Analytic Hierarchy Process
Analytic Hierarchy Process, Total:222 items.
The international standard classification for "Analytic Hierarchy Process" includes: Surface treatment and coating , Chemical analysis , Other non-ferrous metals and their alloys , Cadmium, cobalt and their alloys , Jewellery , Other standards related to analytical chemistry , Optical equipment , Physicochemical methods of analysis , Textiles in general , Non-metalliferous minerals , Other equipment for petroleum and natural gas industries , Accident and disaster control , Laboratory medicine , Tobacco, tobacco products and related equipment , Non-ferrous metals .
The Chinese standard classification for "Analytic Hierarchy Process" includes: Material Protection , Technical management , Basic standards and general methods , Rare refractory metals and their compounds , Rare metals and their alloys analysis method , Other non-metal ore , Electrochemical, thermochemistry and optical profile type analyzer , Electron optics and other physical optics instrument , Building material raw material ore , Steel and iron alloy analysis method , Petroleum exploration, development, gathering and transportation engineering in general , Medical laboratory equipment , Tobacco , Metal and alloy powder , Welding and cutting .
Shandong Provincial Standard of the People's Republic of China
- DB37/T 4154-2020 Determination of water quality odor Olfactory hierarchy analysis method (FPA method)
Professional Standard - Agriculture
- 806兽药典 一部-2015 Appendix Contents 0600 Determination of Physical Constants 0661 Thermal Analysis
- 787兽药典 一部-2015 Appendix Contents 0500 Chromatography 0502 Thin Layer Chromatography
- 780兽药典 二部-2015 Appendix Contents 0500 Chromatography 0502 Thin Layer Chromatography
- SN/T 5589.1-2023 Risk assessment method of q uality safety for import and export goods-Part 1: Anylatic hierarchy process
- 水产品质量安全检验手册 1.2.4.6-2005 Chapter 1 General introduction Section 2 Analytical methods for aquatic product inspection 4. Physicochemical analysis method (6) Chromatographic method
Taiwan Provincial Standard of the People's Republic of China
- CNS 14918-2005 General rules for ion chromatographic analysis
- CNS 12588-1989 Technical Terms for Analytical Chemistry (Chromatogaphy Part)
- CNS 6670-1980 Method of Test for Methyl Ethyl Ketone by Gas Chromatography
- CNS 3949-1976 Calibration and Caculation of Gas Chromatography
- CNS 12512-1989 General Rules for Analytical Methods in High Performance Liquid Chromatography
- CNS 15059-2007 Liquid petroleum products - Separation and characterization of fatty acid methyl esters (FAME) from middle distillates - Liquid chromatography (LC) / gas chromatography (GC) method
- CNS 13275-1993 Method of Test for Analysis of Natural Gas by Gas Chromatography
- CNS 14949-2005 Method of test for the determination of individual components in spark ignition engine fuels by 100 metre capillary (with precolumn) high-resolution gas chromatography
- CNS 8996-1982 Chemical Reagent(Paper Chromatograph - Aminoacid)
- CNS 9178-1982 General Rules for Aralytical Method in Gas Chromatography
- CNS 12509-1989 General Rules Analytical Methods in Gas Chromatography/Mass Spectrometry
Group Standards of the People's Republic of China
- T/NARC 001-2019 Integral Evaluation Method for High-Level Talents
- T/GDCKCJH 018-2020 Functional safety evaluation technology of power battery management system for electric vehicles
- T/HNNMIA 8-2023 Chemical analysis methods for secondary aluminium ash - Determination of total fluorine content - Ion chromatography
Professional Standard - Electron
- SJ/Z 1096-1976 Typical methods for the analysis alloy coatings
- SJ 20516-1995 Analytical method of the purities for electrode-posited gold coating
能源
- NB/T 10020-2015 Method of sampling and component analysis on coalbed methane
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 23886-2009 Determination of nacre thickness—Optical coherence tomography
- GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
- GB/T 23886-2009 Determination of nacre thickness—Optical coherence tomography
- GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA
- GB/T 3256.7-1982 Chemical analysis of zirconium powder for electro-vacuum uses--The methylene blue photometric method for determination of sulphur
- GB/T 223.32-1994 Methods for Chemical Analysis of Iron, Steel and Alloy - The Hypophosphite Reduction-Iodimetric Method for the Determination of Arsenic Content
