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Database: 365,228(8 Aug 2026)

Analytic Hierarchy Process

Analytic Hierarchy Process, Total:222 items.

The international standard classification for "Analytic Hierarchy Process" includes: Surface treatment and coating , Chemical analysis , Other non-ferrous metals and their alloys , Cadmium, cobalt and their alloys , Jewellery , Other standards related to analytical chemistry , Optical equipment , Physicochemical methods of analysis , Textiles in general , Non-metalliferous minerals , Other equipment for petroleum and natural gas industries , Accident and disaster control , Laboratory medicine , Tobacco, tobacco products and related equipment , Non-ferrous metals .

The Chinese standard classification for "Analytic Hierarchy Process" includes: Material Protection , Technical management , Basic standards and general methods , Rare refractory metals and their compounds , Rare metals and their alloys analysis method , Other non-metal ore , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Building material raw material ore , Steel and iron alloy analysis method , Petroleum exploration, development, gathering and transportation engineering in general , Medical laboratory equipment , Tobacco , Metal and alloy powder , Welding and cutting .


Shandong Provincial Standard of the People's Republic of China

  • DB37/T 4154-2020 Determination of water quality odor Olfactory hierarchy analysis method (FPA method)

Professional Standard - Agriculture

Taiwan Provincial Standard of the People's Republic of China

  • CNS 14918-2005 General rules for ion chromatographic analysis
  • CNS 12588-1989 Technical Terms for Analytical Chemistry (Chromatogaphy Part)
  • CNS 6670-1980 Method of Test for Methyl Ethyl Ketone by Gas Chromatography
  • CNS 3949-1976 Calibration and Caculation of Gas Chromatography
  • CNS 12512-1989 General Rules for Analytical Methods in High Performance Liquid Chromatography
  • CNS 15059-2007 Liquid petroleum products - Separation and characterization of fatty acid methyl esters (FAME) from middle distillates - Liquid chromatography (LC) / gas chromatography (GC) method
  • CNS 13275-1993 Method of Test for Analysis of Natural Gas by Gas Chromatography
  • CNS 14949-2005 Method of test for the determination of individual components in spark ignition engine fuels by 100 metre capillary (with precolumn) high-resolution gas chromatography
  • CNS 8996-1982 Chemical Reagent(Paper Chromatograph - Aminoacid)
  • CNS 9178-1982 General Rules for Aralytical Method in Gas Chromatography
  • CNS 12509-1989 General Rules Analytical Methods in Gas Chromatography/Mass Spectrometry

Group Standards of the People's Republic of China

  • T/NARC 001-2019 Integral Evaluation Method for High-Level Talents
  • T/GDCKCJH 018-2020 Functional safety evaluation technology of power battery management system for electric vehicles
  • T/HNNMIA 8-2023 Chemical analysis methods for secondary aluminium ash - Determination of total fluorine content - Ion chromatography

Professional Standard - Electron

  • SJ/Z 1096-1976 Typical methods for the analysis alloy coatings
  • SJ 20516-1995 Analytical method of the purities for electrode-posited gold coating

