molecular crystal

molecular crystal, Total:221 items.

The international standard classification for "molecular crystal" includes: Other non-ferrous metals and their alloys , Ophthalmic equipment , Nuclear energy in general , Electronic components in general , Other standards related to analytical chemistry , Semiconducting materials , Semiconductor devices , Physicochemical methods of analysis , Testing of metals , Chemical analysis of metals , Physics. Chemistry , Pesticides and other agrochemicals , Sugar. Sugar products. Starch .

The Chinese standard classification for "molecular crystal" includes: Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Medical optical instrument and endoscope , Extracorporeal circulation, artificial organ and prosthesis device , Nuclear detector , Other petroleum products , Quartz crystal and piezoelectric element , Electrochemical, thermochemistry and optical profile type analyzer , Elemental semiconductor material , Semiconductor discrete devices in general , Metal physical property test method , Semimetal and semiconductor material in general , Electron optics and other physical optics instrument , Semimetal and semiconductor material analysis method , Artificial lens , Technical management , Technical management , Pesticide , Material and component for instrument and meter , Processed sugar , Sugar refining , Time and Frequency Measurement .

Professional Standard - Rare Earth

XB/T 617.2-2014 Chemical analysis methods of neodymium iron boron alloy. Part 2:Determination of fifteen REO relative contents

Professional Standard - Education

JY/T 008-1996 General rules for crystal and molecular structure determination of small molecules by four-circle single crystal X-ray diffractometer
JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer

Professional Standard - Medicine

YY 0290.9-2010 Ophthalmic implants—Intraocular lenses—Part 9:Multifocal intraocular lenses
YY 0290.1-1997 Intraocular lenses―Part 1:Terminology
YY/T 0295.11-1997 Capsulotomy forceps
YY 0290.10-2009 Intraocular lenses—Part 10:Phakic intraocular lenses

Group Standards of the People's Republic of China

T/ZJCX 0021-2022 Quartz crystal resonator for automotive electronics
T/SAS 0004-2018 Bismuth germinate scintillation crystals for space particle dectection
T/CECA 48-2021 Quartz Crystal Microbalance Element
T/SAS 0003-2018 Bismuth germanate scintillation crystals for positron emission tomography
T/QGCML 1655-2023 Thin film transistor LCD

Professional Standard - Building Materials

JC/T 2018-2010 Thallium doped cesium iodide crystal for high-energy particles detection
JC/T 2017-2010 Lead fluoride crystal

Military Standard of the People's Republic of China-General Armament Department

GJB 33/16-2011 Semiconductor optoelectronic device.Detail specification for type 3DU32 semiconductor phototransistor

Professional Standard - Petrochemical Industry

SH/T 0339-1992 Determination method for cell parameter of NaY molecular sieve
SH/T 0340-1992 Determination method for crystallinity of NaY molecular sieve

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 12963-2022 Electronic-grade polycrystalline silicon
GB/T 16517-1996 Quartz crystal units-A specification in the Quality Assessment System for Electronic Components Part 3: Sectional specification - Qualification approval
GB/T 43610-2023 Microbeam analysis—Analytical electron microscopy—Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
GB/T 15651.7-2024 Semiconductor devices—Part 5-7: Optoelectronic devices—Photodiodes and phototransistors
GB/T 16516-1996 Quartz crystal units-A specification in the Quality Assessment System for Electronic Components Part 2: Sectional specification—Capability approval
GB 9558-2001 Crystallo-dimethoate
GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB/T 42706.5-2023 Electronic components—Long-term storage of electronic semiconductor devices—Part 5：Die and wafer devices
GB/T 15020-1994 Quartz crystal units for use in electronic equipment Blank detail specification Resistance welded quartz crystal units Assessment level E
GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
GB/T 12963-2014 Electronic-grade polycrystalline silicon
GB/T 12273-1996 Quartz crystal units-A specification in the Quality Assessment system for Electronic Components - Part 1: Generic specification
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
GB/T 37049-2018 Test method for the content of metal impurity in electronic grade polysilicon—Inductively coupled-plasma mass spectrometry method
GB/T 39867-2021 Bismuth germanate scintillation crystal for positron emission tomography

Professional Standard - Electron

SJ 50033/111-1996 Semiconductor optoelectronic devices - Detail specification for Type GT16 Si. NPN phototransistor
SJ/Z 9155.2-1987 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators

Taiwan Provincial Standard of the People's Republic of China

CNS 12257-1988 Crystal Filters
CNS 1996-1978 Stannic Chloride, Crystal (Tin Tetraclrloride Crystals)

