SEM characteristic x-rays
SEM characteristic x-rays, Total:33 items.
The international standard classification for "SEM characteristic x-rays" includes: Protection against crime , Optical equipment , Other standards related to analytical chemistry .
The Chinese standard classification for "SEM characteristic x-rays" includes: Crime judging technology , Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer .
Professional Standard - Judicatory
- SF/T 0139-2023 Examination of soil—Scanning electron microscope/X-ray energy dispersive spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM and XEDS
- GB/T 17362-2008 Analysis method for gold products with X-ray EDS in SEM
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 17362-1998 Nondestructive method of X-ray EDS analysis with SEM for gold jewelry
Guangdong Provincial Standard of the People's Republic of China
- DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy
- DB44/T 1215-2013 Characterization of Single-Walled Carbon Nanotubes Using Scanning Electron Microscopy and Energy Spectroscopy
Professional Standard - Public Safety Standards
- GA/T 1939-2021 Forensic sciences-Examination methods for electric marks-Scanning electron microscopy/energy dispersive X-ray spectrometry
- GA/T 1522-2018 Forensic science―Examination methods for gun shot residue―Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1937-2021 Forensic sciences-Examination methods for rubber- Scanning electron microscope/energy dispersive X-ray spectrometry
- GA/T 1521-2018 Forensic science—Examination methods for elements of plastic—Scanning electron microscope/energy dispersive X-ray analysis
- GA/T 1519-2018 Forensic science―Examinaton methods for elements of toner―Scanning electron microscope/energy dispersive X-ray analysis
- GA/T 1938-2021 Forensic sciences- Examination methods for metal-Scanning electron microscope/energy dispersive X-ray spectrometry
Fujian Provincial Standard of the People's Republic of China
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
Professional Standard - Commodity Inspection
- SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export-Part 1:X-ray diffraction and scan electron microscopy method
国家能源局
- NB/T 10122-2018 Shale scanning and imagination method using X-ray computed tomography
Military Standard of the People's Republic of China-General Armament Department
- GJB 2666-1996 Specification for scanning reflective beryllium mirrors
- GJB 2666A-2018 Specification for scanning reflective beryllium mirrors
International Organization for Standardization (ISO)
- ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
American Society for Testing and Materials (ASTM)
- ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
GOSTR
- PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry
British Standards Institution (BSI)
- DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
SCC
- DANSK DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Association Francaise de Normalisation
- FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Danish Standards Foundation
- DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- DS/EN 12543-1:2002 Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 1: Scanning method
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 BLATT 4-2018 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
- VDI/VDE 5575 BLATT 4-2017 X-ray optical systems - X-ray mirrors and X-ray mirror systems - Total reflection mirrors and multilayer mirrors
Lithuanian Standards Office
- LST EN 12543-1-2001 Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 1: Scanning method
Electronic Components, Assemblies and Materials Association
- ECA TEP197-A-1997 Preparation of X-Radiation Characteristic Curves for Cathode Ray Tubes
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