Sign In |Help & Support
HOMECHINA STANDARDSICS CLASSIFICATIONINDUSTRY CLASSIFICATIONCHINESE CLASSIFICATIONCART(0)
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)
  1. HOME
  2. Standards for secondary electron scattering

secondary electron scattering

secondary electron scattering, Total:178 items.

The international standard classification for "secondary electron scattering" includes: Physicochemical methods of analysis , Other methods of testing of metals , Other standards related to protection against fire , Chemical analysis .

The Chinese standard classification for "secondary electron scattering" includes: Basic standards and general methods , Metallographic testing method , Fire-fighting in general .

Shandong Provincial Standard of the People's Republic of China

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
  • GB/T 19501-2004 General guide for electron backscatter diffraction analysis
  • GB/T 36165-2018 Determination of average grain size of metal—Electron backscatter diffraction (EBSD)method
  • GB/T 38532-2020 Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
  • GB/T 30703-2014 Microbeam analysis―Guidelines for orientation measurement using electron backscatter diffraction
  • GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Professional Standard - Agriculture

Shanghai Provincial Standard of the People's Republic of China

  • DB31/T 1156-2019 The identification of electrical fire melted mark—Electronic back scattering diffraction method

工业和信息化部

  • SJ/T 11672-2017 Technical specifications for secondary piping and wiring of electronic industrial production equipment
  • YB/T 4677-2018 Precision seamless steel tubes for motorcycle shock absorber

Professional Standard - Electron

  • SJ 2798-1987 Method for determination of particles in electronic grade gases--Light scattering method
  • SJ 3196-1989 Test methods for transmitting coefficient of secondary electron of electronic materials

Group Standards of the People's Republic of China

  • T/ZZAS 004-2019 Secondary lithium battery electrolyte
  • T/SHPTA 035-2023 Experimental methods for testing secondary batteries and their key materials using time-of-flight secondary ion mass spectrometry
  • T/CSTM 00922-2024 Determination of grain orientation of electrical steel strip ( sheet )for power transformer—Electron backscatter diffraction (EBSD) method

Professional Standard - Non-ferrous Metal

  • YS/T 1652-2023 Texture testing of zirconium and zirconium alloy— Electron backscatter diffraction method

未注明发布机构

  • DIN ISO 13067 E:2021-01 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size

国家市场监督管理总局、中国国家标准化管理委员会

  • GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel

Taiwan Provincial Standard of the People's Republic of China

  • CNS 14857.2-2004 Secondary lithium cell and batteries for portable applications - Part 2: Secondary lithium batteries
  • CNS 14857.1-2004 Secondary lithium cell and batteries for portable applications - Part 1: Secondary lithium cells
  • CNS 14857-1-2004 Secondary lithium cell and batteries for portable applications - Part 1: Secondary lithium cells
  • CNS 14857-2-2004 Secondary lithium cell and batteries for portable applications - Part 2: Secondary lithium batteries

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

  • GB/T 34172-2017 Microbeam analysis--Electron backscatter diffraction--Phase analysis method of metal and alloy

International Organization for Standardization (ISO)

  • ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
  • ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
  • ISO/PAS 16898:2012 Electrically propelled road vehicles — Dimensions and designation of secondary lithium-ion cells
  • ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
  • ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
  • ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
  • ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
  • ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
  • ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer

CZ-CSN

  • CSN 36 7003-1985 Electronic equipment Secondary power supply systems Classification

American Society for Testing and Materials (ASTM)

  • ASTM E1162-87(2001) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM E1162-87(1996) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM E1781-98(2003)e1 Standard Practice for Secondary Calibration of Acoustic Emission Sensors
  • ASTM E1781-98 Standard Practice for Secondary Calibration of Acoustic Emission Sensors
  • ASTM E1162-11(2019) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
  • ASTM E1781/E1781M-20 Standard Practice for Secondary Calibration of Acoustic Emission Sensors
  • ASTM C1689-08a Standard Practice for Subsampling of Uranium Hexafluoride
  • ASTM E1781/E1781M-19 Standard Practice for Secondary Calibration of Acoustic Emission Sensors

Association Francaise de Normalisation

  • NF ISO 24173:2009 Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
  • NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
  • NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
  • NF EN IEC 61960-4:2020 Accumulateurs alcalins et autres accumulateurs à électrolyte non acide - Accumulateurs au lithium pour applications portables - Partie 4 : éléments et batteries d'accumulateurs boutons au lithium
  • NF EN IEC 63115-1/A1:2022 Accumulateurs alcalins et autres accumulateurs à électrolyte non acide - Accumulateurs étanches au nickel-métal hydrure destinés à l'utilisation dans des applications industrielles - Partie 1 : Performances
  • NF EN ISO 8205:2021 Resistance Welding Equipment - Water Cooled Secondary Cables
  • NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions

SCC

  • BS EN 61960-1:2001 Secondary lithium cells and batteries for portable applications-Secondary lithium cells
  • DANSK DS/ISO/IEC PAS 16898:2013 Electrically propelled road vehicles - Dimensions and designation of secondary lithium-ion cells
  • ISO 17109:2015/DAmd 1 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films — A...
  • 10/30195133 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
  • BS PD ISO/IEC PAS 16898:2012 Electrically propelled road vehicles. Dimensions and designation of secondary lithium-ion cells
  • 08/30133935 DC ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
  • DANSK DS/ISO 23484:2023 Determination of particle concentration by small-angle X-ray scattering (SAXS)
  • AS C60:1931 Sulphuric acid for use in secondary batteries
  • CSA C22.2 No.52-2009(R2014) Underground secondary and service-entrance cables
  • 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
  • IEC 61960-2:2001/COR1:2002 Corrigendum 1 - Secondary lithium cells and batteries for portable applications - Part 2: Secondary lithium batteries
  • IEC 61960-1:2000/COR1:2002 Corrigendum 1 - Secondary lithium cells and batteries for portable applications - Part 1: Secondary lithium cells
  • AS C60:1961 Sulphuric acid for use in secondary batteries

