GB/T 43087-2023 in English

VALID

Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials

Issued on:2023-09-07
Implemented on:2024-04-01
File Format:PDF
Delivery:Via email within 5 business days

Price(USD)： $700.00
$679.00

Standard No:	GB/T 43087-2023
Document status:	VALID
Title in English:	Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials
Title in Chinese:	微束分析分析电子显微术层状材料截面像中界面位置的确定方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 5 business days
Issued on:	2023-09-07
Implemented on:	2024-04-01
ICS Classification:	71.040.50-Physicochemical methods of analysis
Chinese Classification:	N33-Electron optics and other physical optics instrument
Professional Classification:	GB-National Standard
Related Keywords:	microbeam analysis analytical electron microscopy method analytical electron microscopy techniques layered materials layered materials introductionthis standard interface position
Related Topics:	layered material Analysis and testing industry Materials Analysis Microscope molecular chromatography microfluidic analysis semi-microanalysis Materials Analysis Microscope Colocalization analysis layered material Cross section material sample preparation electronic surface analysis Polymer Material Analysis Zero point potential analysis polymer material analysis and Material Surface Analysis Technology Materials Analysis Electricity Analysis of colocalization Colocalization Analysis k1 m4 potentiometric analysis Two-Phase Interface Analysis Analytic Hierarchy Process Electron Microanalysis 1 microscopic material microscopic material Analysis and testing industry Polymer Material Analysis Accuracy in Analytical Methods Advantages of Chromatography Electronic Material Analysis Colocalization analysis of Yttrium neutron cross section quantile analysis neutron cross section Electron Microanalysis - 2012 Cadmium neutron cross section Plastic Surface Analysis Inorganic Microanalysis micro column quantile analysis interface potential Peak position analysis gadolinium neutron cross section Colocalization analysis Differential Hot Pressure Analysis Microfracture Analysis differential analysis technique Interfacial electrochemical analysis method chromatographic classification method Microplastic Analysis Methods Methods for isolating specific microorganisms from nature Electronic nose analysis method The significance of linear mid-intercept in analytical methods Qualitative analysis method of multispectral imaging materials Microscopic analysis method validation Analytical Methods of Electronic Tongue Technology Electronic nose analysis method? Qualitative analysis method of electronic tongue size exclusion chromatography Film cross-section analysis method

《GB/T 43087-2023微束分析分析电子显微术层状材料截面像中界面位置的确定方法》由TC38（全国微束分析标准化技术委员会）归口，主管部门为国家标准委。

Introduction

This standard specifies a method for determining the position of interfaces in cross-sectional images of layered materials using analytical electron microscopy techniques. It provides guidance on analyzing microstructural details and quantifying interface locations within layered structures, contributing to advancements in material characterization and analysis.

*** Please note: This description may not be accurate, please refer to the official documentation.

More samples: DL/T 368-2010 YD/T 3934-2021 GB 50021-2001(2009)

Sample only — not a preview of GB/T 43087-2023

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GB/T 43087-2023 in English

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