High-quality four-probe test bench
High-quality four-probe test bench, Total:27 items.
The international standard classification for "High-quality four-probe test bench" includes: Electricity. Magnetism. Electrical and magnetic measurements , Mechanical structures for electronic equipment , Other methods of testing of metals , Chemical analysis of metals , Testing of metals .
The Chinese standard classification for "High-quality four-probe test bench" includes: Radio Measurement , Dedicated processing equipment , Semimetal and semiconductor material analysis method , Metal physical property test method , Technical management .
National Metrological Verification Regulations of the People's Republic of China
- JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method
- JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 26074-2010 Germanium monocrystal—Measurement of resistivity-DC linear four-point probe
- GB/T 15394-1994 General specification for probe tester
- GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
Professional Standard - Electron
- SJ/T 10314-1992 Generic specification of resistivity measuring instrument with four-point probe
- SJ/T 31122-1994 Requirements of readiness and methods of inspection and assessment for four-point probes
- SJ/T 31123-1994 Requirements of readiness and methods of inspection and assessment for automatic multi-point test probes
Group Standards of the People's Republic of China
- T/CSTM 00252-2020 Test method for carbon fiber electrical resistivity by Four-probe method
- T/CASAS 019-2021 Test method for resistivity of micro and nano metal sintered compact: four probe method
- T/ZGIA 001-2019 Graphene test method for the determination of powder conductivity four-probe method
Jiangsu Provincial Standard of the People's Republic of China
- DB32/T 4027-2021 Dynamic four-probe method for the determination of electrical conductivity of graphene powder
Professional Standard - Ferrous Metallurgy
- YB/T 6166-2024 Graphene film sheet resistance measurement four-probe method
Hebei Provincial Standard of the People's Republic of China
- DB13/T 5255-2020 Determination of square resistance of graphene conductive ink by four-probe method
Korean Agency for Technology and Standards (KATS)
- KS D 0260-1999 TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
- KS C 0256-2022 Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS L 1619-2013(2018) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
- KS C 0256-2002(2022) Testing method of resistivity for silicon crystals and silicon wafers with four - point probe
- KS D 0260-1989(1994) TESTING METHODS OF RESISTIVITY FOR SINGLE CRYSTAL SILICON WAFERS WITH FOUR-POINT PROBE
- KS L 1619-2023 Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
RU-GOST R
- GOST 24392-1980 Monocrystalline silicon and germanium. Measurement of the electrical resistivity by the four-probe method
Japanese Industrial Standards Committee (JISC)
- JIS K 7194:1994 Testing method for resistivity of conductive plastics with a four-point probe array
- JIS H 0602:1995 Testing method of resistivity for silicon crystals and silicon wafers with four-point probe
- JIS H 0612:1975 Testing methods of resistivity for single crystal silicon wafers with four point probe
American Society for Testing and Materials (ASTM)
- ASTM E499-95(2006) Standard Test Methods for Leaks Using the Mass Spectrometer Leak Detector in the Detector Probe Mode
KR-KS
- KS L 1619-2013(2023) Testing methods for resistivity of conductive fine ceramic thin films with four point probe array