- GB 223.32-1984 Methods for chemical analysis of iron, steel and alloy--The hypophosphite reduction-iodimetric method for the determination of arsenic content
- GB/T 17592.3-1998 Textiles--Test method of the use of banned azo colourants--Thin-layer chromatography
- GB/T 26019-2010 Methods for chemical analysis of high impurity tungsten mineral—Determination of tungsten trioxide content—Twice separation and igniting gravimetric method
- GB/T 14506.28-2010 Methods for chemical analysis of silicate rocks—Part 28:Determination of 16 major and minor elements content
- GB/T 22572-2008 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
- GB/T 23886-2009 Determination of nacre thickness—Optical coherence tomography
- GB/T 23886-2009 Determination of nacre thickness—Optical coherence tomography
- GB/T 43087-2023 Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials
- GB/T 38531-2020 Microbeam analysis—Computed tomography (CT) method for micro- and nano-pore structure analysis in tight rock samples
- GB/T 17506-1998 The method of electron probe microanalysis as corrosive layer on ferrous metals of ship
- GB/T 3654.7-1983 Methods for chemical analysis of ferroniobium--The methylene blue photometric method for the determination of sulfur content
Inner Mongolia Provincial Standard of the People's Republic of China
- DB15/T 2605-2022 Technical level of farmland non-point source pollution control-Gray correlation method comprehensive evaluation procedure
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
Professional Standard - Aviation
- HB/Z 5090.2-2001 Analysis method for electroless nickel plating solution Determination of sodium hypophosphite content through potentiometric titration
- HB/Z 5112-1978 Analytical method of cadmium tin alloy coating
- HB/Z 5111-1978 Analytical method of zinc-tin alloy coating
- HB/Z 5114-1978 Analytical method of lead-tin alloy coating
- HB/Z 5113-1978 Analytical method of cadmium-titanium alloy coating
- HB/Z 5115-1978 Analytical method of gold-antimony alloy coating
国家能源局
- SY/T 7309-2016 Quantitative fluorescence techniques for reservoir analysis
Professional Standard - Petroleum
- SY/T 5119-1995 Tomographic Analysis Method of Rock Soluble Organisms and Crude Group Components
- SY/T 5542-2000 Analytical method for reservoir crude oil physical properties
Professional Standard-Safe Production
- AQ/T 3054-2015 Guidelines for layer of protection analysis(LOPA)
国家药监局
- YY/T 1792-2021 Fluorescence immunochromatography analyzer
国家药品监督管理局
- YY/T 1582-2018 Colloidal gold immunochromatography reader
Professional Standard - Tobacco
- YC/T 592-2021 Evaluation of quality stability of different batches of cigarette paper—Thermogravimetric analysis
Professional Standard - Non-ferrous Metal
- YS/T 574.7-2009 Methods for chemical analysis of zirconium powder for electro-vacuum uses—The methylene blue spectrophotometric method for determination of sulphur
- YS/T 574.7-2006 Determination of Sulfur by Electric Vacuum Zirconium Powder Chemical Analysis Method Methylene Blue Photometry
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence
- GJB 5381.8-2005 Methods of chemical analysis for pyrotech. Part 8: Determination of Hexamethylene tetramine content. Acid-base titration
Military Standard of the People's Republic of China-General Armament Department
- GJB 8682.8-2015 Methods for chemical analysis of pyrotechnics Part 8: Determination of hexamethylenetetramine content Acid-base titration method
Professional Standard - Machinery
- JB/T 7520.5-1994 Chemical Analysis Method for Phosphorus Copper Brazing Filler Metal - Determination of Tin Content with Hypophosphite Reducing Volumetric Method
未注明发布机构
- ASTM RR-E01-1028 2000 E1659-Test Methods for Coating Mass and Chemical Analysis of Zinc-Nickel Alloy Electrolytically Coated on Steel Sheet
Association Francaise de Normalisation
- NF X21-066*NF ISO 23812:2009 Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
- NF ISO 23812:2009 Surface Chemical Analysis - Secondary Ion Mass Spectrometry - Method for Depth Calibration for Silicon Using Multiple Delta Layer Reference Materials
- NF X20-303:1974 GAS ANALYSIS BY MEANS OF GAS CHROMATOGRAPHY.
- NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
- NF A91-474:1995 CONVERSION COATINGS ON METALLIC MATERIALS. DETERMINATION OF COATING MASS PER UNIT AREA. GRAVIMETRIC METHODS. (EUROPEAN STANDARD EN ISO 3892).