能源

  • NB/T 10020-2015 Method of sampling and component analysis on coalbed methane

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 23886-2009 Determination of nacre thickness—Optical coherence tomography
  • GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
  • GB/T 23886-2009 Determination of nacre thickness—Optical coherence tomography
  • GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA
  • GB/T 3256.7-1982 Chemical analysis of zirconium powder for electro-vacuum uses--The methylene blue photometric method for determination of sulphur
  • GB/T 223.32-1994 Methods for Chemical Analysis of Iron, Steel and Alloy - The Hypophosphite Reduction-Iodimetric Method for the Determination of Arsenic Content
  • GB 223.32-1984 Methods for chemical analysis of iron, steel and alloy--The hypophosphite reduction-iodimetric method for the determination of arsenic content
  • GB/T 17592.3-1998 Textiles--Test method of the use of banned azo colourants--Thin-layer chromatography
  • GB/T 26019-2010 Methods for chemical analysis of high impurity tungsten mineral—Determination of tungsten trioxide content—Twice separation and igniting gravimetric method
  • GB/T 14506.28-2010 Methods for chemical analysis of silicate rocks—Part 28:Determination of 16 major and minor elements content
  • GB/T 22572-2008 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • GB/T 23886-2009 Determination of nacre thickness—Optical coherence tomography
  • GB/T 23886-2009 Determination of nacre thickness—Optical coherence tomography
  • GB/T 43087-2023 Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials
  • GB/T 38531-2020 Microbeam analysis—Computed tomography (CT) method for micro- and nano-pore structure analysis in tight rock samples
  • GB/T 17506-1998 The method of electron probe microanalysis as corrosive layer on ferrous metals of ship
  • GB/T 3654.7-1983 Methods for chemical analysis of ferroniobium--The methylene blue photometric method for the determination of sulfur content

Inner Mongolia Provincial Standard of the People's Republic of China

  • DB15/T 2605-2022 Technical level of farmland non-point source pollution control-Gray correlation method comprehensive evaluation procedure

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon

Professional Standard - Aviation

  • HB/Z 5090.2-2001 Analysis method for electroless nickel plating solution Determination of sodium hypophosphite content through potentiometric titration
  • HB/Z 5112-1978 Analytical method of cadmium tin alloy coating
  • HB/Z 5111-1978 Analytical method of zinc-tin alloy coating
  • HB/Z 5114-1978 Analytical method of lead-tin alloy coating
  • HB/Z 5113-1978 Analytical method of cadmium-titanium alloy coating
  • HB/Z 5115-1978 Analytical method of gold-antimony alloy coating

国家能源局

  • SY/T 7309-2016 Quantitative fluorescence techniques for reservoir analysis

Professional Standard - Petroleum

  • SY/T 5119-1995 Tomographic Analysis Method of Rock Soluble Organisms and Crude Group Components
  • SY/T 5542-2000 Analytical method for reservoir crude oil physical properties

Professional Standard-Safe Production

国家药监局

国家药品监督管理局

Professional Standard - Tobacco

  • YC/T 592-2021 Evaluation of quality stability of different batches of cigarette paper—Thermogravimetric analysis

Professional Standard - Non-ferrous Metal

  • YS/T 574.7-2009 Methods for chemical analysis of zirconium powder for electro-vacuum uses—The methylene blue spectrophotometric method for determination of sulphur
  • YS/T 574.7-2006 Determination of Sulfur by Electric Vacuum Zirconium Powder Chemical Analysis Method Methylene Blue Photometry

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

  • GJB 5381.8-2005 Methods of chemical analysis for pyrotech. Part 8: Determination of Hexamethylene tetramine content. Acid-base titration

Military Standard of the People's Republic of China-General Armament Department

  • GJB 8682.8-2015 Methods for chemical analysis of pyrotechnics Part 8: Determination of hexamethylenetetramine content Acid-base titration method

Professional Standard - Machinery

  • JB/T 7520.5-1994 Chemical Analysis Method for Phosphorus Copper Brazing Filler Metal - Determination of Tin Content with Hypophosphite Reducing Volumetric Method

未注明发布机构

  • ASTM RR-E01-1028 2000 E1659-Test Methods for Coating Mass and Chemical Analysis of Zinc-Nickel Alloy Electrolytically Coated on Steel Sheet

