron emission tomography

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 38783-2020 Method of coating thickness determination for precious metalcomposites by scanning electron microscope
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
GB/T 16594-2008 General rules for measurement of length in micron scale by SEM
GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
GB/T 17722-1999 Gold-plated thickness measurement by SEM
GB/T 33234-2016 Reflectance test method of reflective glass mirror for concentrated solar power system
GB/T 20307-2006 General rules for nanometer-scale lengthmeasurement by SEM
GB/T 45325-2025 Determination of length of heat affected zone for precious metal bonding wire—Scanning electron microscope method
GB/T 16594-1996 Micron grade lenght measurement by SEM
GB/T 36422-2018 Man-made fiber—Test method for micro morphology and diameter—Scanning electron microscope method
GB/T 39867-2021 Bismuth germanate scintillation crystal for positron emission tomography

Fujian Provincial Standard of the People's Republic of China

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export-Part 1:X-ray diffraction and scan electron microscopy method
SN/T 3009-2011 Identification of Seawater Corrosion on Metallic Surface by SEM

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms

Professional Standard - Public Safety Standards

GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 2338-2025 Forensic Science Tape Examination Scanning Electron Microscopy/X-ray Spectroscopy
GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

GJB 5891.6-2006 Test method of loading material for initiating explosive device Part 6: Measurement of grain size Scanning electron microscopy

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

Professional Standard - Petroleum

SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope

Professional Standard - Electron

SJ/T 11006-1996 Semiconductor TV integrated circuits - General principles of measuring methods for horizontal and vertical sweep circuits

Professional Standard - Non-ferrous Metal

YS/T 1491-2021 Method for determination of sphericity of nickel-based high-temperature alloy powder by scanning electron microscopy

Professional Standard - Post and Telecommunication

YD/T 1690.3-2007 Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150kHz to 1GHz Part 3:Measurement of Radiated Emissions-Surface Scan Method

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary

British Standards Institution (BSI)

BS PD IEC/TR 61948-3:2005 Nuclear medicine instrumentation. Routine tests-Positron emission tomographs
PD IEC/TR 61948-3:2018 Nuclear medicine instrumentation. Routine tests. Positron emission tomographs
BS PD IEC/TR 61948-3:2018 Nuclear medicine instrumentation. Routine tests-Positron emission tomographs
PD IEC/TS 61967-3:2014 Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. Surface scan method
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS EN IEC 61675-1:2022 Radionuclide imaging devices. Characteristics and test conditions. Positron emission tomographs
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
BS PD IEC/TS 61967-3:2014 Integrated circuits. Measurement of electromagnetic emissions. Measurement of radiated emissions. Surface scan metho
PD IEC/TR 61967-1-1:2015 Integrated circuits. Measurement of electromagnetic emissions. General conditions and definitions. Near-field scan data exchange format
BS EN 61675-1:1998 Radionuclide imaging devices. Characteristics and test conditions. Positron emission tomographs
BS PD IEC/TR 61967-1-1:2010 Integrated circuits. Measurement of electromagnetic emissions-General conditions and definitions. Near-field scan data exchange format
BS ISO 16067-1:2003 Photography. Spatial resolution measurements for electronic scanners for photographic images. Scanners for reflective media
BS DD IEC/TS 61967-3:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHzto 1 GHz - Measurement of radiated emissions - Surface scan method

Korean Agency for Technology and Standards (KATS)

KS I 0051-1999 General rules for scanning electron microscopy
KS D 2713-2021 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2024 General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS D 2713-2016 Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D 2713-2016(2021) Evaluation of spatial resolution of NSOM(Near-field Scanning Optical Microscope)
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2022 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS C IEC TR 61948-3:2017 Nuclear medicine instrumentation ─ Routine tests ─ Part 3: Positron emission tomographs
KS C IEC TR 61948-3:2020 Nuclear medicine instrumentation — Routine tests —Part 3: Positron emission tomographs
KS C IEC TR 61948-3-2020 Nuclear medicine instrumentation — Routine tests —Part 3: Positron emission tomographs
KS D 2714-2006 Scanning probe microscope-Method for lateral force microscope

