How to Calibrate an Electron Microscope
How to Calibrate an Electron Microscope, Total:45 items.
The international standard classification for "How to Calibrate an Electron Microscope" includes: Optical equipment , Geology. Meteorology. Hydrology .
The Chinese standard classification for "How to Calibrate an Electron Microscope" includes: Magnifier and microscope , Electron optics and other physical optics instrument , Hydrology and water conservancy instrument .
National Metrological Technical Specifications of the People's Republic of China
- JJF(机械) 1066-2021 Performance Calibration Specification for Ultrasonic Microscopes
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
- JJF 1092-2002 Calibration Specification for Light-Section Microscopes
- JJF 1914-2021 Calibration Specification for Metallurgical Microscopes
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
- JJF(机械)1066-2021 Ultrasound Microscope Performance Calibration Specification
- JJF 1402-2013 Calibration Specification for Biological Microscopes
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 43846.2-2024 Microscopes—Designation of microscope objectives—Part 2: Chromatic correction
Professional Standard - Machinery
- JB/T 5480-1991 Diaphragm of Electron Microscope
- JB/T 5481-1991 Lamp Filament of Electron Microscope
Professional Standard - Water Conservancy
- SL 144.1-2008 calibration methods of water environmental detecting instrument and equipment calibration method of biology microscopes
American Society for Testing and Materials (ASTM)
- ASTM E766-98(2003) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-98(2008)e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14(2019) Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM E766-14e1 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
British Standards Institution (BSI)
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 19012-2:2013 Microscopes. Designation of microscope objectives. Chromatic correction
- BS ISO 19012-2:2010 Optics and photonics. Designation of microscope objectives. Chromatic correction
- BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
International Organization for Standardization (ISO)
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
Association Francaise de Normalisation
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
Korean Agency for Technology and Standards (KATS)
- KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
- KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
KR-KS
- KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
Japanese Industrial Standards Committee (JISC)
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS K 0132:1997 General rules for scanning electron microscopy
SCC
- BS ISO 19012-2:2009 Optics and photonics. Designation of microscope objectives-Chromatic correction
- 13/30203227 DC BS ISO 13083. Surface chemical analysis. Scanning Probe Microscopy. Standards on the definition and calibration of spatial resolution of Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
RU-GOST R
- GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
GSO
- GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
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