- NF B30-104:1968 Glass. Analysis of seals of two glasses obtained by hot welding. (photo-elasticimetric method).
- NF A10-003/A3:1970 CHEMICAL ANALYSIS OF FERROUS ALLOYS AND SILICON ALLOYS. GRAVIMETRIC DETERMINATION OF CARBON.
- NF A10-003/A4:1971 CHEMICAL ANALYSIS OF FERROUS ALLOYS AND SILICON ALLOYS. GRAVIMETRIC DETERMINATION OF CARBON.
- NF EN 15964:2011 Ethylotests, autres que les dispositifs à usage unique - Exigences et méthodes d'essai
- NF A91-474*NF EN ISO 3892:2001 Conversion coatings on metallic materials - Determination of coating mass per unit area - Gravimetric methods
- NF A91-125:2002 Metallic coatings and other inorganic coatings - Measurement of mass per unit area - Review of gravimetric and chemical analysis methods.
- NF A10-003/A1:1968 CHEMICAL ANALYSIS OF FERRO-ALLOYS AND SILICO-ALLOYS. GRAVIMETRIC DETERMINATION OF CARBON.
- NF A10-003/A2:1969 CHEMICAL ANALYSIS OF FERROUS ALLOYS AND SILICON ALLOYS. GRAVIMETRIC DETERMINATION OF CARBON.
- NF X20-363:1978 GAS ANALYSIS. DETERMINATION OF CARBON MONOXIDE BY MEANS OF GAS CHROMATOGRAPHY.
British Standards Institution (BSI)
- BS ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
- BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
- BS ISO 20341:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
- BS ISO 20341:2003(2010) Surface chemical analysis — Secondary - ion mass spectrometry — Method for estimating depth resolution parameters with multiple delta - layer reference materials
- BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
- BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- BS ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
- BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
- BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials
- BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
International Organization for Standardization (ISO)
- ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
- ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
- ISO 20341:2003 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
- ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
- ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
- ISO 3892:1980 Conversion coatings on metallic materials; Determination of coating mass per unit area; Gravimetric methods
- ISO 10111:2000 Metallic and other inorganic coatings - Measurement of mass per unit area - Review of gravimetric and chemical analysis methods
- ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
- ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
- ISO 5558:1982 Animal and vegetable fats and oils; Detection and identification of antioxidants; Thin-layer chromatographic method
RO-ASRO
- STAS 9538/3-1981 PAPER FOR CHROMATOGRAPHY AND ELECTROPHORESIS Fluorescence analysis
- STAS 9538/3-1974 PAPER FOR CHROMATOGRAPHY AND ELECTROPHORESIS Fluorescence analysis
- STAS 12001-1981 NATURAL GASES Cromatographyc analysis in gasous phase
- STAS 12914-1990 Metallic coatings. Eloxation bathes. Analysis methods
- STAS 11071/4-1989 Block diagrams of hierarchy BLOCK DIAGRAM OF HIERARCHY OF MEASURING INSTRUMENTS FOR TIME
- STAS 11071/1-1988 Block diagrams of hierarchy BLOCK DIAGRAM OF HIERARCHY OF MEASURING INSTRUMENTS FOB LENGTH
- STAS 11071/15-1985 Block diagrams kf hierarchy BLOCK DIAGREM OF HIERARCHY KF MEASURLNG LXSTRUMENTSFOR HARDNESS
- STAS 11071/14-1988 Block diagrams of hierarchy NBLOCK DIAGRAM OF HIERARCHY OF MEASURING INSTRUMENTSFOR TEMPERATURE
- STAS 12927-1990 Metallic coatings. Degraesing bathes. Analysis methods
- STAS SR 12926-1995 Metallic coatings. Pickling bathes Analysis methods
- STAS 12915-1990 Metallic coatings. Browning bathes. Analysis methods
- STAS 11071/6-1986 Block diagrams of hierarchy BLOCK DIAGRAM OF HIERARCHY OF MEASURING INSTRUMENTS FOR FORCE IN STATIC REGIME
- STAS 12979-1991 Metallic coatings. Ematalixation bathes analysis methods
- STAS 11071/8-1986 Block diagrams of hierarchy BLOCK DIAGRAM OF HIERARCHY OF MEASURING INSTRUMENTS FOR TORQUE IN STATIC REGIME
- STAS 12968-1991 Metallic coatings. Setting bathes of tin-lead alloy. Analysis methods
