Atomic Force Scanning Microscope
Atomic Force Scanning Microscope, Total:10 items.
The international standard classification for "Atomic Force Scanning Microscope" includes: .
The Chinese standard classification for "Atomic Force Scanning Microscope" includes: .
National Metrological Technical Specifications of the People's Republic of China
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
Group Standards of the People's Republic of China
- T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device
Gosstandart of Russia
- GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
- GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope
American Society for Testing and Materials (ASTM)
- ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
- ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Korean Agency for Technology and Standards (KATS)
- KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
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