electron microscope vacuum
electron microscope vacuum, Total:335 items.
The international standard classification for "electron microscope vacuum" includes: Chemical analysis , Optical equipment , Physicochemical methods of analysis , Laboratory medicine , Products of the chemical industry in general , Natural fibres , Testing of metals , Measuring instruments , Ophthalmic equipment , Optics and optical measurements , Protection against crime .
The Chinese standard classification for "electron microscope vacuum" includes: Electron optics and other physical optics instrument , Mechanics Measurement , Chemical Measurement , Basic standards and general methods , Magnifier and microscope , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods for dye , Oil shale , Cotton textile in general , Metal physical property test method , Measuring tool and instrument , Medical optical instrument and endoscope , Basic Subject in general , Crime judging technology , Fibre crop and product .
Professional Standard - Machinery
- JB/T 5383-1991 Specification for Transmission Electron Microscope
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5365.2-1991 Cleanness measurement method of foundry machines Microscopic method
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 5481-1991 Lamp Filament of Electron Microscope
- JB/T 5480-1991 Diaphragm of Electron Microscope
Professional Standard - Education
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
- JY/T 010-1996 General rules for analytical scanning electron microscopy
- JY/T 011-1996 General rules for transmission electron microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
- JJF 1252-1990 O.T.C. of the Primary Standard for the Micro-hardness
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
- T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
- T/CSTM 00166.3-2020 Characterization for graphene materials Part 3 Transmission electron microscope
- T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
- T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)
- T/SPSTS 030-2023 Graphene material sheet size measurement using scanning electron microscopy
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
- GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 27596-2011 Dyestuffs—Determination of particle fineness—Microscope method
- GB/T 32189-2015 Test method for surface roughness of GaN single crystal substrate by atomic force microscope
- GB/T 43846.1-2024 Microscopes—Designation of microscope objectives—Part 1: Flatness of field/Plan
- GB/T 22092-2008 Fixed micrometer and depth micrometer with electronic digital display
- GB/T 34831-2017(英文版) Nanotechnologies—Electron microscopy imaging of noble metal nanoparticles—High angle annular dark field imaging method
- GB/T 22092-2018 Micrometer head and depth micrometer with electronic digital display
- GB/T 13777-1992 Test method for maturity of cotton fibres-Microscopic method
- GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB 7667-1996 The dose of X-rays leakage from electron microscope
- GB/T 44268.1-2024 Microscopes—Definition and measurement of illumination properties—Part 1: Image brightness and uniformity in bright field microscopy
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 13777-2006 method for maturity of cotton fibres - Microscopic method
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB 7667-2003 The dose of X-rays leakage from electron microscope
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
Professional Standard - Public Safety Standards
- GA/T 1662-2019 Microwave Digestion-Vacuum Filtration-Microscopic Method for Forensic Science Diatom Inspection Technical Specification
Professional Standard - Medicine
- YY 1296-2016 Optics and photonics―Operation microscopes―Light hazard from operation microscopes used in ocular surgery
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40066-2021 Nanotechnologies—Thickness measurement of graphene oxide—Atomic Force Microscopy (AFM)
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
Professional Standard - Petroleum
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
国家能源局
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
工业和信息化部
- YB/T 4676-2018 Analysis of precipitates of steel-Transmission election microscope method
Professional Standard - Judicatory
- SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry
Military Standard of the People's Republic of China-General Armament Department
- GJB 8684.23-2015 Test methods for pyrotechnic properties - Part 23: Determination of particle size distribution of smoke solid particles by electron microscopy
- GJB/Z 40.3-1993 Military vacuum electronic device series spectrum microwave tubes
- GJB 8684.22-2015 Test methods for pyrotechnic properties - Part 22: Determination of smoke solid particle number concentration by electron microscopy
- GJB 772.102-1989 Test methods for explosives Particle size determination microscopy
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB 5384.22-2005 Test methods of performance for pyrotechnic composition Part 21: Concentration determination of solid smoke particles quantities Electron microscope method
- GJB 5384.23-2005 Test methods of performance for pyrotechnic composition Part 23: Determination of particles size distribution for solid smoke particles Electron microscope method
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
Professional Standard - Nuclear Industry
- EJ/T 20176-2018 Atomic Force Microscope Measuring Method of Edge Sharpness of Diamond Tool
Shanxi Provincial Standard of the People's Republic of China
- DB14/T 1965-2019 Technical Regulations for Microscopic Determination of Density of Woven Fabrics
国家安全生产监督管理总局
- MT/T 1053-2007 Microscope photometer technical conditions for measuring vitrinite reflectance
Professional Standard - Coal
- MT/T 1053-2008 Technical conditions of microscope photometer for vitrinite reflectance determination
Professional Standard - Agriculture
- GB/T 13777-2024 Test method for maturity of cotton fibers—Microscopic method
Japanese Industrial Standards Committee (JISC)
- JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS K 3850-3:2000 Measuring method for airborne fibrous particles -- Part 3: Indirect-transfer transmission electron microscopy method
- JIS K 3850-2:2000 Measuring method for airborne fibrous particles -- Part 2: Direct-transfer transmission electron microscopy method
- JIS B 7158-1:2010 Designation of microscope objectives -- Part 1: Flatness of field/Plan
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO 9344:2016 Microscopes - Graticules for eyepieces
- ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- ISO 19012-1:2013 Microscopes.Designation of microscope objectives .Part 1: Flatness of field/Plan