- STAS 10274/2-1983 Solid fuck ASH ANALYSIS Quantitative spectral analysis of minor, rare and dispersed elements
- STAS 12958-1991 Matallic coatings. Coating bathes with copper-tin alloy. Analysis methods
- STAS 11071/7-1978 Legal metrologyBLOCK DIAGRAMS OF HIERARCHY OF MEASURING INSTRUMENTS FOR PRESSURE
- STAS 9538/7-1974 PAPER FOR CHROMATOGRAPHY AND ELECTROPHORESIS Determination of earboxyl content
- STAS 9538/5-1974 PAPER FOR CHROMATOGRAPHY AND ELECTROPHORESIS Determination of ninhydrine reaction
GSO
- OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
- OS GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
- BH GSO ISO 23812:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
- GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
- OS GSO ISO 20341:2014 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for estimating depth resolution parameters with multiple delta-layer reference materials
- GSO ISO 20341:2014 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for estimating depth resolution parameters with multiple delta-layer reference materials
- BH GSO ISO 20341:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for estimating depth resolution parameters with multiple delta-layer reference materials
- BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
- GSO ISO 17560:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
- GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
American Society for Testing and Materials (ASTM)
- ASTM E1765-16(2023) Standard Practice for Applying Analytical Hierarchy Process (AHP) to Multiattribute Decision Analysis of Investments Related to Projects, Products, and Processes
- ASTM D3936-80 Standard Test Method for Delamination Strength of Secondary Backing of Pile Floor coverings
- ASTM D3936-21 Standard Test Method for Resistance to Delamination of the Secondary Backing of Pile Yarn Floor Covering
- ASTM D3936-17 Standard Test Method for Resistance to Delamination of the Secondary Backing of Pile Yarn Floor Covering
- ASTM E1765-16 Standard Practice for Applying Analytical Hierarchy Process (AHP) to Multiattribute Decision Analysis of Investments Related to Projects, Products, and Processes
- ASTM B767-88(2001) Standard Guide for Determining Mass Per Unit Area of Electrodeposited and Related Coatings by Gravimetric and Other Chemical Analysis Procedures
- ASTM B767-88(2006) Standard Guide for Determining Mass Per Unit Area of Electrodeposited and Related Coatings by Gravimetric and Other Chemical Analysis Procedures
- ASTM B767-88(2016) Standard Guide for Determining Mass Per Unit Area of Electrodeposited and Related Coatings by Gravimetric and Other Chemical Analysis Procedures
- ASTM B767-88(1994) Standard Guide for Determining Mass Per Unit Area of Electrodeposited and Related Coatings by Gravimetric and Other Chemical Analysis Procedures
- ASTM B767-88(2010) Standard Guide for Determining Mass Per Unit Area of Electrodeposited and Related Coatings by Gravimetric and Other Chemical Analysis Procedures
- ASTM E1881-12 Standard Guide for Cell Culture Analysis with SIMS
- ASTM E1765-16e1 Standard Practice for Applying Analytical Hierarchy Process (AHP) to Multiattribute Decision Analysis of Investments Related to Projects, Products, and Processes
- ASTM E1881-06 Standard Guide for Cell Culture Analysis with SIMS
- ASTM B975-15 Standard Test Method for Measurement of Internal Stress of Metallic Coatings by Split Strip Evaluation (Deposit Stress Analyzer Method)
- ASTM D452/D452M-19(2022) Standard Test Method for Sieve Analysis of Surfacing for Asphalt Roofing Products
- ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
- ASTM D3936-00 Standard Test Method for Resistance to Delamination of the Secondary Backin of Pile Yarn Floor Covering
- ASTM C1718-10 Standard Test Method for Nondestructive Assay of Radioactive Material by Tomographic Gamma Scanning
- ASTM UOP709-70 Gas Analysis by Gas Chromatography Using a Two - Injection Technique
- ASTM E1948-98 Standard Guide for Analytical Data Interchange Protocol for Chromatographic Data
