sem scanned
sem scanned, Total:28 items.
The international standard classification for "sem scanned" includes: .
The Chinese standard classification for "sem scanned" includes: .
未注明发布机构
- DIN ISO 16000-27 E:2012-12 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
- SEMI F73-0309-2009 TEST METHOD FOR SCANNING ELECTRON MICROSCOPY (SEM) EVALUATION OF WETTED SURFACE CONDITION OF STAINLESS STEEL COMPONENTS
British Standards Institution (BSI)
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
- 12/30228339 DC BS ISO 16000-27. Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
- BS ISO 17097:2024 3-D human body scan data. Methods for the processing of human body scan data
International Organization for Standardization (ISO)
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO 16000-27:2014 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
American Society for Testing and Materials (ASTM)
- ASTM F1372-93(1999) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
- ASTM F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
- ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
- ASTM F1372-93(2005) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
- ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (4
1 2 - ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
- ASTM F1372-93(2012) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
German Institute for Standardization
- DIN ISO 16000-27:2014-11 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method) (ISO 16000-27:2014)
- DIN ISO 16000-27:2014 Indoor air - Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method) (ISO 16000-27:2014)
GSO
- GSO ISO 16000-27:2017 Indoor air -- Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
- OS GSO ISO 16000-27:2017 Indoor air -- Part 27: Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
Association Francaise de Normalisation
- NF ISO 16000-27:2014 Indoor air - Part 27: determination of fibrous dust deposited on surfaces by SEM (scanning electron microscopy) (direct method)
- NF X43-404-27*NF ISO 16000-27:2014 Indoor air - Part 27 : determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
U.S. Military Regulations and Norms
- ARMY MIL-PRF-49177 B VALID NOTICE 1-2013 SCAN-INTERLACE, PL-1408/UA
- ARMY MIL-PRF-49168C-1997 SCAN-INTERLACE, PL-1403/UA, PL-1403A/UA
- ARMY MIL-PRF-49168 C NOTICE 1-2013 SCAN-INTERLACE, PL-1403/UA, PL-1403A/UA
RU-GOST R
- GOST ISO 16000-27-2017 Indoor air. Part 27. Determination of settled fibrous dust on surfaces by SEM (scanning electron microscopy) (direct method)
SCC
- BS DISC PD 0016:2001 Document scanning. Guide to scanning business documents
- BS PD 0016:2001 Document scanning. Guide to scanning business documents
Institute of Electrical and Electronics Engineers (IEEE)
- IEEE 1450.6.1-2009 Describing on-chip scan compression
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