Association Francaise de Normalisation

  • NF X21-066*NF ISO 23812:2009 Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
  • NF ISO 23812:2009 Surface Chemical Analysis - Secondary Ion Mass Spectrometry - Method for Depth Calibration for Silicon Using Multiple Delta Layer Reference Materials
  • NF X20-303:1974 GAS ANALYSIS BY MEANS OF GAS CHROMATOGRAPHY.
  • NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
  • NF A91-474:1995 CONVERSION COATINGS ON METALLIC MATERIALS. DETERMINATION OF COATING MASS PER UNIT AREA. GRAVIMETRIC METHODS. (EUROPEAN STANDARD EN ISO 3892).
  • NF B30-104:1968 Glass. Analysis of seals of two glasses obtained by hot welding. (photo-elasticimetric method).
  • NF A10-003/A3:1970 CHEMICAL ANALYSIS OF FERROUS ALLOYS AND SILICON ALLOYS. GRAVIMETRIC DETERMINATION OF CARBON.
  • NF A10-003/A4:1971 CHEMICAL ANALYSIS OF FERROUS ALLOYS AND SILICON ALLOYS. GRAVIMETRIC DETERMINATION OF CARBON.
  • NF EN 15964:2011 Ethylotests, autres que les dispositifs à usage unique - Exigences et méthodes d'essai
  • NF A91-474*NF EN ISO 3892:2001 Conversion coatings on metallic materials - Determination of coating mass per unit area - Gravimetric methods
  • NF A91-125:2002 Metallic coatings and other inorganic coatings - Measurement of mass per unit area - Review of gravimetric and chemical analysis methods.
  • NF A10-003/A1:1968 CHEMICAL ANALYSIS OF FERRO-ALLOYS AND SILICO-ALLOYS. GRAVIMETRIC DETERMINATION OF CARBON.
  • NF A10-003/A2:1969 CHEMICAL ANALYSIS OF FERROUS ALLOYS AND SILICON ALLOYS. GRAVIMETRIC DETERMINATION OF CARBON.
  • NF X20-363:1978 GAS ANALYSIS. DETERMINATION OF CARBON MONOXIDE BY MEANS OF GAS CHROMATOGRAPHY.

British Standards Institution (BSI)

  • BS ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
  • BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
  • BS ISO 20341:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • BS ISO 20341:2003(2010) Surface chemical analysis — Secondary - ion mass spectrometry — Method for estimating depth resolution parameters with multiple delta - layer reference materials
  • BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
  • BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
  • BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers

International Organization for Standardization (ISO)

  • ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
  • ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
  • ISO 20341:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
  • ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • ISO 3892:1980 Conversion coatings on metallic materials; Determination of coating mass per unit area; Gravimetric methods
  • ISO 10111:2000 Metallic and other inorganic coatings - Measurement of mass per unit area - Review of gravimetric and chemical analysis methods
  • ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
  • ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
  • ISO 5558:1982 Animal and vegetable fats and oils; Detection and identification of antioxidants; Thin-layer chromatographic method