- ASTM E1948-98(2004) Standard Guide for Analytical Data Interchange Protocol for Chromatographic Data
Korean Agency for Technology and Standards (KATS)
- KS D ISO 20341-2005(2020) Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
- KS D ISO 20341:2005 Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
- KS D ISO 20341-2020 Surface chemical analysis-Secondary-ion mass spectrometry-Method for estimating depth resolution parameters with multiple delta-layer reference materials
- KS D ISO 17560-2003(2018) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
- KS D ISO 14237-2003(2018) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
- KS D ISO 22048:2005 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
- KS M 0035-2008(2018) General rules for ion chromatographic analysis
- KS C 1225-1989 Electroretinogaphs
- KS M 1995-2009 Determination of organic compounds emitted from plastics-Gas chromatographic method
- KS M 7073-2016 Quantitative analysis method for mineral filler and mineral coating of paper
- KS D ISO 3892:2002 Conversion coatings on metallic materials-Determination of coating mass per unit area-Gravimetric methods
- KS A ISO 27467-2012(2017) Nuclear criticality safety-Analysis of a postulated criticality accident
- KS D ISO 10111-2022 Metallic and other inorganic coatings-Measurement of mass per unit area-Review of gravimetric and chemical analysis methods
Japanese Industrial Standards Committee (JISC)
- JIS K 0156:2018 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
- JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
- JIS K 0169:2012 Surface chemical analysis -- Secondary-ion mass spectrometry (SIMS) -- Method for estimating depth resolution parameters with multiple delta-layer reference materials
- JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
- JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
- JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
BR-ABNT
- ABNT MB-138R-1954 Calcium hypochlorite analysis
Standard Association of Australia (SAA)
- AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
SCC
- ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
- 10/30199169 DC BS ISO 12406. Surface chemical analysis. Secondary ion mass spectrometry. Method for depth profiling of arsenic in silicon
- 08/30138809 DC BS ISO 23812. Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials
- AS CK2.3:1949 Methods for sampling and analysis of coal and coke (Excluding sub-bituminous coals, lignites, and brown coal), Part 3: Methods of analysis and testing
- BS EN ISO 3892:1995 Conversion coatings on metallic materials. Determination of coating mass per unit area. Gravimetric methods
- AS 2331.2.3:1980 Methods of test for metallic and related coatings, Part 2.3: Average thickness tests - Hydrogen evolution method for zinc coatings
- AS 4100 DS02:1992 Steel structures - Lower tier analysis
- AS CK2.2:1949 Methods for the sampling and analysis of coal and coke (excluding sub-bituminous coals, lignites, and brown coal), Part 2: Reduction of samples for analysis and testing
- 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
NL-NEN
- NEN 2295-1970 Terminology of thin-layer chromatography
American National Standards Institute (ANSI)
- ANSI/TAPPI T812 om-2013 Ply separation of solid and corrugated fiberboard (wet)
German Institute for Standardization
- DIN 55912-2 Bb.1:1999 Pigments - Titanium dioxide pigments; methods of analysis - Examples using the X-ray fluorescence analysis to determine minor constituents
- DIN 53174-2:1992 Solvents for paints, varnishes and similar coating materials; methods of analysis for solvent mixtures; gas chromatographic method
- DIN EN 16158:2012 Animal feeding stuffs - Determination of semduramicin content - Liquid chromatographic method using a "tree" analytical approach; German version EN 16158:2012
- DIN EN ISO 12460-3/A1:2022-10 Wood-based panels - Determination of formaldehyde release - Part 3: Gas analysis method - Amendment 1: Laser spectroscopy (ISO 12460-3:2020/DAM 1:2022); German and English version EN ISO 12460-3:2020/prA1:2022 / Note: Date of issue 2022-08-26*Intended ...
