How to determine the single crystal

How to determine the single crystal, Total:52 items.

The international standard classification for "How to determine the single crystal" includes: Semiconducting materials , Non-destructive testing of metals , Testing of metals , Chemical analysis of metals , Materials for aerospace construction .

The Chinese standard classification for "How to determine the single crystal" includes: Semimetal and semiconductor material in general , Metal nondestructive testing method , Metal physical property test method , Power semiconductor device and parts , Basic standards for aviation and aerospace materials , Metal casting and forging materials used for aviation and aerospace , Technical management .

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 16596-2019 Specification for establishing a wafer coordinate system
GB/T 39137-2020 Determination for the orientation of refractory metal single crystal

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon
GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB/T 1551-1995 Test method for resistivity of silicon and germanium bars using a two-point probe
GB/T 16596-1996 Specification for establishing a wafer coordinate system

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 34210-2017 Test method for determining the orientation of sapphire single crystal

Professional Standard - Machinery

JB/T 8758-1998 Criteria for Value Determination of Parameters of Thyristor

National Metrological Technical Specifications of the People's Republic of China

JJF 1256-2010 Calibration Specification for X-ray Monocrystal Orientation Equipment

Professional Standard - Aviation

HB 7762-2005 Specification for master alloys directionally solidfied and single crystal superalloys for aeroengines
HB 6742-1993 Determination of Crystal Orientation for Monocrystal Blade - X-ray Back-reflection Laue Photograph Method

Sichuan Provincial Standard of the People's Republic of China

DB51/T 2499-2018 Naming and Qualification Judgment of Filling Treatment Single Crystal Gems

Taiwan Provincial Standard of the People's Republic of China

CNS 11364-1985 Method for Determination of the Unit Cell Dimension of a Faujasite-Type Zeolite

National Metrological Verification Regulations of the People's Republic of China

JJG 48-1990 Verification Regulation of Standard Slice of Single Crystal Silicon Resistivity

Group Standards of the People's Republic of China

T/SBX 039-2020 Determination of Purity of Alkyl Biphenylcyanide Liquid Crystal Monomer

Professional Standard - Electron

SJ/T 2428-1983 Clibration for astronautic standard monocrystal silicon solar cells
SJ 2915-1988 Terms and definitions for single crystal microwave ferrite devices
SJ/T 31109-1994 Requirements of readiness and methods of inspection and assessment for high-pressure mono-crystal furnaces

SCC

AWWA ACE58222 Security Vulnerability Assessments — What Happens Once You've Identified the Critical Assets?
AWWA ACE94191 Monitoring to Identify Causative Factors of Degradation of Water Quality: What to Look For
11/30212455 DC BS ISO 3387. Rubber. Determination of crystallization effects by hardness measurements
AWWA WQTC60637 Current Status of VFARs, On-Going Research and What Needs To Be Done To Evaluate the VFAR Concept and Determine Its Feasibility

Korean Agency for Technology and Standards (KATS)

KS D 0069-2002(2017) Method of determining the crystallization temperatures of amorphous metals
KS C IEC 60122-4:2022 Quartz crystal units of assessed quality —Part 4: Crystal units with thermistors

Spanish Association for Standardization (UNE)

UNE-ISO 3387:2013 Rubber. Determination of crystallization effects by hardness measurements.
UNE 53631:2003 Rubber. Determination of crystallization effects by hardness measurements.

US-CFR-file

CFR 1-51.9-2014 General provisions. Part51:Incorporation by reference. Section51.9:What is the proper language of incorporation?
CFR 33-148.705-2013 Navigation and navigable waters. Part148:Deepwater ports: general. Section148.705:What is determined by the environmental evaluation?
CFR 13-121.1009-2013 Business Credit and Assistance. Part121:Small business size regulations. Section121.1009:What are the procedures for making the size determination?

KR-KS

KS C IEC 60122-4-2022 Quartz crystal units of assessed quality —Part 4: Crystal units with thermistors

International Electrotechnical Commission (IEC)

IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors

American National Standards Institute （ANSI)

ANSI/ASTM D6058:2001 Practice for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment

British Standards Institution (BSI)

19/30371102 DC BS ISO 3387. Rubber. Determination of crystallization effects by hardness measurements
BS PD CEN/TR 16988:2016 Estimation of uncertainty in the single burning item test
BS 903-A63:1995 Physical testing of rubber - Method for determination of crystallization effects by hardness measurements

GOSTR

PNST 406-2020 ？Green？ standards. Photovoltaic monocrystal modules. Criteria and indicators for confirm compliance with ？green？ products

American Society for Testing and Materials (ASTM)

ASTM RR-F01-1018 2008 F0076- Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
ASTM D6058-96(2016) Standard Practice for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment
ASTM D6058-96(2011) Standard Practice for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment

Defense Logistics Agency

DLA SMD-5962-89976 REV B-2006 MICROCIRCUIT, LINEAR, HIGH SPEED, PRECISION, JFET, OPERATIONAL AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-89897 REV B-2002 MICROCIRCUIT, LINEAR, QUAD, PRECISION, HIGH SPEED, JFET OPERATIONAL AMPLIFIER, MONOLITHIC SILICON

CZ-CSN

CSN 64 0209-1974 Preparation of test specimens of amorphous crmoplastic materials with a defined levcl l shrinkage

GOST

GOST 25734-1983 Alumina. Method for the crystallooptic determination of monocrystals in non metallurgical alumina

RU-GOST R

GOST 24392-1980 Monocrystalline silicon and germanium. Measurement of the electrical resistivity by the four-probe method

GSO

GSO ISO 7170:2008 Furniture - Storage units - Determination of strength and durability
OS GSO ISO 18775:2015 Veneers -- Terms and definitions, determination of physical characteristics and tolerances
BH GSO ISO 18775:2017 Veneers -- Terms and definitions, determination of physical characteristics and tolerances

European Committee for Standardization (CEN)

PD CEN/TR 16988:2016 Estimation of uncertainty in the single burning item test

Association Francaise de Normalisation

NF ISO 18775:2021 Placages - Termes et définitions, détermination des caractéristiques physiques et tolérances