RO-ASRO

  • STAS 9538/3-1981 PAPER FOR CHROMATOGRAPHY AND ELECTROPHORESIS Fluorescence analysis
  • STAS 9538/3-1974 PAPER FOR CHROMATOGRAPHY AND ELECTROPHORESIS Fluorescence analysis
  • STAS 12001-1981 NATURAL GASES Cromatographyc analysis in gasous phase
  • STAS 12914-1990 Metallic coatings. Eloxation bathes. Analysis methods
  • STAS 11071/4-1989 Block diagrams of hierarchy BLOCK DIAGRAM OF HIERARCHY OF MEASURING INSTRUMENTS FOR TIME
  • STAS 11071/1-1988 Block diagrams of hierarchy BLOCK DIAGRAM OF HIERARCHY OF MEASURING INSTRUMENTS FOB LENGTH
  • STAS 11071/15-1985 Block diagrams kf hierarchy BLOCK DIAGREM OF HIERARCHY KF MEASURLNG LXSTRUMENTSFOR HARDNESS
  • STAS 11071/14-1988 Block diagrams of hierarchy NBLOCK DIAGRAM OF HIERARCHY OF MEASURING INSTRUMENTSFOR TEMPERATURE
  • STAS 12927-1990 Metallic coatings. Degraesing bathes. Analysis methods
  • STAS SR 12926-1995 Metallic coatings. Pickling bathes Analysis methods
  • STAS 12915-1990 Metallic coatings. Browning bathes. Analysis methods
  • STAS 11071/6-1986 Block diagrams of hierarchy BLOCK DIAGRAM OF HIERARCHY OF MEASURING INSTRUMENTS FOR FORCE IN STATIC REGIME
  • STAS 12979-1991 Metallic coatings. Ematalixation bathes analysis methods
  • STAS 11071/8-1986 Block diagrams of hierarchy BLOCK DIAGRAM OF HIERARCHY OF MEASURING INSTRUMENTS FOR TORQUE IN STATIC REGIME
  • STAS 12968-1991 Metallic coatings. Setting bathes of tin-lead alloy. Analysis methods
  • STAS 10274/2-1983 Solid fuck ASH ANALYSIS Quantitative spectral analysis of minor, rare and dispersed elements
  • STAS 12958-1991 Matallic coatings. Coating bathes with copper-tin alloy. Analysis methods
  • STAS 11071/7-1978 Legal metrologyBLOCK DIAGRAMS OF HIERARCHY OF MEASURING INSTRUMENTS FOR PRESSURE
  • STAS 9538/7-1974 PAPER FOR CHROMATOGRAPHY AND ELECTROPHORESIS Determination of earboxyl content
  • STAS 9538/5-1974 PAPER FOR CHROMATOGRAPHY AND ELECTROPHORESIS Determination of ninhydrine reaction

GSO

  • OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
  • OS GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
  • BH GSO ISO 23812:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
  • GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
  • OS GSO ISO 20341:2014 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • GSO ISO 20341:2014 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • BH GSO ISO 20341:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • GSO ISO 17560:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon

American Society for Testing and Materials (ASTM)

  • ASTM E1765-16(2023) Standard Practice for Applying Analytical Hierarchy Process (AHP) to Multiattribute Decision Analysis of Investments Related to Projects, Products, and Processes
  • ASTM D3936-80 Standard Test Method for Delamination Strength of Secondary Backing of Pile Floor coverings
  • ASTM D3936-21 Standard Test Method for Resistance to Delamination of the Secondary Backing of Pile Yarn Floor Covering
  • ASTM D3936-17 Standard Test Method for Resistance to Delamination of the Secondary Backing of Pile Yarn Floor Covering
  • ASTM E1765-16 Standard Practice for Applying Analytical Hierarchy Process (AHP) to Multiattribute Decision Analysis of Investments Related to Projects, Products, and Processes
  • ASTM B767-88(2001) Standard Guide for Determining Mass Per Unit Area of Electrodeposited and Related Coatings by Gravimetric and Other Chemical Analysis Procedures
  • ASTM B767-88(2006) Standard Guide for Determining Mass Per Unit Area of Electrodeposited and Related Coatings by Gravimetric and Other Chemical Analysis Procedures
  • ASTM B767-88(2016) Standard Guide for Determining Mass Per Unit Area of Electrodeposited and Related Coatings by Gravimetric and Other Chemical Analysis Procedures
  • ASTM B767-88(1994) Standard Guide for Determining Mass Per Unit Area of Electrodeposited and Related Coatings by Gravimetric and Other Chemical Analysis Procedures
  • ASTM B767-88(2010) Standard Guide for Determining Mass Per Unit Area of Electrodeposited and Related Coatings by Gravimetric and Other Chemical Analysis Procedures
  • ASTM E1881-12 Standard Guide for Cell Culture Analysis with SIMS
  • ASTM E1765-16e1 Standard Practice for Applying Analytical Hierarchy Process (AHP) to Multiattribute Decision Analysis of Investments Related to Projects, Products, and Processes
  • ASTM E1881-06 Standard Guide for Cell Culture Analysis with SIMS
  • ASTM B975-15 Standard Test Method for Measurement of Internal Stress of Metallic Coatings by Split Strip Evaluation (Deposit Stress Analyzer Method)
  • ASTM D452/D452M-19(2022) Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products
  • ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM D3936-00 Standard Test Method for Resistance to Delamination of the Secondary Backin of Pile Yarn Floor Covering
  • ASTM C1718-10 Standard Test Method for Nondestructive Assay of Radioactive Material by Tomographic Gamma Scanning
  • ASTM UOP709-70 Gas Analysis by Gas Chromatography Using a Two - Injection Technique
  • ASTM E1948-98 Standard Guide for Analytical Data Interchange Protocol for Chromatographic Data
  • ASTM E1948-98(2004) Standard Guide for Analytical Data Interchange Protocol for Chromatographic Data