US-FCR

British Standards Institution (BSI)

  • BS EN 61960-2:2002 Secondary lithium cells and batteries for portable applications - Secondary lithium batteries
  • BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
  • BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
  • BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
  • BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • 21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
  • BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
  • BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
  • BS ISO 24173:2024 Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
  • 19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
  • BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • BS EN 62660-1:2011 Secondary lithium-ion cells for the propulsion of electric road vehicles. Performance testing
  • BS EN IEC 62660-3:2022 Secondary lithium-ion cells for the propulsion of electric road vehicles - Safety requirements
  • 21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
  • BS EN IEC 62660-1:2019 Secondary lithium-ion cells for the propulsion of electric road vehicles. Performance testing
  • PD ISO/IEC PAS 16898:2012 Electrically propelled road vehicles. Dimensions and designation of secondary lithium-ion cells
  • 23/30435799 DC BS ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction

German Institute for Standardization

  • DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
  • DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
  • DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
  • DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
  • DIN V VDE V 0510-11:2008 Safety requirements for secondary batteries and battery installations - Part 11: Safety requirements for secondary lithium batteries for hybrid vehicles and mobile applications

IN-BIS

  • IS 3008-1993 Brush, shoe blacking. Specification (Second Revision)
  • IS 3009-1993 Brushs, shoe polishing. Specification (Second Revision)

SE-SIS

  • SIS SS 424 18 28-1991 Optical cables — PVC-sheathed two fibre cables with loose secondary coating, type GNKD
  • SIS SS 424 18 34-1991 Opticalcables — PVC-sheathed, PVC-fibre sheathedmultifibre cables with loose secondary coating, type GNHKKD
  • SIS SS 424 18 30-1991 Optical cables — PVC-sheathed, PVC-fibre sheathed two fibre cables with loose secondary coating, type GNKKD

Standard Association of Australia （SAA）

GSO

  • GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
  • OS GSO ISO 13067:2015 Microbeam analysis -- Electron backscatter diffraction -- Measurement of average grain size
  • GSO ISO 24173:2015 Microbeam analysis -- Guidelines for orientation measurement using electron backscatter diffraction
  • GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
  • BH GSO ISO 12714:2016 Non-destructive testing -- Acoustic emission inspection -- Secondary calibration of acoustic emission sensors
  • GSO ISO 12714:2013 Non-destructive testing -- Acoustic emission inspection -- Secondary calibration of acoustic emission sensors
  • GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
  • OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

Korean Agency for Technology and Standards (KATS)

KR-KS

  • KS C ISO/IEC PAS 16898-2019 Electrically propelled road vehicles — Dimensions and designation of secondary lithium-ion cells
  • KS C IEC 62660-3-2023 Secondary lithium-ion cells for the propulsion of electric road vehicles — Part 3: Safety requirements
  • KS B ISO 12714-2018(2023) Non-destructive testing — Acoustic emission inspection — Secondary calibration of acoustic emission sensors
  • KS C IEC 60050-482-2022 International electrotechnical vocabulary — Part 482: Primary and secondary cells and batteries

Danish Standards Foundation

International Electrotechnical Commission (IEC)

  • ISO/IEC 16898:2012 Electrically propelled road vehicles -- Dimensions and designation of secondary lithium-ion cells
  • IEC 61960-4:2020 Secondary cells and batteries containing alkaline or other non-acid electrolytes - Secondary lithium cells and batteries for portable applications - Part 4: Coin secondary lithium cells, and batteries
  • IEC 61434:1996 Secondary cells and batteries containing alkaline or other non-acid electrolytes - Guide to the designation of current in alkaline secondary cell and battery standards

Japanese Industrial Standards Committee (JISC)

  • JIS B 9925:2010 Light scattering liquid-borne particle counter
  • JIS B 9921:1997 Light scattering automatic particle counter
  • JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
  • JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
  • JIS C 8714:2007 Safety tests for portable Lithium Ion secondary cells and batteries for use in portable electronic applications
  • JIS B 9925:1997 Light scattering automatic particle counter for liquid

NEMA - National Electrical Manufacturers Association

IET - Institution of Engineering and Technology

US-VA

CENELEC - European Committee for Electrotechnical Standardization

  • EN 61960-1:2001 Secondary Lithium Cells and batteries for Portable Applications Part 1: Secondary Lithium Cells
  • EN 61960-2:2001 Secondary Lithium Cells and Batteries for Portable Applications Part 2: Secondary Lithium Batteries

American National Standards Institute （ANSI)

  • ANSI/ATIS 0600338-2021 Electrical Coordination of Primary and Secondary Surge Protection for Use in Telecommunications Circuits

GOSTR

  • PNST 496-2020 Secondary batteries and battery installations. Safety requirements. Part 6. Traction lithium-ion batteries

dsc secondary,secondary purification,secondary mass spectrometer,secondary transfection,secondary line,secondary amplification,Secondary range,Second quotation,secondary melting,secondary derivative,electron scattering,Electron Diffraction and Electron Scattering,secondary electron scattering,electron-electron scattering,electron scattering analysis,Secondary Secondary Thermal Analysis,scattered by electrons,metal electron scattering,Electron Scattering and Electron Diffraction

All Rights Reserved © 2026 WWW.CHINASTANDARDS.NET visa master american express unionpay apple pay paypal google pay