Test Probe Surface

Test Probe Surface, Total:138 items.

The international standard classification for "Test Probe Surface" includes: Chemical analysis , Mechanical structures for electronic equipment , Semiconducting materials , Testing of metals , Electricity. Magnetism. Electrical and magnetic measurements , Measuring instruments , Burners. Boilers .

The Chinese standard classification for "Test Probe Surface" includes: Basic standards and general methods , Dedicated processing equipment , Semimetal and semiconductor material in general , Metal physical property test method , Special electronic technology material , Technical management , Radio Measurement , Measuring tool and instrument , Boiler and its auxiliary equipment .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 1551-2021 Test method for measuring resistivity of monocrystal silicon—In-line four-point probe and direct current two-point probe method
GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
GB/T 45770-2025 Surface chemical analysis—Atomic force microscopy—Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
GB/T 45505.2-2025 Test method of flat panel display glass substrate—Part 2: Surface properties
GB/T 42659-2023 Surface chemical analysis―Scanning probe microscopy―Determination of geometric quantities using SPM:Calibration of measuring systems
GB/T 22461.2-2023 Surface chemical analysis—Vocabulary—Part 2:Terms used in scanning probe microscopy
GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
GB/T 15394-1994 General specification for probe tester
GB/T 42543-2023 Surface chemical analysis—Scanning probe microscopy—Determination of cantilever normal spring constants

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 4378-2022 Four-probe method for non-destructive testing of sheet resistance of nanometer and submicron scale thin films on substrate surface

Professional Standard - Electron

SJ/T 10481-1994 Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques

National Metrological Verification Regulations of the People's Republic of China

JJG 508-2004 Verification Regulation of Resistivity Measuring Instruments with Four-Probe Array Method
JJG 508-1987 Resistivity Measuring Instruments with Four -Probe Array Method

Military Standard of the People's Republic of China-General Armament Department

GJB 9727-2020 Langmuir Probe Detector Specifications
GJB 5105-2004 Specifications for spacecraft surface potential detectors
GJB 5105A-2019 Specifications for spacecraft surface potential detectors

Taiwan Provincial Standard of the People's Republic of China

CNS 10794-1984 Instruments for the Measurement of Surface Roughness by the Stylus Method

Professional Standard - Machinery

JB/T 8501-1996 Boiler Soot Blowers and Thermoprobe
JB/T 15306-2025 Surface temperature sensor for high temperature pressure vessel
JB/T 11271-2012 Contact (stylus) surface contour tester

Professional Standard - Non-ferrous Metal

YS/T 602-2007 Test method for resistivity of zone-refined germanium ingot using a two-point probe
YS/T 602-2017 Test method for resistivity of zone-refined germanium ingot using a two-point probe

Sichuan Provincial Standard of the People's Republic of China

DB51/T 3207-2024 Microwave Probes Application Specifications for Integrated Circuit Testing

Professional Standard - Energy

NB/T 11267-2023 Boiler sootblower and gas temperature probe

British Standards Institution (BSI)

BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
10/30199182 DC BS ISO 11039. Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
BS ISO 11775:2015 Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
BS EN 1971-2:2012 Copper and copper alloys. Eddy current test for measuring defects on seamless round copper and copper alloy tubes. Test with an internal probe on the inner surface
BS EN 1971-2:2011 Copper and copper alloys. Eddy current test for measuring defects on seamless round copper and copper alloy tubes. Test with an internal probe on the inner surface
BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
BS 3042:1992 Test probes to verify protection by enclosures
10/30199179 DC BS ISO 28600. Surface chemical analysis. Data transfer format for scanning-probe microscopy
BS ISO 11952:2019 Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
18/30363678 DC BS EN ISO 22232-2. Non-destructive testing. Characterization and verification of ultrasonic test equipment. Part 2. Probes
11/30199166 DC BS ISO 11952. Surface chemical analysis. Scanning probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
BS PD ISO/TS 17865:2016 Geometrical product specifications (GPS). Guidelines for the evaluation of coordinate measuring machine (CMM) test uncertainty for CMMs using single and multiple stylus contacting probing systems

GCC Standardization Organization

GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
GSO ISO 11775:2021 Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
GSO ISO 28600:2013 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
GSO ISO 11952:2015 Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
GSO ISO 18115-2:2013 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
GSO ISO 13095:2015 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 11039:2015 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
BH GSO ISO 11775:2022 Surface chemical analysis — Scanning-probe microscopy — Determination of cantilever normal spring constants
BH GSO ISO 28600:2016 Surface chemical analysis -- Data transfer format for scanning-probe microscopy
BH GSO ISO 11952:2017 Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
BH GSO ISO 13095:2017 Surface Chemical Analysis -- Atomic force microscopy -- Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 11039:2014 Surface chemical analysis -- Scanning-probe microscopy -- Measurement of drift rate
OS GSO ISO 11952:2015 Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems

American Society for Testing and Materials (ASTM)