中华人民共和国国家质量监督检验检疫总局

GB/T 9558-2001 Crystallo-dimethoate

未注明发布机构

DIN EN ISO 11979-7 E:2023-04 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)
DIN EN ISO 11979-7 E:2017-03 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)
DIN EN ISO 11979-7 E:2013-07 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)
DIN EN ISO 11979-7 E:2012-07 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)

Shandong Provincial Standard of the People's Republic of China

DB37/T 2658.75-2015 Lu Cuisine Crystal Knuckle

Professional Standard - Machinery

JB/T 9495.1-1999 Optical Crystals

轻工业部

QB 1173-1991 Monocrystal Rock Sugar
QB 1174-1991 Multicrystal Rock Sugar

Professional Standard - Light Industry

QB/T 1174-1991 Multicrystal rock sugar
QB/T 1174-2002 Multicrystal rock sugar
QB/T 1173-1991 Monocrystal rock sugar

National Metrological Verification Regulations of the People's Republic of China

JJG 180-2002 Verification Regulation of Crystal Oscillator inside the Electrical Measurement Instrument

National Metrological Technical Specifications of the People's Republic of China

JJF 1984-2022 Calibration Specification for Crystal Oscillators inside the Electrical Measurement Instruments

Korean Agency for Technology and Standards (KATS)

KS C IEC 60444-8:2016 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
KS C IEC 60444-9:2016 Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
KS C IEC 60444-7:2016 Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
KS P ISO 11979-7:2021 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
KS P ISO 11979-10:2019 Ophthalmic implants — Intraocular lenses — Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
KS P ISO 11979-9-2023 Ophthalmic implants — Intraocular lenses — Part 9: Multifocal intraocular lenses
KS C IEC 60679-2-2023 Quartz Crystal Oscillator Part 2: A Guide to Using a Quartz Crystal Oscillator
KS C IEC 60679-2:2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 61747-2:2002 Liquid crystal and solid－state display devices－Part 2：Liquid crystal display modules－Sectional specification
KS C IEC 60747-7:2017 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors
KS C IEC 60747-7:2006 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors
KS C IEC 61178-2-2023 IEC Electronic Components Quality Assessment System (IECQ) Specification for Quartz Crystal Components Part 2: Sub-Specification Capability Recognition
KS C 7021-1985 GENERAL RULES FOR TRANSISTORS
KS C 7021-1974(2001) GENERAL RULES FOR TRANSISTORS
KS C IEC 60122-4:2022 Quartz crystal units of assessed quality —Part 4: Crystal units with thermistors
KS C IEC 61178-2:2018 Quartz crystal units — A specification in the IEC Quality Assessment System for Electronic Components (IECQ) — Part 2: Sectional specification – Capability approval

U.S. Military Regulations and Norms

ARMY MIL-PRF-3098/95 E VALID NOTICE 2-2013 Crystal Unit, Quartz, CR119/U
ARMY MIL-PRF-55310/8 J-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 50 Hz THROUGH 50 MHz, HERMETIC SEAL, SQUARE WAVE, TTL

Japanese Industrial Standards Committee (JISC)

JIS C 6705:1984 Quartz crystal units for oscillators (for from 200 to 1000 kHz)
JIS C 6702:1992 Ovens for quartz crystal units
JIS H 7804:2005 Method for particle size determination in metal catalysts by electron microscope

Danish Standards Foundation

DS/EN 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
DS/EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
DS/EN ISO 11979-10:2006 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses
DS/EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
DS/EN ISO 11979-9:2007 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses

Association Francaise de Normalisation

NF C93-621-8*NF EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
NF C93-601/AM1:1976 COMPONENTS FOR ELECTRONIC EQUIPMENT. PIEZOELECTRIC DEVICES. CRYSTAL HOLDERS.
NF EN 62416:2010 Semiconductor Devices – Hot Carrier Testing on MOS Transistors
NF C80-202*NF EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
NF EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7: clinical investigations of intraocular lenses for the correction of aphakia
NF C96-006:1984 Electronic components. Semiconductor devices. Discrete devices and integrated circuits. Part 6 : thyristors.
NF EN 62435-5:2017 Electronic components - Long-term storage of semiconductor electronic devices - Part 5 - chip devices and wafers
NF S94-750-7*NF EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7 : clinical investigations of intraocular lenses for the correction of aphakia
NF C96-435-5*NF EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5 - die and wafer devices
NF EN ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses - Part 10: Clinical investigations of intraocular lenses for the correction of ametropia in phakic eyes
NF B30-004:1974 GLASS.CRYSTAL,CRYSTAL GLASS,CRYSTALLIN.
NF EN 120003:1992 Special framework specification: phototransistors, photodarlington transistors, phototransistor networks
UTE C86-614:1977 Electronic components - Bipolar switching transistors - Collection of special specifications
NF C93-120-003*NF EN 120003:1992 Blank detail specification : phototransistors, photodarlington transistors, phototransistor arrays
NF S94-750-10*NF EN ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses - Part 10 : Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes

