electron microscope description

electron microscope description, Total:86 items.

The international standard classification for "electron microscope description" includes: Power transmission and distribution networks , Linear and angular measurements in general , Metallic coatings .

The Chinese standard classification for "electron microscope description" includes: Electron optics and other physical optics instrument , Chemical Measurement , Basic standards and general methods for household appliances , Relay protection and automatic device , Material Protection .

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Professional Standard - Machinery

JB/T 6842-1993 Test Method of Scanning Electron Microscope
JB/T 5384-1991 Scanning Electron Microscope - Technical Specification

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

National Metrological Verification Regulations of the People's Republic of China

JJG 550-1988 Verification Regulation of Scanning Electron Microscope
JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 30149-2019 CIM based efficient model exchange format
GB/T 16594-1996 Micron grade lenght measurement by SEM
GB/T 31563-2015 Metallic coatings―Measurement of coating thickness―Scanning electron microscope method
GB/T 36430-2018 Device description file of IoT appliance
GB/T 30149-2013 Grid Common Model Description Specification

Group Standards of the People's Republic of China

T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
T/CSTM 00795-2022 Materials experimental data-Requirements for scanning electron microscope images

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Beijing Provincial Standard of the People's Republic of China

DB11/T 762-2010 E-government business description specification

Professional Standard - Energy and Power Planning

DL/T 1230-2016 Graphic description specification for electric power system

American Society for Testing and Materials (ASTM)

ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

International Organization for Standardization (ISO)

ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 10284:1997 Cinematography - Graphical symbols - Description

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy

Magyar Szabványügyi Testület

MSZ 18/2-1980 Description table. Description table creation
MSZ 7811/1-1987 Data description 7-bit code, written character description
MSZ KGST 284-1976 Screw description
MSZ KGST 650-1977 Horizontal axis description

American National Standards Institute （ANSI)

ANSI/TIA/EIA 664-000-A-2000 Wireless Features Description
ANSI/TIA-664-510-B-2007 Wireless Features Description: Conference Calling (CC)
ANSI/TIA-664-537-2007 Wireless Features Description: Wireless Intelligent Network Feature Descriptions
ANSI/TIA-664-537-B-2007 Wireless Features Description: Wireless Intelligent Network Feature Descriptions

American Association of State Highway and Transportation Officials

German Institute for Standardization

DIN 48830:1985 Lightning Protection System Description

British Standards Institution (BSI)

13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS EN 62298-1:2005 Teleweb application - General description
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)

Aeronautical Radio Inc.

ARINC 739-1 ITEM 3.0-1990 MCDU Description
ARINC 646 ITEM 2.0-1995 Elan General Description
ARINC 739A-1 ITEM 3.0-1998 MCDU Description
ARINC 535A ITEM 1.0 General Description
ARINC 745-2 ITEM 3.0-1993 System Description
ARINC 745-2 ITEM 3.0 System Description
ARINC 742 ITEM 3.0-1988 System Description
ARINC 666 ITEM 2.0 Process Description
ARINC 742 ITEM 3.0 System Description

Korean Agency for Technology and Standards (KATS)

KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2024 General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS G 9009-2002(2017) Cinematography－Graphical symbols－Description
KS G 9009-2002(2022) Cinematography－Graphical symbols－Description
KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
BH GSO ISO 10284:2017 Cinematography -- Graphical symbols -- Description

International Electrotechnical Commission (IEC)

IEC 61182-1:1994 Printed boards - Electronic data description and transfer - Part 1: Printed board description in digital form

GCC Standardization Organization

GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

Internet Engineering Task Force (IETF)

RFC 4568-2006 Session Description Protocol (SDP) Security Descriptions for Media Streams

Spanish Association for Standardization (UNE)

AENOR UNE 1126:1984 Microcopy. See ISO number 2. Description and use in the photographic reproduction of documents.

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 10284:2015 Cinematography -- Graphical symbols -- Description
OS GSO IEC 61182-1:2014 Printed boards - Electronic data description and transfer - Part 1: Printed board description in digital form

Czech Standards Institute (UNMZ)

CSN 90 2342-1955 Describe the model

International Telecommunication Union (ITU)

ITU-T P.41-1980 Description of the ARAEN
ITU-T P.41-1976 Description of the ARAEN

(U.S.) Telecommunications Industries Association

TIA SP 3-4652.537-RV1-2007 Wireless Features Description: Wireless Intelligent Network Feature Descriptions To be published as TIA-664.537-A
TIA-664.537-B-2007 Wireless Features Description: Wireless Intelligent Network Feature Descriptions

U.S. Military Regulations and Norms

ARMY MIL-HDBK-790 CHG NOTICE 2-1993 FRACTOGRAPHY AND CHARACTERIZATION OF FRACTURE ORIGINS IN ADVANCED STRUCTURAL CERAMICS

Process Industry Practices

PIP PNSMV068-2010 Plug Valve Descriptions

Society of Automotive Engineers (SAE)

SAE ARINC800P1-2012 CABIN CONNECTORS AND CABLES PART 1 DESCRIPTION AND OVERVIEW