- ISO 15932:2013 Microbeam analysis.Analytical electron microscopy.Vocabulary
- ISO 19012-1:2011 Microscopes - Designation of microscope objectives - Part 1: Flatness of field/Plan
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 19214:2024 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- ISO 14966:2019 Ambient air — Determination of numerical concentration of inorganic fibrous particles — Scanning electron microscopy method
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
- ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 10312:1995 Ambient air - Determination of asbestos fibres - Direct-transfer transmission electron microscopy method
- ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
- ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
- ISO 21363:2020 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
- ISO 11884-2:2007 Optics and photonics - Minimum requirements for stereomicroscopes - Part 2: High performance microscopes
- ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Part 1: Stereomicroscopes for general use
- ISO 10312:2019 Ambient air — Determination of asbestos fibres — Direct transfer transmission electron microscopy method
- ISO 13794:2019 Ambient air — Determination of asbestos fibres — Indirect-transfer transmission electron microscopy method
- ISO 14966:2002/cor 1:2007 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method; Technical Corrigendum 1
- ISO 19012-1:2007 Optics and photonics - Designation of microscope objectives - Part 1: Flatness of field/Plan
- ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
GSO
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 9344:2015 Microscopes -- Graticules for eyepieces
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
- OS GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- OS GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
- GSO ISO 8036:2015 Optics and photonics -- Microscopes -- Immersion liquids for light microscopy
- GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method
- BH GSO ISO 19012-1:2016 Microscopes -- Designation of microscope objectives -- Part 1: Flatness of field/Plan
- GSO ISO 10312:2015 Ambient air -- Determination of asbestos fibres -- Direct transfer transmission electron microscopy method
- GSO ISO 13794:2024 Ambient air — Determination of asbestos fibres — Indirect-transfer transmission electron microscopy method
- BH GSO ISO 10312:2017 Ambient air -- Determination of asbestos fibres -- Direct transfer transmission electron microscopy method
- OS GSO ISO 10312:2015 Ambient air -- Determination of asbestos fibres -- Direct transfer transmission electron microscopy method
- OS GSO ISO 10936-2:2016 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
- GSO ISO 10936-2:2016 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
- BH GSO ISO 10936-2:2017 Optics and photonics -- Operation microscopes -- Part 2: Light hazard from operation microscopes used in ocular surgery
- GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 9344:2011 Microscopes. Graticules for eyepieces
- BS ISO 9344:2016 Microscopes. Graticules for eyepieces
- BS ISO 19012-1:2013 Microscopes. Designation of microscope objectives. Flatness of field/Plan
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS 7012-8:1997 Light microscopes - Graticules for eyepieces
- BS ISO 19214:2024 Microbeam analysis. Analytical electron microscope. Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- 24/30474499 DC BS ISO 19214 Microbeam analysis. Analytical electron microscopy. Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- BS ISO 14966:2019 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
- BS EN ISO 9220:2022 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS ISO 11884-2:2007 Optics and photonics. Minimum requirements for stereomicroscopes. High performance microscopes
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
- BS ISO 11884-1:2006 Optics and photonics - Minimum requirements for stereomicroscopes - Stereomicroscopes for general use
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- BS ISO 13794:1999 Ambient air - Determination of asbestos fibres - Indirect-transfer transmission electron microscopy method
- 18/30375050 DC BS ISO 14966. Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
- BS ISO 14966:2002 Ambient air - Determination of numerical concentration of inorganic fibrous particles - Scanning electron microscopy method
- BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- 21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- BS ISO 10312:2019 Ambient air. Determination of asbestos fibres. Direct transfer transmission electron microscopy method
- BS ISO 13794:2019 Ambient air. Determination of asbestos fibres. Indirect-transfer transmission electron microscopy method
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- 21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- BS EN ISO 14880-1:2005 Optics and photonics - Microlens array - Vocabulary
- BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- BS ISO 19056-1:2015 Microscopes. Definition and measurement of illumination properties. Image brightness and uniformity in bright field microscopy
- BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
- BS ISO 8255-1:2017 Microscopes. Cover glasses. Dimensional tolerances, thickness and optical properties
- 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
- BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
Korean Agency for Technology and Standards (KATS)
- KS B ISO 19012-1:2016 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
- KS B ISO 19012-1:2011 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
- KS D ISO 22493-2012(2017) Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493:2012 Microbeam analysis-Scanning electron microscopy-Vocabulary
- KS I 0051-2019 General rules for scanning electron microscopy
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
- KS D 8544-2016(2021) Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
- KS I 0051-1999 General rules for scanning electron microscopy
- KS D ISO 9220-2009(2017) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D ISO 9220-2009(2022) Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D ISO 9220:2009 Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D ISO 9220-2022 Metallic coatings-Measurement of coating thickness-Scanning electron microscope method
- KS D 8544-2021 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
- KS D ISO 16700:2013 Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
- KS I ISO 10312-2008(2018) Ambient air-Determination of asbestos fibers-Direct-transfer transmission electron microscopy method
- KS I ISO 10312:2008 Ambient air-Determination of asbestos fibers-Direct-transfer transmission electron microscopy method