ASTM F672-01 Method for measuring resistivity profile perpendicular to silicon wafer surface - Diffusion probe method
ASTM D6230-13 Standard Test Method for Monitoring Ground Movement Using Probe-Type Inclinometers
ASTM D6230-98 Standard Test Method for Monitoring Ground Movement Using Probe-Type Inclinometers
ASTM F1393-02 Miller feedback probe measurement of net carrier density in silicon wafers - mercury probe method
ASTM F2420-05(2011) Standard Test Method for Determining Relative Humidity on the Surface of Concrete Floor Slabs Using Relative Humidity Probe Measurement and Insulated Hood
ASTM D6230-98(2005) Standard Test Method for Monitoring Ground Movement Using Probe-Type Inclinometers
ASTM F2420-05 Standard Test Method for Determining Relative Humidity on the Surface of Concrete Floor Slabs Using Relative Humidity Probe Measurement and Insulated Hood
ASTM E1211-97 Standard Practice for Leak Detection and Location Using Surface-Mounted Acoustic Emission Sensors
ASTM E499-95(2006) Standard Test Methods for Leaks Using the Mass Spectrometer Leak Detector in the Detector Probe Mode
ASTM RR-D01-1169 2013 D7127-Test Method for Measurement of Surface Roughness of Abrasive Blast Cleaned Metal Surfaces Using a Portable Stylus Instrument
ASTM F397-02 Silicon rod two-electrode probe resistivity test method
ASTM F84-02 On-line four-point probe test method for measuring silicon wafer resistivity
ASTM D7127-17 Standard Test Method for Measurement of Surface Roughness of Abrasive Blast Cleaned Metal Surfaces Using a Portable Stylus Instrument
ASTM D5334-00(2004) Standard Test Method for Determination of Thermal Conductivity of Soil and Soft Rock by Thermal Needle Probe Procedure
ASTM D5334-22 Standard Test Method for Determination of Thermal Conductivity of Soil and Rock by Thermal Needle Probe Procedure
ASTM D5334-22ae1 Standard Test Method for Determination of Thermal Conductivity of Soil and Rock by Thermal Needle Probe Procedure
ASTM D5334-22a Standard Test Method for Determination of Thermal Conductivity of Soil and Rock by Thermal Needle Probe Procedure
ASTM E1813-07 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy

International Electrotechnical Commission (IEC)

IEC TR 61032:1990/COR1:1990 Corrigendum 1 - Test probes to verify protection by enclosures
IEC 61032:1990 Test Probes to Verify Protection by Enclosures (Edition 1.0; Corrigendum 09/1990)
IEC TR 61032:1990 Test probes to verify protection by enclosures

International Organization for Standardization (ISO)

ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
ISO 11775:2015 Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
ISO 11952:2019 Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
ISO 18115-2:2013 Surface chemical analysis.Vocabulary.Part 2: Terms used in scanning-probe microscopy
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 18115-2:2010 Analyse chimique des surfaces — Vocabulaire — Partie 2: Termes utilisés en microscopie à sonde à balayage (Première édition)

Society of Automotive Engineers (SAE)

ADS TS351 Test for Electrical Connectors - Test Probe Damage
SAE TS351-1-1985 TS351 Test for Electrical Connectors Test Probe Damage
SAE J1752/2-1995 Measurement of Radiated Emissions From Integrated Circuits-Surface Scan Method (Loop Probe Method) 10 Mhz to 3 Ghz
SAE J1752/2-2016 Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE J1752/2-2011 Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE J1752/2-2003 Measurement of Radiated Emissions from Integrated Circuits -- Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE J1752-2-2003 Measurement of Radiated Emissions from Integrated CircuitsSurface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE J1752-2-2016 Measurement of Radiated Emissions from Integrated Circuits-Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
SAE TS351-1 TS351 Test for Electrical Connectors Test Probe Damage
SAE J2826-2016 Snowmobile Probe Test for Contact with Power Driven Parts

Bureau of Indian Standards

IS 1401-1970 Accessibility Test Probe Specification

Swedish Institute for Standards

SIS SS-IEC 1032:1992 Testprobes to verify protection by enclosures
SS-EN ISO 12179:2022 Geometrical product specifications (GPS) - Surface texture: Profile method - Calibration of contact (stylus) instruments (ISO 12179:2021)

International Telecommunication Union (ITU)

ITU-T Q.4075-2024 Test specifications for remote testing of Internet of things using probes

Austrian Standards

ONORM M 1384-1989 Coordinate metrology; process of probing, uncertainty of probing, type of probe
ONORM M 1348-1995 Control of measuring and test equipment - Testing instruction for electrical linear measuring probes

Japanese Industrial Standards Committee (JISC)

JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
JIS R 1636:1998 Test method for thickness of fine ceramic thin films -- Film thickness by contact probe profilometer
JIS K 0159:2021 Surface chemical analysis -- Scanning-probe microscopy -- Determination of geometric quantities using SPM: Calibration of measuring systems
JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy

German Institute for Standardization

DIN 4000-178:2016 Tabular layouts of properties - Part 178: Probing systems, stylus systems and styli
DIN 4000-178 E:2015-06 Tabular layouts of properties - Part 178: Probing systems, stylus systems and styli
DIN 4000-178:2016-12 Tabular layouts of properties - Part 178: Probing systems, stylus systems and styli
DIN EN 1971-2:2020-02 Copper and copper alloys - Eddy current test for measuring defects on seamless round copper and copper alloy tubes - Part 2: Test with an internal probe on the inner surface; German version EN 1971-2:2019
DIN 4000-178 E:2015 Draft Document - Tabular layouts of properties - Part 178: Probing systems, stylus systems and styli
DIN 44422:1971 Radiation measurement probes - Main dimensions

Korean Agency for Technology and Standards (KATS)

KS B 0535-2005 Method for measurement ox performancecharacteristics of ultrasonic probes
KS B 0501-2001 Instruments for the measurement of surfaceroughness by the stylus method-Profile method

Association for Electrical, Electronic & Information Technologies (VDE)

VDE 0470-2-1993*DIN IEC 61032:1993 Test probes to verify protection by enclosures

Standards Norway

NS-EN 1971-2:2011 Copper and copper alloys — Eddy current test for measuring defects on seamless round copper and copper alloy tubes — Part 2: Test with an internal probe on the inner surface
NS-EN 1971-2:2019 Copper and copper alloys — Eddy current test for measuring defects on seamless round copper and copper alloy tubes — Part 2: Test with an internal probe on the inner surface

Danish Standards Foundation

DS/ENV 1071-1:1993 Advanced technical ceramics. Methods of test for ceramic coatings. Part 1: Determination of coating thickness by contact probe profilometer
DANSK DS/EN 1971-2:2019 Copper and copper alloys – Eddy current test for measuring defects on seamless round copper and copper alloy tubes – Part 2: Test with an internal probe on the inner surface

Gosstandart of Russia

GOST R ISO 7492-2009 Dental explorers. Technical requirements and test methods
GOST 19616-1974 Weaving and knitted fabrics. A method for evaluating the specific surface resistance

Association Francaise de Normalisation

NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.
NF E05-031-701*NF EN ISO 25178-701:2010 Geometrical product specifications (GPS) - Surface texture : areal - Part 701 : calibration and measurement standards for contact (stylus) instruments.
NF A05-115-1:2012 Copper and copper alloys - Eddy current test for measuring defects on seamless round copper and copper alloy tubes - Part 1 : test with an encircling test coil on the outer surface.
NF A05-115-2:2012 Copper and copper alloys - Eddy current test for measuring defects on seamless round copper and copper alloy tubes - Part 2 : test with an internal test probe on the inner surface.
XP P94-123:1999 Soils: reconnaissance and tests - Logging in boreholes - Neutron probe method
NF E05-031-601*NF EN ISO 25178-601:2010 Geometrical product specifications (GPS) - Surface texture : areal - Part 601 : nominal characteristics of contact (stylus) instruments

American Association of State Highway and Transportation Officials

AASHTO MP 12-2004(2013) Standard Practice for Detectable Warning Surfaces
M 333-2015 Standard Specification for Detectable Warning Surfaces
AASHTO M 333-2016(R2020) Standard Specification for Detectable Warning Surfaces
AASHTO M 333-2015 Standard Specification for Detectable Warning Surfaces
AASHTO M 333-2016 Standard Specification for Detectable Warning Surfaces
AASHTO M 333-2016(2020) Standard Specification for Detectable Warning Surfaces
M 333-2016 Standard Specification for Detectable Warning Surfaces
MP 12-2004 Standard Practice for Detectable Warning Surfaces

American National Standards Institute （ANSI)

ANSI/EIA 364-25E:2017 TP-25E Probe Damage Test Procedure for Electrical Connectors

Electronic Components, Assemblies and Materials Association

RS-364-25A-1983 TP-25A Probe Damage Test Procedure for Electrical Connectors

Ente Nazionale Italiano di Unificazione

UNI EN ISO 14273:2002 Specimen dimensions and procedure for shear testing resistance spot, seam and embossed projection welds

Spanish Association for Standardization (UNE)

UNE-EN 1971-2:2020 Copper and copper alloys - Eddy current test for measuring defects on seamless round copper and copper alloy tubes - Part 2: Test with an internal probe on the inner surface

Institute of Electrical and Electronics Engineers (IEEE)

IEEE P1696/D3, September 2025 IEEE Draft Standard for Terminology and Test Methods for Circuit Probes

National Standardisation Body (ASRO)

STAS 5730/4-1987 Surfaces condition RULES FOR THE MEASURE- MENT OF SURFACE ROUGHNESS USING STYLUS INSTRUMENTS

Fondo para la Normalización y Certificación de la Calidad Venezuela, République bolivarienne du

COVENIN 957-1976 Test method for surface area of ceramic fine bricks in Venezuelan fine brick standards

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