sem electron microscope scanning
sem electron microscope scanning, Total:41 items.
The international standard classification for "sem electron microscope scanning" includes: Chemical analysis .
The Chinese standard classification for "sem electron microscope scanning" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Chemical Measurement .
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
National Metrological Verification Regulations of the People's Republic of China
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
未注明发布机构
- SEMI F73-0309-2009 TEST METHOD FOR SCANNING ELECTRON MICROSCOPY (SEM) EVALUATION OF WETTED SURFACE CONDITION OF STAINLESS STEEL COMPONENTS
Professional Standard - Education
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
- JY/T 010-1996 General rules for analytical scanning electron microscopy
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
国家能源局
- SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
Professional Standard - Petroleum
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
- SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
British Standards Institution (BSI)
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
International Organization for Standardization (ISO)
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
SCC
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
Korean Agency for Technology and Standards (KATS)
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
- KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS I 0051-1999 General rules for scanning electron microscopy
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
- KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
GSO
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
KR-KS
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
American Society for Testing and Materials (ASTM)
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
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