Korean Agency for Technology and Standards (KATS)

  • KS D ISO 20341-2005(2020) Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • KS D ISO 20341:2005 Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • KS D ISO 20341-2020 Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • KS D ISO 17560-2003(2018) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
  • KS D ISO 14237-2003(2018) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
  • KS D ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
  • KS M 0035-2008(2018) General rules for ion chromatographic analysis
  • KS C 1225-1989 Electroretinogaphs
  • KS M 1995-2009 Determination of organic compounds emitted from plastics-Gas chromatographic method
  • KS M 7073-2016 Quantitative analysis method for mineral filler and mineral coating of paper
  • KS D ISO 3892:2002 Conversion coatings on metallic materials-Determination of coating mass per unit area-Gravimetric methods
  • KS A ISO 27467-2012(2017) Nuclear criticality safety-Analysis of a postulated criticality accident
  • KS D ISO 10111-2022 Metallic and other inorganic coatings-Measurement of mass per unit area-Review of gravimetric and chemical analysis methods

Japanese Industrial Standards Committee (JISC)

  • JIS K 0156:2018 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
  • JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
  • JIS K 0169:2012 Surface chemical analysis -- Secondary-ion mass spectrometry (SIMS) -- Method for estimating depth resolution parameters with multiple delta-layer reference materials
  • JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry

BR-ABNT

Standard Association of Australia (SAA)

  • AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon

SCC

  • ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
  • 10/30199169 DC BS ISO 12406. Surface chemical analysis. Secondary ion mass spectrometry. Method for depth profiling of arsenic in silicon
  • 08/30138809 DC BS ISO 23812. Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
  • AS CK2.3:1949 Methods for sampling and analysis of coal and coke (Excluding sub-bituminous coals, lignites, and brown coal), Part 3: Methods of analysis and testing
  • BS EN ISO 3892:1995 Conversion coatings on metallic materials. Determination of coating mass per unit area. Gravimetric methods
  • AS 2331.2.3:1980 Methods of test for metallic and related coatings, Part 2.3: Average thickness tests - Hydrogen evolution method for zinc coatings
  • AS 4100 DS02:1992 Steel structures - Lower tier analysis
  • AS CK2.2:1949 Methods for the sampling and analysis of coal and coke (excluding sub-bituminous coals, lignites, and brown coal), Part 2: Reduction of samples for analysis and testing
  • 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer

NL-NEN

American National Standards Institute (ANSI)

German Institute for Standardization

  • DIN 55912-2 Bb.1:1999 Pigments - Titanium dioxide pigments; methods of analysis - Examples using the X-ray fluorescence analysis to determine minor constituents
  • DIN 53174-2:1992 Solvents for paints, varnishes and similar coating materials; methods of analysis for solvent mixtures; gas chromatographic method
  • DIN EN 16158:2012 Animal feeding stuffs - Determination of semduramicin content - Liquid chromatographic method using a "tree" analytical approach; German version EN 16158:2012
  • DIN EN ISO 12460-3/A1:2022-10 Wood-based panels - Determination of formaldehyde release - Part 3: Gas analysis method - Amendment 1: Laser spectroscopy (ISO 12460-3:2020/DAM 1:2022); German and English version EN ISO 12460-3:2020/prA1:2022 / Note: Date of issue 2022-08-26*Intended ...