- KS I ISO 13794:2008 Ambient air-Determination of asbestos fibres-Indirect-transfer transmission electron microscopy method
- KS B ISO 11884-2-2011(2021) Optics and photonics-Minimum requirements for stereomicroscope-Part 2:High performance microscopes
- KS B ISO 11884-2-2011(2016) Optics and photonics-Minimum requirements for stereomicroscope-Part 2:High performance microscopes
- KS B ISO 11884-2:2011 Optics and photonics-Minimum requirements for stereomicroscope-Part 2:High performance microscopes
- KS D 2716-2008 Measurement of nanoparticle diameter-Transmission electron microscope
- KS D 2716-2008(2018) Measurement of nanoparticle diameter-Transmission electron microscope
- KS B ISO 11884-2-2021 Optics and photonics-Minimum requirements for stereomicroscope-Part 2:High performance microscopes
- KS D ISO 16700-2013(2018) Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
- KS I ISO 13794-2023 Ambient air — Determination of asbestos fibres — Indirect-transfer transmission electron microscopy method
- KS I ISO 10312-2023 Ambient air — Determination of asbestos fibers-direct-transfer transmission electron microscopy method
- KS P ISO 10936-2:2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
- KS I ISO 13794-2008(2018) Ambient air-Determination of asbestos fibres-Indirect-transfer transmission electron microscopy method
- KS B ISO 19012-1-2016(2021) Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
- KS B ISO 19012-1-2021 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
- KS I ISO 4407:2012 Hydraulic fluid power-Fluid contamination-Determination of particulate contamination by the counting method using an optical microscope
American Society for Testing and Materials (ASTM)
- ASTM D5756-95 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Concentration
- ASTM D5756-02 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Concentration
- ASTM D5755-02 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Concentrations
- ASTM D5755-95 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Concentrations
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM D5756-02(2008) Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Surface Loading
- ASTM D5755-09 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM D5755-03 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM D5755-09(2014)e1 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM RR-D22-1032 2009 D5755-Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Structure Number Surface Loading
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
- ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM D6056-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy
- ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E3143-18a Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM E3143-18 Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM D7201-06(2011) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
- ASTM D605-82(1996)e1 Standard Specification for Magnesium Silicate Pigment (Talc)
- ASTM E3143-18b Standard Practice for Performing Cryo-Transmission Electron Microscopy of Liposomes
- ASTM D6059-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM D7658-17(2021) Standard Test Method for Direct Microscopy of Fungal Structures from Tape
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM C1723-16 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-10 Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM C1723-16(2022) Standard Guide for Examination of Hardened Concrete Using Scanning Electron Microscopy
- ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
- ASTM D7658-17 Standard Test Method for Direct Microscopy of Fungal Structures from Tape
SCC
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- BS ISO 19012-1:2011 Microscopes. Designation of microscope objectives-Flatness of field/Plan
- BS 7012-16:1997 Light microscopes-Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
- 12/30266267 DC BS ISO 19012-1. Microscopes. Designation of microscope objectives. Flatness of field/Plan
- DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- 12/30245653 DC BS ISO 15932. Microbeam analysis. Analytical electron microscopy. Vocabulary
- BS EN ISO 9220:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
- 08/30138435 DC BS ISO 24597. Microbeam analysis. Scanning electron microscopy. Methods for the evaluation of image sharpness
- DANSK DS/EN ISO 9220:1994 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- HOLDEN HN 0295-2012 Microscopic Measurement of Dry Film Build Thickness
- HOLDEN HN 0295-2004 MICROSCOPIC MEASUREMENT OF DRY FILM BUILD THICKNESS
- BS ISO 19012-1:2007 Optics and photonics. Designation of microscope objectives-Flatness of field/plan
- AENOR UNE-EN ISO 9220:1996 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
- BS 7012-8:1990 Light microscopes-Specification for surface marked graticules for eyepieces
- NS-EN ISO 9220:1994 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method (ISO 9220:1988)
- BS ISO 19012-2:2009 Optics and photonics. Designation of microscope objectives-Chromatic correction
- VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method
- DANSK DS/EN ISO 19749:2023 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
- NS-EN ISO 19749:2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
- NS-EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
- VDI 3492-2013 Measuring indoor air pollution — Measuring immissions — Measuring inorganic fibrous particles — Scanning electron microscopy method
- DANSK DS/EN ISO 21363:2022 Nanotechnologies – Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
- BS 3406-4:1963 Methods for determination of particle size distribution-Optical microscope method
- DIN EN ISO 19749 E:2022 Draft Document - Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German and English version prEN ISO 19749:2022
- AWWA JAW3027 Journal AWWA — Coagulation Mechanisms: An Electron Microscopic Study Using Aluminum Sulfate
- DIN EN ISO 21363 E:2021 Draft Document – Nanotechnologies – Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020); German and English version prEN ISO 21363:2021
KR-KS
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS B ISO 19012-1-2016 Optics and photonics-Designation of microscope objectives-Part 1:Flatness of field/Plan
- KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
- KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
- KS P ISO 10936-2-2020 Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
Association Francaise de Normalisation
- NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
- NF X11-660:1983 Granulométrie - Analyse granulométrique par microscopie optique - Généralités sur le microscope.
