TEM Diffraction
TEM Diffraction, Total:23 items.
The international standard classification for "TEM Diffraction" includes: Physicochemical methods of analysis , Chemical analysis .
The Chinese standard classification for "TEM Diffraction" includes: Basic standards and general methods , Electron optics and other physical optics instrument .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 18907-2013 Microbeam analysis—Analytical electron microscopy—Selected-area electron diffraction analysis using a transmission electron microscope
Professional Standard - Education
- JY/T 011-1996 General rules for transmission electron microscopy
- JY/T 0581-2020 General analysis rules for transmission electron microscope
Professional Standard - Machinery
- JB/T 5585-1991 Test Method of Transmission Electron Microscope Resolution
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 5584-1991 Test Method of Transmission Electron Microscope Amplification
- JB/T 5586-1991 Classification and Basic Parameter of Transmission Electron Microscope
- JB/T 5383-1991 Specification for Transmission Electron Microscope
National Metrological Verification Regulations of the People's Republic of China
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant virusesby transmission electron microscopy
International Organization for Standardization (ISO)
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
- ISO 25498:2018 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
GSO
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS ISO 25498:2010 Microbeam analysis - Analytical electron microscopy - Selected-area electron diffraction analysis using a transmission electron microscope
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