SEM
SEM, Total:16 items.
The international standard classification for "SEM" includes: Physicochemical methods of analysis , Paper and board , Optical equipment , Protection against crime , Other standards related to analytical chemistry .
The Chinese standard classification for "SEM" includes: Electron optics and other physical optics instrument , Material Protection , Crime judging technology , Basic standards and general methods , Paper , Electrochemical, thermochemistry and optical profile type analyzer , Chemical Measurement , Plant quarantine, pest control .
Professional Standard - Machinery
- JB/T 7503-1994 Thickness of Cross Section of Metal Coatings Scanning Electron Microscope Measuring Method
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 5383-1991 Specification for Transmission Electron Microscope
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 9352-1999 Test method for the transmission electron microscope
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4546-2023 Technical specification for automatic recognition of digital scanning electron microscopy images of diatoms
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences―Part 6:Scanning electron microscopy
- GB/T 18735-2014 Microbeam analysis-General guide for the specification of nanometer thin reference materials for analytical transmission electron microscope(AEM/EDS)
- GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences - Part 6:Scanning electron microscope/ X ray energy dispersive spectrometry
- GB/T 2679.11-1993 Paper and board―Qualitative analysis of mineral filler and mineral coating―SEM/EDAX method
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X - Ray energy dispersive spectrometry(EDS)quantitative microanalysis for thin biological specimens
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB 7667-2003 The dose of X-rays leakage from electron microscope
- GB 7667-1996 The dose of X-rays leakage from electron microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Professional Standard - Commodity Inspection
- SN/T 1840-2006 Method for detection of plant viruses by immuno-electron microscopy
electron microscope,electron microscope transmission electron microscope,electron microscope electron microscope,Electron microscope + electron microscope,SEM + TEM,TEM electron microscope,scanning electron microscope,Electron microscope analysis,large electron microscope,Electron microscope parameters,Elements of SEM,SEM,Immuno-EM,The original of the electron microscope,Going further,Electron microscope detection,electron microscope electron microscope,several electron microscopes,The original of the electron microscope