KR-KS

  • KS D ISO 17560-2003(2023) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
  • KS D ISO 14237-2003(2023) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon

IT-UNI

  • UNI 3374-1953 Chemical analysis methods of metallic materials. Determination of silicon in primary cast aluminum and secondary cast aluminum. colorimetric analysis
  • UNI 3381-1953 Chemical analysis methods of metallic materials. Determination of chromium in primary cast aluminum and secondary cast aluminum. colorimetric analysis

European Committee for Standardization (CEN)

  • EN 16158:2012 Animal feeding stuffs - Determination of semduramicin content - Liquid chromatographic method using a "tree" analytical approach
  • EN ISO 3892:1994 Conversion Coatings on Metallic Materials - Determination of Coating Mass per Unit Area - Gravimetric Methods (ISO 3892 : 1980)
  • EN ISO 3892:2001 Conversion Coatings on Metallic Materials - Determination of Coating Mass Per Unit Area - Gravimetric Methods ISO 3892:2000

American Gear Manufacturers Association

  • AGMA 06FTM06-2006 An Analytical Approach to the Prediction of Micropitting on Case Carburised Gears

Indonesia Standards

  • SNI 19-6738-2002 Calculation methods for dependable flow of river water by frequency curve analysis

GB-REG

  • REG NASA-LLIS-1256-2001 Lessons Learned - Project Selection for New Programs Using Analytical Hierarchy Process (AHP) Software, Specifically Expert Choice 2000 Software

SAE - SAE International

  • SAE J409-1990 Product Analysis - Permissible Variations from Specified Chemical Analysis of a Heat or Cast of Steel
  • SAE J409-1984 Product Analysis - Permissible Variations from Specified Chemical Analysis of a Heat or Cast of Steel

Society of Automotive Engineers (SAE)

  • SAE J409-2021 Product Analysis - Permissible Variations from Specified Chemical Analysis of a Heat or Cast of Steel

ESDU - Engineering Sciences Data Unit

American Welding Society (AWS)

  • WRC 564:2020 The MPC Lot-Centered Analysis Method for Determining High Temperature Strength Parameters

RU-GOST R

  • GOST R ISO 26262-9-2014 Road vehicles. Functional safety. Part 9. Automotive Safety Integrity Level-oriented and safety-oriented analyses

Danish Standards Foundation

  • DS/ISO 3892:1983 Conversion coatings on metallic materials. Determination of coating mass per unit area. Gravimetric methods
  • DS/ISO 1460:1980 Metallic coatings. Hot dip galvanized coatings on ferrous materials. Determination of the mass per unit area. Gravimetric method

SE-SIS

  • SIS 11 01 05 E-1951 Test batches of steel samples for chemical analysis
  • SIS SS-ISO 3892:1983 Conversion coatings on metallic ma- terials - Determination of coating m?ss per unit area - Gravimetric methods

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc.

BE-NBN

  • NBN-EN ISO 2177:1995 Metallic coatings - Measurement of coating thickness - Coulometric method by anodic dissolution (ISO 2177:1985)
  • NBN EN ISO 3892:1995 Conversion coatings on metallic materials - Determination of coating mass per unit area - Gravimetric methods (ISO 3892:1980)

ZA-SANS

  • SANS 3892:2000 Conversion coatings on metallic materials - Determination of coating mass per unit area - Gravimetric methods

CEN - European Committee for Standardization

  • EN ISO 10111:2019 Metallic and other inorganic coatings - Measurement of mass per unit area - Review of gravimetric and chemical analysis methods

Canadian General Standards Board (CGSB)

HU-MSZT

IN-BIS

  • IS 228 Pt.16-1992 Methods for chemical analysis of steels. Part 15: Determination of tungsten by spectrophotometric method (for tungsten 0.1 to percent) (Second Revision)

The American Road & Transportation Builders Association

  • AASHTO M 147-1965 Standard Specification for Materials for Aggregate and Soil-Aggregate Subbase, Base, and Surface Courses