Backscatter sample preparation equipment
Backscatter sample preparation equipment, Total:83 items.
The international standard classification for "Backscatter sample preparation equipment" includes: Protection against crime , Physicochemical methods of analysis , Other methods of testing of metals , Chemical analysis , Mining and quarrying , Nuclear energy engineering , Surface treatment , Other standards related to protection against fire .
The Chinese standard classification for "Backscatter sample preparation equipment" includes: Guard and alarm system , Basic standards and general methods , Metallographic testing method , Building material raw material ore , Heavy metal ore , Nuclear fuel element and its analytical test method , Manganese ore , Basic standard and general method , Material Protection , Chemical raw material ore , Fire-fighting in general .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB 15208.5-2018e Micro-dose X-ray security inspection system—Part 5:Backscatter object security inspection system
- GB/T 36165-2018 Determination of average grain size of metal—Electron backscatter diffraction (EBSD)method
- GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
- GB/T 2011-1987 Method of sampling and sample preparation of manganese ores in bulk
- GB 2009-1987 Bulk bauxite sampling and sample preparation method
- GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
- GB 2008-1987 Bulk fluorspar sampling and sample preparation methods
- GB 15208.5-2018 Micro-dose X-ray security inspection system—Part 5:Backscatter object security inspection system
- GB 2007.2-1987 General rules for the sampling and sample preparation of minerals in bulk-Manual method of sample preparation
- GB/T 20018-2005 GB/T 2001 8-2005 Metallic and non-metallic coatings - Measurements of thickness - Beta backscatter methods
- GB/T 2009-1987 Method of sampling and sample preparation of bauxite in bulk
- GB/T 20099-2006 Sample preparation - Dispersing procedures for powders in liquids
- GB/T 25451-2010 PHWR fuel element coating-measurement of thickness-beta backscatter method
- GB/T 34172-2017 Microbeam analysis--Electron backscatter diffraction--Phase analysis method of metal and alloy
- GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
- GB 15208.5-2018(英文版) Micro-dose X-ray security inspection equipment Part 5: Backscatter article security inspection equipment
- GB/T 19501-2004 General guide for electron backscatter diffraction analysis
- GB/T 2010-1987 Method of sampling and sample preparation of talc in bulk
- GB 2011-1987 Method of sampling and sample preparation of manganese ores in bulk
- GB/T 2007.2-1987 General rules for the sampling and sample preparation of minerals in bulk--Manual method of sample preparation
- GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
- GB/T 2008-1987 Method of sampling and sample preparation of fluor-spar in bulk
- GB 2010-1987 Method of sampling and sample preparation of talc in bulk
Professional Standard - Ferrous Metallurgy
- YB/T 4677-2018 Precision seamless steel tubes for motorcycle shock absorber
Professional Standard - Commodity Inspection
- SN/T 1790-2006 Methods for sampling and preparing sample of phosphate ores in bulk
- SN/T 3997-2014 Methods for sampling and sample preparation of laterite nickel ores in bulk
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 1156-2019 The identification of electrical fire melted mark—Electronic back scattering diffraction method
Professional Standard - Non-ferrous Metal
- YS/T 1652-2023 Texture testing of zirconium and zirconium alloy— Electron backscatter diffraction method
Professional Standard - Electron
- SJ 20042-1992 Mothods of measurement for tropsphering scattering communication equipment
Korean Agency for Technology and Standards (KATS)
- KS A 4508-2001 TESTING METHOD OF SCATTERING-RATIO OF LOW-BACKSCATTERING MATERIALS
- KS A 4508-1985 TESTING METHOD OF SCATTERING-RATIO OF LOW-BACKSCATTERING MATERIALS
- KS A 4816-1985 BACK SCATTERING X-RAY REDUCING PAINTS
- KS A 4816-1980(1995) BACK SCATTERING X-RAY REDUCING PAINTS
- KS A 4816-2000 BACK SCATTERING X-RAY REDUCING PAINTS
- KS A 4901-2002 Characteristics of anti-scatter grids used in X-ray equipment
- KS D ISO 3543-2022 Metallic and non-metallic coatings-Measurement of thickness-Beta backscatter method
- KS D ISO 3543-2002(2022) Metallic and non-metallic coatings-Measurement of thickness-Beta backscatter method
International Organization for Standardization (ISO)
- ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
- ISO 3543:2000 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method
- ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
- ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- ISO 14887:2000 Sample preparation - Dispersing procedures for powders in liquids
- ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
- ISO 3543 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method
Swedish Institute for Standards
- SIS SS IEC 627:1986 X-ray equipment - Characteristics of anti-scatter grids used in X-ray equipment
- SS-ISO 14887:2000 Sample preparation - Dispersing procedures for powders in liquid
British Standards Institution (BSI)
- 25/30487873 DC BS ISO 23699 Microbeam analysis. Electron backscatter diffraction. Vocabulary
- 06/30144704 DC IEC TR 62316. Guidance for the interpretation of OTDR backscattering traces
- BS EN ISO 3543:2001 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method
- BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
- BS ISO 14887:2001 Sample preparation. Dispersing procedures for powders in liquids
- BS ISO 14887:2000 Sample preparation - Dispersing procedures for powders in liquids
- BS ISO 24173:2024 Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
- 19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
- 10/30195133 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
Association Francaise de Normalisation
- NF ISO 24173:2009 Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
- NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
- NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
- NF X11-710*NF ISO 14887:2000 Sample preparation - Dispersing procedures for powders in liquids.
- NF ISO 14887:2000 Sample preparation - Procedures for dispersing powders in liquids
Türk Standardları Enstitüsü
- TS 3083-1978 Sampling And Sample Preparation Of Bulk Materials Of Mining Products
German Institute for Standardization
- DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
- DIN ISO 13067 E:2021-01 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
- DIN ISO 14887:2010 Sample preparation - Dispersing procedures for powders in liquids (ISO 14887:2000)
- DIN ISO 13067:2015-12 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
- DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
- DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
Ente Nazionale Italiano di Unificazione
- UNI EN ISO 3543:2001 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method
- UNI EN ISO 3543:1997 Metallic and non-metallic coatings. Measurement of thickness. Beta backscatter method.
- EC 1-2008 UNI EN ISO 3543:2001 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method
GCC Standardization Organization
- GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
- GSO ISO 24173:2015 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
- GSO ISO 14887:2013 Sample preparation -- Dispersing procedures for powders in liquids
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
Bureau of Indian Standards
- IS 18084-2023 Sample Preparation Dispersing Procedures For Powders In Liquids
- IS 14149-2008 Metallic and non-metallic coatings - Measurement of thickness - Beta backscatter method
Spanish Association for Standardization (UNE)
- UNE 20617:1981 CHARACTERISTICS OF ANTI-SCATTER GRIDS USED IN X-RAY EQUIPMENT
Australian/New Zealand Standard (AU-AS/NZS)
- AS/NZS 2891.14.4:2013 Bitumen Sampling and Testing Methods Field Density Testing Nuclear Surface Moisture Densitometer Calibration Backscatter Mode
- AS/NZS 2891.14.4:1999 Methods of sampling and testing asphalt - Field density tests - Calibration of nuclear surface moisture-density gauge - Backscatter mode
BELST
- STB 1059-98 Radiation control. Sample preparation for determination of strontium-90 by radiochemical methods
Association for Electrical, Electronic & Information Technologies (VDE)
- VDE 0472-251-1990*DIN VDE 0472-251:1990 Testing of cables, wires and flexible cords; Backscattering in optical fibres (LWL)