- XP ISO/TS 24597:2011 Microbeam Analysis - Scanning Electron Microscopy - Methods for Assessing Image Sharpness
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- NF X43-050:2021 Air quality - Determination of the asbestos fiber concentration by transmission electron microscopy - Indirect method
- NF X43-050:1996 Air quality. Determination of the asbestos fiber concentration by transmission electron microscopy. Indirect method.
- NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
- NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- X11-660:1983 Particle size analysis by optical microscope method. General indications on microscope.
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- NF ISO 13794:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert indirect
- NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
- NF ISO 10312:2020 Air ambiant - Dosage des fibres d'amiante - Méthode par microscopie électronique à transmission par transfert direct
Society of Automotive Engineers (SAE)
- SAE ARP598C-2003 (R) Aerospace Microscopic Sizing and Counting of Particulate Contamination for Fluid Power Systems
Association of German Mechanical Engineers
- DVS 2803-1974 Electron-beam welding in microscopy (survey)
- DVS 2801-1968 Resistance welding in microscopy (survey)
- VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
GOST
- GOST R ISO 14966-2022 Ambient air. Determination of numerical concentration of inorganic fibrous particles. Scanning electron microscopy method
Military Standards (MIL-STD)
- DOD A-A-54873-1993 BOXES, MICROSCOPE SLIDE, PLASTIC
- DOD A-A-53609-1988 FORCEPS, MICROSCOPE COVER GLASS
Danish Standards Foundation
- DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
- DS/ISO 10936-2:2010 Optics and photonics - Operation microscopes - Part 2: Light hazard from operation microscopes used in ocular surgery
SE-SIS
- SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
- SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice
German Institute for Standardization
- DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
- DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
- DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
- DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
- DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
European Committee for Standardization (CEN)
- EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
- EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
- prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
- IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
Spanish Association for Standardization (UNE)
- UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
- UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
- UNE 77236:1999 AMBIENT AIR. DETERMINATION OF ASBESTOS FIBRES. DIRECT-TRANSFER TRANSMISSION ELECTRON MICROSCOPY METHOD.
RU-GOST R
- GOST 21006-1975 Electron microscopes. Terms, definitions and letter symbols
- GOST 23392-1978 Meat. Methods for chemical and microscopic analysis of freshness
- GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
PH-BPS
- PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
International Electrotechnical Commission (IEC)
- IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components
American National Standards Institute (ANSI)
- ANSI/ASTM D6056:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy
- ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components
Defense Logistics Agency
- DLA A-A-52040 VALID NOTICE 2-2007 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)
- DLA A-A-52040 VALID NOTICE 1-2001 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)
- DLA A-A-52040-1992 STEREOSCOPES, LENS, AERIAL PHOTOGRAPH INTERPRETATION (POCKET)
Lithuanian Standards Office
- LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
DIN
- DIN EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
AT-ON
- OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
TH-TISI
- TIS 1083-1992 Standard for measurement of coating thickness by microscopical method
VDI - Verein Deutscher Ingenieure
- VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
- VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method
- VDI 3492-2011 Messen von Innenraumluftverunreinigungen - Messen von Immissionen - Messen anorganischer faserfoermiger Partikeln - Rasterelektronenmikroskopisches Verfahren
ESDU - Engineering Sciences Data Unit
- SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)
IN-BIS
- IS 6191-1971 Microbiological color fastness and microscopic test methods for leather
BE-NBN
- NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)
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