KR-KS
- KS D ISO 17560-2003(2023) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
- KS D ISO 14237-2003(2023) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
IT-UNI
- UNI 3374-1953 Chemical analysis methods of metallic materials. Determination of silicon in primary cast aluminum and secondary cast aluminum. colorimetric analysis
- UNI 3381-1953 Chemical analysis methods of metallic materials. Determination of chromium in primary cast aluminum and secondary cast aluminum. colorimetric analysis
European Committee for Standardization (CEN)
- EN 16158:2012 Animal feeding stuffs - Determination of semduramicin content - Liquid chromatographic method using a "tree" analytical approach
- EN ISO 3892:1994 Conversion Coatings on Metallic Materials - Determination of Coating Mass per Unit Area - Gravimetric Methods (ISO 3892 : 1980)
- EN ISO 3892:2001 Conversion Coatings on Metallic Materials - Determination of Coating Mass Per Unit Area - Gravimetric Methods ISO 3892:2000
American Gear Manufacturers Association
- AGMA 06FTM06-2006 An Analytical Approach to the Prediction of Micropitting on Case Carburised Gears
Indonesia Standards
- SNI 19-6738-2002 Calculation methods for dependable flow of river water by frequency curve analysis
GB-REG
- REG NASA-LLIS-1256-2001 Lessons Learned - Project Selection for New Programs Using Analytical Hierarchy Process (AHP) Software, Specifically Expert Choice 2000 Software
SAE - SAE International
- SAE J409-1990 Product Analysis - Permissible Variations from Specified Chemical Analysis of a Heat or Cast of Steel
- SAE J409-1984 Product Analysis - Permissible Variations from Specified Chemical Analysis of a Heat or Cast of Steel
Society of Automotive Engineers (SAE)
- SAE J409-2021 Product Analysis - Permissible Variations from Specified Chemical Analysis of a Heat or Cast of Steel
ESDU - Engineering Sciences Data Unit
- ESDU 94004-1994 STRESS ANALYSIS OF LAMINATED FLAT PLATES
- ESDU 94004 A-2003 Stress analysis of laminated flat plates.
- ESDU 91013 A-1994 Methods for improving damping. Part 2: layered damping treatment for structures: analysis and examples.
American Welding Society (AWS)
- WRC 564:2020 The MPC Lot-Centered Analysis Method for Determining High Temperature Strength Parameters
RU-GOST R
- GOST R ISO 26262-9-2014 Road vehicles. Functional safety. Part 9. Automotive Safety Integrity Level-oriented and safety-oriented analyses
Danish Standards Foundation
- DS/ISO 3892:1983 Conversion coatings on metallic materials. Determination of coating mass per unit area. Gravimetric methods
- DS/ISO 1460:1980 Metallic coatings. Hot dip galvanized coatings on ferrous materials. Determination of the mass per unit area. Gravimetric method
SE-SIS
- SIS 11 01 05 E-1951 Test batches of steel samples for chemical analysis
- SIS SS-ISO 3892:1983 Conversion coatings on metallic ma- terials - Determination of coating m?ss per unit area - Gravimetric methods
ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc.
- ASHRAE CI-01-2-1-2001 Analysis of a Medium-Temperature Secondary Loop Refrigerating System
BE-NBN
- NBN-EN ISO 2177:1995 Metallic coatings - Measurement of coating thickness - Coulometric method by anodic dissolution (ISO 2177:1985)
- NBN EN ISO 3892:1995 Conversion coatings on metallic materials - Determination of coating mass per unit area - Gravimetric methods (ISO 3892:1980)
ZA-SANS
- SANS 3892:2000 Conversion coatings on metallic materials - Determination of coating mass per unit area - Gravimetric methods
CEN - European Committee for Standardization
- EN ISO 10111:2019 Metallic and other inorganic coatings - Measurement of mass per unit area - Review of gravimetric and chemical analysis methods
Canadian General Standards Board (CGSB)
- CGSB 4-GP-176M-1989 Quantitative Analysis of Fibre Mixtures - Flotation Method
HU-MSZT
- MNOSZ 9617-1953 Coordination of colors and color levels
IN-BIS
- IS 228 Pt.16-1992 Methods for chemical analysis of steels. Part 15: Determination of tungsten by spectrophotometric method (for tungsten 0.1 to percent) (Second Revision)
The American Road & Transportation Builders Association
- AASHTO M 147-1965 Standard Specification for Materials for Aggregate and Soil-Aggregate Subbase, Base, and Surface Courses
The basis for the determination of the potentiometric method,Antibiotic Receptor Assay,Application of Chromatography,k1 in visual analysis,Instruments for spectroscopic analysis,Analytic Hierarchy Process,The principle of thermogravimetric analysis,Advantages of Chromatography,Chromatographic analysis of nitrogen,Particle Determination Analysis of Charcoal,Analytical method for total nitrogen,Analysis in Biology,The basis of fluorescence analysis,Thermogravimetric Analysis of Plastic Polymers,Analytical Methods for Capability Measurement,Deep mining of data,Basis for coulometric analysis,Quantitative Basis for Chromatographic Analysis,Quantitative Basis for Chromatographic Analysis,The role of chromatography