Spectrometer sample
Spectrometer sample, Total:42 items.
The international standard classification for "Spectrometer sample" includes: Other standards related to analytical chemistry , Chemical laboratories. Laboratory equipment , Other standards related to optics and optical measurements , Geology. Meteorology. Hydrology , Exploratory and extraction equipment .
The Chinese standard classification for "Spectrometer sample" includes: Chemical Measurement , Radio Measurement , Optical Measurement , Electrochemical, thermochemistry and optical profile type analyzer , Basic standards and general methods , chromatograph , Meteorology , Petroleum geology exploration .
National Metrological Verification Regulations of the People's Republic of China
- JJG(航空) 044-1989 Verification rules for single-scan oscillographic polarographs
- JJG 549-1988 Verification Regulation of Square Wave Polarograph
- JJG 748-1991 Oscilloscopic Polarograph
- JJG 748-2007 Verfication Regulation of Oscilloscopic Polarograph
- JJG(地质) 1004-1990 Verification Regulations for Oscilloscope Polarograph
- JJG(石油) 21-1996 Verfication Regulation of Geophone Tester
- JJG 810-1993 Wavelength Dispersive X-Ray Fluorescence Spectrometers
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 28634-2012 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
- GB/T 43688-2024 The quality control method of magnetic resonance imaging or spectrometer
- GB/T 30244-2013 Oscillographic Polarograph and Its Test Solution
- GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Professional Standard - Machinery
- JB/T 7481-1994 Wave Instrument Test Methods
- JB/T 5224-1991 Oscillographic Polarograph - Specification
机械电子工业部
- JB 5224-1991 Technical conditions of oscillographic polarograph
Military Standard of the People's Republic of China-General Armament Department
- GJB 4235-2001 Technical requirements for spectrum measurement instruments
- GJB 4235A-2020 Technical requirements for spectrum measurement instruments
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 38125-2019 Autosampler for liquid chromatography
- GB/T 41074-2021 Microbeam analysis―Method of specimen preparation for analysis of general powders using WDS and EDS
National Metrological Technical Specifications of the People's Republic of China
- JJF(电子) 37-1982 Calibration Method of BP-9 Broadband Microwave Spectrum Analyzer
Professional Standard - Electron
- SJ/T 10293.2-1991 Test methods for sampling oscilloscopes
Professional Standard - Agriculture
- GB/T 30433-2021(XG1-2023) Standard chromatographic column for liquid chromatography testing
- JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33693-2017 Test method for ultrasonic anemometer
Professional Standard - Petroleum
- SY 6639-2012 Geophone Tester Calibration Method
- SY/T 6639-2012 Calibration Method for Geophone Tester
- SY/T 6639-2005 The calibration method of geophone tester
Japanese Industrial Standards Committee (JISC)
- JIS C 6183:1992 Test methods of fiber-optic spectrum analyzer
- JIS C 6187:1999 Test methods of optical wavelengthmeters
American Society for Testing and Materials (ASTM)
- ASTM E388-04(2023) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers
- ASTM E388-04(2015) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers
British Standards Institution (BSI)
- BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
Standard Association of Australia （SAA）
- AS 2563:1982 Wavelength dispersive X-ray fluorescence spectrometers - Methods of test for determination of precision
- AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- AS 2563:1996(R2016) Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
International Electrotechnical Commission (IEC)
- IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
SCC
- DANSK DS/EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments – Part 1: Optical spectrum analyzers
- CEI EN 62129-1:2016 Calibration of wavelength/optical frequency measurement insturments Part 1: Optical spectrum analyzers
European Committee for Electrotechnical Standardization（CENELEC）
- EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
Association Francaise de Normalisation
- NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
Spanish Association for Standardization (UNE)
- UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
Korean Agency for Technology and Standards (KATS)
- KS B 0831-2001 Standard test blocks for ultrasonic testing
RO-ASRO
- STAS 11176/2-1984 SAMPLING OSCILLOSCOPES Methods of test
spectrometer,Resonance Spectrometer,Spectrometer+,Molybdenum + spectrometer,Spectrum Analyzer,Other spectrometers,Energy Spectrum-Spectrometer,spectrometer+esr,Electron Resonance Spectrometer,The structure of the spectrometer,Spectrometer sample,micro spectrometer,spectrometer element,Spectrometer structure,Electron spectrometer,Spectrometer Analysis,Terahertz Spectrometer,Energy Spectrometer,Spectrometer parameters,spectrometer