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy

American Society for Testing and Materials (ASTM)

ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E1588-25 Standard Test Method for Primer Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope

National Electrical Manufacturers Association（NEMA)

NEMA NU 2-2012 Performance Measurements of Positron Emission Tomographs
NEMA NU 2-2024 Performance Measurements of Positron Emission Tomographs (PETS)
NEMA NU 2-2018 Performance Measurements of Positron Emission Tomographs (PET)
NEMA NU 2-1994 Performance Measurements of Position Emission Tomographs
NEMA NU 2-2001 Performance Measurements of Position Emission Tomographs Replaces NU 1:1994

GCC Standardization Organization

GSO IEC/TS 61967-3:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
GSO IEC 61675-1:2014 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs

The Directorate General of Specifications and Metrology (DGSM)

OS GSO IEC/TS 61967-3:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method

International Electrotechnical Commission (IEC)

IEC 47A/880/CD:2012 Integrated Circuits - Measurement of Electromagnetic Emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC 47A/900/CD:2013 IEC/TS 61967-3, Ed. 2: Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC 47A/925/DTS:2014 IEC/TS 61967-3, Ed. 2: Integrated Circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
IEC TR 61967-1-1:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
IEC 61675-1:1998+AMD1:2008 CSV Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs
IEC 47A/912/CD:2013 IEC/TS 61967-3, Ed. 2: Integrated Circuits - Measurement of Electromagnetic Emissions - Part 3: Measurement of radiated emissions - Surface scan method

Association of German Mechanical Engineers

VDI 3866 Blatt 5-2004 Determination of asbestos in technical products - Scanning electron microscopy method
VDI 3866 Blatt 5-2017 Determination of asbestos in technical products - Scanning electron microscopy method
VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI VDE 2656 Blatt 1-2019 Determination of geometrical quantities by using of scanning probe microscopes
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method

Danish Standards Foundation

DANSK DS/IEC TR 61948-3:2018 Nuclear medicine instrumentation – Routine tests – Part 3: Positron emission tomographs
DANSK DS/IEC/TR 61948-3:2005 Nuclear medicine instrumentation – Routine tests – Part 3: Positron emission tomographs
DS/IEC/TR 61948-3:2006 Nuclear medicine instrumentation - Routine tests - Part 3: Positron emission tomographs
DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
DS/EN 61675-1:1998 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs
DANSK DS/EN 61675-1:2014 Radionuclide imaging devices – Characteristics and test conditions – Part 1: Positron emission tomographs
DS/EN 61675-1/A1:2008 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

German Institute for Standardization

DIN IEC /TS 61967-3:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
DIN 6855-4:2016-11 Constancy testing of nuclear medicine instruments - Part 4: Positron emission tomographs (PET)
DIN IEC /TS 61967-3:2015-08 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN IEC /TS 61967-3 E:2012 Draft Document - Integrated Circuits - Measurement of Electromagnetic Emissions - Part 3: Measurement of radiated emissions - Surface scan methodIntegrated circuits (IEC 47A/880/CD:2012)
DIN IEC/TS 61967-3:2015 Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method (IEC/TS 61967-3:2014)
DIN 6855-4 E:2015 Draft Document - Constancy testing of nuclear medicine instruments - Part 4: Positron emission tomographs (PET)
DIN EN IEC 61675-1:2022 Imaging systems in nuclear medicine – characteristics and test conditions – Part 1: Positron emission tomographs
DIN EN IEC 61675-1 E:2021-08 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs
DIN IEC/TS 61967-3:2012 Integrated Circuits - Measurement of Electromagnetic Emissions - Part 3: Measurement of radiated emissions - Surface scan methodIntegrated circuits (IEC 47A/880/CD:2012)
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

