probe
probe, Total:75 items.
The international standard classification for "probe" includes: Dental equipment , Surgical instruments and materials , Testing of metals , Carbon materials , Electricity. Magnetism. Electrical and magnetic measurements , Burners. Boilers , Mechanical structures for electronic equipment , Semiconducting materials , Optical measuring instruments , Other methods of testing of metals , Chemical analysis of metals , Other standards related to optics and optical measurements , Chemical technology (Vocabularies) .
The Chinese standard classification for "probe" includes: Stomatologic device, equipment and material , Other special devices , General and microsurgical devices , Technical management , Technical management , Metal physical property test method , Basic standards and general methods , Oxide and elementary substance , Radio Measurement , Boiler and its auxiliary equipment , Dedicated processing equipment , Semimetal and semiconductor material in general , Electron optics and other physical optics instrument , Semimetal and semiconductor material analysis method , Optical Measurement .
Professional Standard - Medicine
- YY/T 1014-2013 Dental explorers
- YY 91014-1999 Dental explorers
- YY/T 0172-2014 Uterine probe
- YY 91914-1999 Dental probe
- YY 0075-2005 Lachrymal probes
- YY/T 0172-1994 Explorer for womb
- YY/T 0075-2005 Lachrymal probes
Professional Standard - Electron
- SJ/T 10315-1992 Generic specification for Four-point probe
- SJ/T 10314-1992 Generic specification of resistivity measuring instrument with four-point probe
- SJ/T 31122-1994 Requirements of readiness and methods of inspection and assessment for four-point probes
- SJ/T 10481-1994 Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 39978-2021 Nanotechnology—Resistivity of carbon nanotube powder—Four probe method
- GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
- GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
- GB/T 39518-2020 Geometrical product specifications (GPS)—Guidelines for the evaluation of coordinate measuring machine (CMM) test uncertainty for CMMs using single and multiple stylus contacting probing systems
National Metrological Verification Regulations of the People's Republic of China
- JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method
- JJG 901-1995 Verivication Regulation of Electron Probe Microanalyzer
- JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method
Professional Standard - Machinery
- JB/T 8501-1996 Boiler Soot Blowers and Thermoprobe
National Metrological Technical Specifications of the People's Republic of China
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
Taiwan Provincial Standard of the People's Republic of China
- CNS 12846-1991 Helium Mass Spectrometer Leak Testing by Trace Probe Method
- CNS 5931-1981 Urethral Bougies
- CNS 7452-1998 Dental explorers
- CNS 6288-1989 Probes
- CNS 8166-1981 Lacrimal Probe
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
- GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
- GB/T 6617-1995 Test method for measuring resistivity of silicon wafers using spreading resistance probe
- GB/T 4930-1993 General specification of electron probe microanalysis STANDARD specimen
- GB/T 21636-2008 Microbeam analysis - Electron Probe Micro Analysis (EPMA) - Vocabulary
- GB/T 15394-1994 General specification for probe tester
- GB/T 1551-1995 Test method for resistivity of silicon and germanium bars using a two-point probe
- GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe
- GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
- GB/T 15074-1994 General guide for EPMA quantitative analysis
- GB 5666-1985 Dental explorers
Professional Standard - Aviation
- HB 4574.4-1992 Die safety control device Probe control device
Professional Standard - Non-ferrous Metal
- YS/T 602-2007 Test method for resistivity of zone-refined germanium ingot using a two-point probe
Jilin Provincial Standard of the People's Republic of China
- DB22/T 3089-2019 Fluorescent PCR probe method for detection of sheep infectious impetigo virus
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4027-2021 Dynamic four-probe method for the determination of electrical conductivity of graphene powder
Hebei Provincial Standard of the People's Republic of China
- DB13/T 5255-2020 Determination of square resistance of graphene conductive ink by four-probe method
Military Standard of the People's Republic of China-General Armament Department
- GJB 9727-2020 Langmuir Probe Detector Specifications
国家药监局
- YY/T 1014-2021 Dentistry—Dental explorer
Japanese Industrial Standards Committee (JISC)
- JIS T 2605:1953 Probes
- JIS T 2619:1983 Lacrimal probe
- JIS T 5402:2000 Dental explorers
- JIS T 3202:1953 Urethral bougies
- JIS T 5402:1979 Dental explorers
Korean Agency for Technology and Standards (KATS)
- KS P 2014-2006 Probes
- KS P ISO 7492:2013 Dental explorers
- KS P 7429-1995(2016) Periodontal pocket probes
- KS P 7429-1995 Periodontal pocket probes
- KS P 7112-2006 Dental explorers
HU-MSZT
- MSZ 12192-1981 dental probe
- MNOSZ 15513-1955 Surgical instruments. probe
RU-GOST R
- GOST R 50564-1993 Dental explorers
- GOST 30398-1995 Dental explorers
British Standards Institution (BSI)
- BS EN ISO 7492:1998 Dental explorers
- BS EN ISO 7492:1997 Dental explorers
CZ-CSN
- CSN ON 81 3790-1966 Electric feeler
- CSN ON 81 3791-1966 Holder of electric íeeler
International Organization for Standardization (ISO)
- ISO 7492:1997 Dental explorers
- ISO 7492:1983 Dental explorers
- ISO 7492:2018 Dentistry - Dental explorer
German Institute for Standardization
- DIN EN ISO 7492:1998 Dental explorers (ISO 7492:1997); German version EN ISO 7492:1998
Military Standards (MIL-STD)
- DOD A-A-51398-1986 BOUGIE, URETHRAL, OTIS
- DOD A-A-53933-1989 PROBE, PERIODONTAL
- DOD A-A-51490-1987 PROBE, GENERAL OPERATING (MALL)
RO-ASRO
- STAS 12874-1990 Dental explorers
GOST
- GOST 882-1975 Probes. Specifications
European Committee for Standardization (CEN)
- EN ISO 7492:1998 Dental Explorers
- EN ISO 7492:2019 Dentistry - Dental explorer (ISO 7492:2019)
CEN - European Committee for Standardization
- EN ISO 7492:2018 Dentistry - Dental explorer
Association Francaise de Normalisation
- NF S91-111:1998 Dental explorers.
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