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Analytical Electron Microscopy Transmission Electron Microscopy Selected Area Electron Diffraction Analysis Method

Analytical Electron Microscopy Transmission Electron Microscopy Selected Area Electron Diffraction Analysis Method, Total:19 items.

The international standard classification for "Analytical Electron Microscopy Transmission Electron Microscopy Selected Area Electron Diffraction Analysis Method" includes: Physicochemical methods of analysis , Other standards related to analytical chemistry .

The Chinese standard classification for "Analytical Electron Microscopy Transmission Electron Microscopy Selected Area Electron Diffraction Analysis Method" includes: Basic standards and general methods , Electron optics and other physical optics instrument , Electrochemical, thermochemistry and optical profile type analyzer .


General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 43883-2024 Microbeam analysis—Analytical electron microscopy—Method for determining the number density of nanoparticles in a metal
  • GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
  • GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
  • GB/T 43748-2024 Microbeam analysis—Transmission electron microscopy—Method for measuring the thickness of functional thin films in integrated circuit chips
  • GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes

Group Standards of the People's Republic of China

International Organization for Standardization (ISO)

  • ISO 25498:2025 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
  • ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
  • ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
  • ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
  • ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope

Kingdom of Bahrain Testing and Metrology Directorate

  • BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope

British Standards Institution (BSI)

  • BS ISO 25498:2025 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
  • BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
  • 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
  • BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope

The Directorate General of Specifications and Metrology (DGSM)

  • OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope

GCC Standardization Organization

  • GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope