Diffraction Electron Microscopy Transmission Electron Microscopy
Diffraction Electron Microscopy Transmission Electron Microscopy, Total:32 items.
The international standard classification for "Diffraction Electron Microscopy Transmission Electron Microscopy" includes: Physicochemical methods of analysis , Optical equipment .
The Chinese standard classification for "Diffraction Electron Microscopy Transmission Electron Microscopy" includes: Basic standards and general methods , Magnifier and microscope , Electron optics and other physical optics instrument .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
Professional Standard - Education
- JY/T 0581-2020 General analysis rules for transmission electron microscope
- JY/T 011-1996 General rules for transmission electron microscopy
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
Professional Standard - Machinery
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 5383-1991 Specification for Transmission Electron Microscope
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
Shanghai Provincial Standard of the People's Republic of China
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
International Organization for Standardization (ISO)
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
GSO
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
Association of German Mechanical Engineers
- VDI/VDE 5575 Blatt 7-2011 X-Ray optical systems - Refractive X-ray lenses
SCC
- VDI/VDE 5575 BLATT 7-2019 X-ray optical systems - Refractive X-ray lenses
- VDI/VDE 5575 BLATT 4:2018 X-ray optical systems — X-ray mirrors and X-ray mirror systems — Total reflection and multilayer mirrors
VDI - Verein Deutscher Ingenieure
- VDI/VDE 5575 BLATT 7-2018 Roentgenoptische Systeme - Refraktive Roentgenlinsen
Japanese Industrial Standards Committee (JISC)
- JIS B 7144:1995 Microscope -- Connection of condensers for transmitted light with substage sleeves
- JIS E 3303:1977 Lenses, filters, reflectors and semi-sealed units for railway signals
- JIS B 7158-3:2017 Microscopes -- Designation of microscope objectives -- Part 3: Spectral transmittance
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