GB/T 15394-1994 in English

VALID

General specification for probe tester

Issued on:1994-01-02
Implemented on:1995-08-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $120.00
$117.00

Standard No:	GB/T 15394-1994
Document status:	VALID
Superseded by:	GB/T 15394-2026 General specification for probe tester
Superseded on:	2027-03-01
Title in English:	General specification for probe tester
Title in Chinese:	多探针测试台通用技术条件
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1994-01-02
Implemented on:	1995-08-01
ICS Classification:	31.240-Mechanical structures for electronic equipment
Chinese Classification:	L97-Dedicated processing equipment
Professional Classification:	GB-National Standard
Related Keywords:	probe test benches probe benches probe tester scopethis standard general specification multi-probe test benches
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《GB/T 15394-1994多探针测试台通用技术条件》由339-1（工业和信息化部（电子））归口，主管部门为工业和信息化部（电子）。
本标准规定了多探针测试台的术语、技术要求、试验方法、检验规则、包装贮存等要求。本标准适用于手动、半自动、全自动多探针测试台。其他类型的探针测试台亦可参照使用。

Scope

This standard specifies the terminology, technical requirements, test methods, inspection rules, packaging and storage requirements of multi-probe test benches (hereinafter referred to as probe benches). This standard applies to manual, semi-automatic and fully automatic multi-probe test benches. Other types of probe test benches can also be used as a reference.

More samples: NB/T 47013.2-2015 GB 50021-2001(2009) JC/T 2453-2018

Sample only — not a preview of GB/T 15394-1994

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