Scanning Electron Microscopy Spectroscopy

Scanning Electron Microscopy Spectroscopy, Total:108 items.

The international standard classification for "Scanning Electron Microscopy Spectroscopy" includes: Protection against crime , Chemical analysis , Other standards related to analytical chemistry .

The Chinese standard classification for "Scanning Electron Microscopy Spectroscopy" includes: Electron optics and other physical optics instrument , Crime judging technology , Basic standards and general methods , Chemical Measurement .

Professional Standard - Machinery

JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
JB/T 6842-1993 Test Method of Scanning Electron Microscope

Professional Standard - Judicatory

SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM and XEDS
GB/T 17361-2013 Microbeam analysis—Identification of authigenic clay mineral in sedimentary rock menthod by scanning electron microscope and energy dispersive spectrometer
GB/T 20726-2025 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
GB/T 23414-2009 Microbeam analysis - Scanning electron microscopy - Vocabulary
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences―Part 6:Scanning electron microscopy
GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens

National Metrological Verification Regulations of the People's Republic of China

JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
JJG 550-1988 Verification Regulation of Scanning Electron Microscope

National Metrological Technical Specifications of the People's Republic of China

JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)

Professional Standard - Public Safety Standards

GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
GA/T 909-2010 Collecting and packaging method for trace evidence—Gunshot residue(SEM/EDS examination)

Professional Standard - Education

JY/T 010-1996 General rules for analytical scanning electron microscopy
JY/T 0584-2020 General rules of analytical methods for scanning electron microscope

Shanghai Provincial Standard of the People's Republic of China

DB31/T 297-2003 Calibration method of magnification of scanning electron microscope

Professional Standard - Petroleum

SY/T 5162-2021 Analytical method for rock samples by scanning electron microscope
SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
SY/T 5162-1997 Analytical Method of Rock Sample by Scanning Electron Microscope

Professional Standard - Commodity Inspection

SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy

Group Standards of the People's Republic of China

T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3459-2018 Scanning Electron Microscopy for Measuring the Micro-area Coverage of Graphene Films

International Organization for Standardization (ISO)

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary

Japanese Industrial Standards Committee (JISC)

JIS K 0132:1997 General rules for scanning electron microscopy
JIS K 3850-1:2006 Determination of airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method

Korean Agency for Technology and Standards (KATS)

KS D ISO 22493:2012 Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
KS M 0044-1999 General rules for scanning electron microscopy
KS I 0051-2024 General rules for scanning electron microscopy
KS I 0051-1999(2019) General rules for scanning electron microscopy
KS I 0051-2019 General rules for scanning electron microscopy
KS I 0051-1999 General rules for scanning electron microscopy
KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope
KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary

British Standards Institution (BSI)

BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
06/30128226 DC ISO 22493. Microbeam analysis. Scanning electron microscopy. Vocabulary
13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

GCC Standardization Organization

GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
OS GSO ISO 19749:2024 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
BH GSO ISO 19749:2024 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
GSO ISO/TS 24597:2013 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness
GSO ISO 9220:2013 Metallic coatings -- Measurement of coating thickness -- Scanning electron microscope method

Association of German Mechanical Engineers

VDI 3866 BLATT 5-2015 Bestimmung von Asbest in technischen Produkten - Rasterelektronenmikroskopisches Verfahren
VDI 3866 Blatt 5-2003 Determination of asbestos in technical products - Scanning electron microscopy method
VDI 3866 BLATT 5-2017 Determination of asbestos in technical products — scanning electron microscopic method

American Society for Testing and Materials (ASTM)

ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
ASTM STP 372-1965 Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis
ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry

Association Francaise de Normalisation

NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
NF EN ISO 19749:2023 Nanotechnologies - Determination of particle size and shape distribution by scanning electron microscopy
NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.

Gosstandart of Russia

PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry

Danish Standards Foundation

DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DANSK DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
DANSK DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DANSK DS/EN ISO 19749:2023 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
DANSK DS/ISO 9220:2022 Metallic coatings – Measurement of coating thickness – Scanning electron microscope method

Bureau of Indian Standards

IS 16410-2017 Nanotechnologies - Characterization of Single-Wall Carbon Nano-tubes Using Scanning Electron Microscopy and Energy Dispersive X-Ray Spectrometry Aanlysis

European Committee for Standardization (CEN)

EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)

German Institute for Standardization

DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Ente Nazionale Italiano di Unificazione

UNI EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
UNI EN ISO 9220:1998 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method

Spanish Association for Standardization (UNE)

UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)

Swedish Institute for Standards

SS-ISO 9220:1989 Metallic coatings - Measurements of coating thickness - Scanning electron microscope method
SS-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)

American Water Works Association (AWWA)

AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope

Standards Norway

NS-EN ISO 19749:2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)