Swedish Institute for Standards

SS-ISO 9220:1989 Metallic coatings - Measurements of coating thickness - Scanning electron microscope method
SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

American Water Works Association (AWWA)

AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope

Spanish Association for Standardization (UNE)

UNE-EN 61675-1:1999 RADIONUCLIDE IMAGING DEVICES. CHARACTERISTICS AND TEST CONDITIONS. PART 1: POSITRON EMISSION TOMOGRAPHS.
AENOR UNE-EN 61675-1:1999 Radionuclide imaging devices. Characteristics and test conditions. Part 1: Positron emission tomographs.
UNE-EN 61675-1:2014 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs (Endorsed by AENOR in August of 2014.)
UNE-EN IEC 61675-1:2022 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs (Endorsed by Asociación Española de Normalización in June of 2022.)
UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Ente Nazionale Italiano di Unificazione

UNI EN ISO 9220:1998 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
UNI ISO 9220:1990 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
UNI EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

Bureau of Indian Standards

IS 11051-1984 Methods of measurement for television sweep generators
IS/IEC 61675-1-2022 Radionuclide Imaging Devices-Characteristics and Test Conditions - Part 1 Positron Emission Tomographs
IS 9782-1981 Specification for television scan generators

(U.S.) Telecommunications Industries Association

455-164-1986 Scanning Far-Field@ Fiber Single-Mode@ Measurement of Mode Field Diameter
EIA/TIA-455-164A-1991 FOTP-164 Single-Mode Fiber@ Measurement of Mode Field Diameter by Far-Field Scanning
EIA/TIA-455-165A-1993 FOTP-165 Mode-Field Diameter Measurement by Near-Field Scanning Technique

Comitato Elettrotecnico Italiano

CEI EN 61675-1:2015 Radionuclide imaging devices - Characteristics and test conditions Part 1: Positron emission tomographs

Association Francaise de Normalisation

NF EN IEC 61675-1:2022 Radionuclide imaging devices - Characteristics and test conditions - Part 1: positron emission tomographs
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

European Committee for Electrotechnical Standardization（CENELEC）

EN IEC 61675-1:2022 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs

Gosstandart of Russia

GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
GOST R 56109-2014 Medical electrical equipment. Positron emission tomographs together with X-ray equipment for computed tomography. Technical requirements for governmental purchases

Australian/New Zealand Standard (AU-AS/NZS)

AS/NZS IEC 61675.1:2022 Radionuclide imaging devices — Characteristics and test conditions, Part 1: Positron emission tomographs

European Committee for Standardization (CEN)

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

Society of Automotive Engineers (SAE)

SAE J1752/2-2003 Measurement of Radiated Emissions from Integrated Circuits -- Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE J1752-2-2003 Measurement of Radiated Emissions from Integrated CircuitsSurface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE J1752-2-2016 Measurement of Radiated Emissions from Integrated Circuits-Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE J1752/2-1995 Measurement of Radiated Emissions From Integrated Circuits-Surface Scan Method (Loop Probe Method) 10 Mhz to 3 Ghz
SAE J1752/2-2016 Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE J1752/2-2011 Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz

American National Standards Institute （ANSI)

ANSI/ESD SP14.5-2021 Electrostatic Discharge Sensitivity Testing Near-Field Immunity Scanning Component/Module/PCB Level
ANSI/ESD SP14.5-2015 Electrostatic Discharge Sensitivity Testing Near-Field Immunity Scanning Component/Module/PCB Level

Indonesia Standards

SNI IEC/TR 61948-3:2012 Nuclear medicine instrumentation - Routine test - Part 3: Positron emission tomographs

Semiconductor Equipment and Materials International (SEMI)

SEMI F73-0309-2009 TEST METHOD FOR SCANNING ELECTRON MICROSCOPY (SEM) EVALUATION OF WETTED SURFACE CONDITION OF STAINLESS STEEL COMPONENTS

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