Secondary Diffraction Microscopy
Secondary Diffraction Microscopy, Total:28 items.
The international standard classification for "Secondary Diffraction Microscopy" includes: Physicochemical methods of analysis , Optical equipment , Chemical analysis .
The Chinese standard classification for "Secondary Diffraction Microscopy" includes: Basic standards and general methods , Magnifier and microscope .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 43846.3-2024 Microscopes—Designation of microscope objectives—Part 3: Spectral transmittance
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 19501-2013 Microbeam analysis—General guide for electron backscatter diffraction analysis
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
Professional Standard - Commodity Inspection
- SN/T 2649.1-2010 Determination of asbestos in cosmetics for import and export-Part 1:X-ray diffraction and scan electron microscopy method
- SN/T 3231-2012 Determination of asbestos in talcum―Polarized light microscope and X-ray diffraction method
- SN/T 3131-2012 Determination of asbestos in bicycle brake rubbers-Polarized light microscope and X-ray diffraction method
- SN/T 2731-2010 Identification of asbestos in nonmetal minerals—X-radial diffraction instrument-microscope observation method
- SN/T 2649.2-2010 Determination of asbestos in import and export cosmetics—Part 2:X-ray diffraction and polarized light microscope method
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
International Organization for Standardization (ISO)
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 23699 Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
- ISO 19012-3:2015 Microscopes - Designation of microscope objectives - Part 3: Spectral transmittance
GSO
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- BS ISO 19012-3:2015 Microscopes. Designation of microscope objectives. Spectral transmittance
Standard Association of Australia （SAA）
- AS 2856.3:2000(R2013) Coal Petrography Microscopic Coal Microscopic Reflectivity Microscopic Determination Method
- AS 2856.3:2000 Coal petrography - Method for microscopical determination of the reflectance of coal macerals
SCC
- AS 2486:1989 Methods for microscopical determination of the reflectance of coal macerals
IX-IX-IEC
- IEC TS 62607-6-17:2023 Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy
Association Francaise de Normalisation
- NF ISO 24173:2009 Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
x-ray diffraction microscope,Microscope Diffraction,Microscope Diffraction,second order diffraction,xrd second order diffraction,Diffraction microscopy,x-ray diffraction microscope,Diffraction Grating, Second Order Diffraction,TEM Diffraction,Transmission Electron Microscopy Selected Area Diffraction,Second order diffraction and first order diffraction,Secondary Diffraction Microscopy,Micro-diffraction,First Order Diffraction Second Order Diffraction,electron microscope diffraction,Diffraction microscope,xrd first order diffraction and second order diffraction,Spectral second order diffraction,Diffraction microscope,Fluorescence Secondary Diffraction
