SEM features
SEM features, Total:35 items.
The international standard classification for "SEM features" includes: Chemical analysis .
The Chinese standard classification for "SEM features" includes: Electron optics and other physical optics instrument , Chemical Measurement , Basic standards and general methods .
Professional Standard - Commodity Inspection
- SN/T 4388-2015 Leather identification―Scanning electron microscopy and optical microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Group Standards of the People's Republic of China
- T/CSTM 00714-2025 Railway wheels Part 3: Characterization of ferrite - In situ statistical distribution analysis - Scanning electron microscopy method
- T/CSTM 00713-2025 Railway wheels - Part 2: Characterization of inclusions - In situ statistical distribution analysis - Scanning electron microscopy method
- T/SPSTS 032-2023 General specifications for scanning electrochemical microscopy
Military Standard of the People's Republic of China-General Armament Department
- GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
- GJB 2666-1996 Specification for scanning reflective beryllium mirrors
Professional Standard - Education
- JY/T 0584-2020 General rules of analytical methods for scanning electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 33834-2017 Microbeam analysis―Scanning electron microscopy―Scanning electron microscope analysis of biological specimens
American Society for Testing and Materials (ASTM)
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2024) Standard Practice for Scanning Electron Microscope Beam Size Characterization
International Organization for Standardization (ISO)
- ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
British Standards Institution (BSI)
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
Korean Agency for Technology and Standards (KATS)
- KS M 0044-1999 General rules for scanning electron microscopy
- KS I 0051-1999(2019) General rules for scanning electron microscopy
- KS I 0051-2024 General rules for scanning electron microscopy
- KS I 0051-2019 General rules for scanning electron microscopy
- KS I 0051-1999 General rules for scanning electron microscopy
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
GCC Standardization Organization
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
American Water Works Association (AWWA)
- AWWA ACE56156 Evaluation of Membrane Surface Fouling Patterns Using a Flatbed Scanner and Scanning Electron Microscope
system features,Feature amount,transmission feature,Flow characteristics,spectral features,signature,Anti-skid feature,SEM characteristic x-rays,wear characteristics,characteristic performance,Infrared features,Diffraction features,beef characteristics,characteristic impedance,Characteristic x-rays in a scanning electron microscope,characteristic peak characteristic wavelength,Functional characteristics, application characteristics,characteristic temperature characteristic velocity,SEM features,Characteristic Concentration and Characteristic Mass