YU-JUS

JUS N.R9.073-1986 Piezoelectrlc vibrators. Quartz crystal unlts. Two wire crystal holder outline, type 17
JUS N.R9.069-1986 Piezoelectric vibrators. Quartz crystal units. Two piri crystal holder outline, type 07
JUS N.R9.071-1986 Piezoelectric vibrators. Quartz crystal units. Two mre crystal holder outline, type 18
JUS N.R9.070-1986 Piezoelectric vibrators. Ouartz crystal units. Two pin crystal holder outlfne, type09
JUS N.R9.064-1986 Piezoelectric vibrators. Ctuartz crystal units. Two wire crystal holder outline. Types 11, 14 and 15
JUS N.R9.077-1986 Piezoelectric vibrators. Quartz crystal units. Two wire crystal holder outline, type 20
JUS N.R9.076-1986 Piezoelectric vibrators. Quartz crystal units. Two pin crystal hotder outllne, type08
JUS N.R9.078-1986 Piezoelectric vibrators. Quartz crystal units. Turo wire crystal holder outline, type 21
JUS N.R9.072-1986 Piezoe/ectric vibrators. Ctuartz crystal units. Two wfre crystaf holder outline, type 16
JUS N.R9.074-1986 Piezoelectric vibrators. Ouartz crystal units. Two wire crystal holder outline, type 19
JUS N.R9.075-1986 Piezoelectric vibrators. Quartz crystal units. Two pin crystal holder outline, type 10
JUS N.R9.005-1977 Piezoelectric vibrators. Quartz crystal units for frequency control and selection

British Standards Institution (BSI)

BS EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices. - Part 5: Die and wafer devices
BS EN 120003:1986 Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays
BS EN 120003:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
BS EN 62047-9:2011 Semiconductor devices. Micro-electromechanical devices. Wafer to wafer bonding strength measurement for MEMS
BS EN 62047-9:2013 Semiconductor devices. Micro-electromechanical devices. Wafer to wafer bonding strength measurement for MEMS
BS EN ISO 11979-9:2006+A1:2014 Ophthalmic implants — Intraocular lenses — Part 9 : Multifocal intraocular lenses
BS EN 120000:1996 Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices
BS EN 168100:1995 Harmonized system of quality assessment for electronic components - Sectional specification: quartz crystal units (capability approval)
BS EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
23/30453001 DC BS EN ISO 11979-7. Ophthalmic implants. Intraocular lenses - Part 7. Clinical investigations of intraocular lenses for the correction of aphakia
BS EN ISO 11979-7:2018 Ophthalmic implants. Intraocular lenses. Clinical investigations of intraocular lenses for the correction of aphakia
BS EN ISO 11979-7:2024 Ophthalmic implants. Intraocular lenses - Clinical investigations of intraocular lenses for the correction of aphakia
BS CECC 68100:1991 Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
BS IEC 60747-7:2010 Semiconductor devices. Discrete devices. Bipolar transistors
BS IEC 60747-7:2010+A1:2019 Semiconductor devices. Discrete devices - Bipolar transistors
BS IEC 60747-7:2011 Semiconductor devices. Discrete devices. Bipolar transistors
BS EN 169100:1993 Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval)
BS PD ISO/TS 23151:2021 Nanotechnologies. Particle size distribution for cellulose nanocrystals. Particle size distribution for cellulose nanocrystals

International Electrotechnical Commission (IEC)

IEC 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
IEC 61178-1:1993 Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 1: generic specification
IEC 61178-2:1993 Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 2: sectional specification; capability approval
IEC 60747-7:2000 Semiconductor devices - Part 7: Bipolar transistors

GSO

GSO ISO 11979-10:2014 Ophthalmic implants -- Intraocular lenses -- Part 10: Phakic intraocular lenses
BH GSO ISO 11979-10:2016 Ophthalmic implants -- Intraocular lenses -- Part 10: Phakic intraocular lenses
GSO ISO 11979-9:2014 Ophthalmic implants -- Intraocular lenses -- Part 9: Multifocal intraocular lenses
BH GSO IEC 62435-5:2022 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
GSO IEC 62435-5:2021 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
OS GSO ISO 11979-9:2014 Ophthalmic implants -- Intraocular lenses -- Part 9: Multifocal intraocular lenses
BH GSO ISO 11979-9:2016 Ophthalmic implants -- Intraocular lenses -- Part 9: Multifocal intraocular lenses
OS GSO IEC 61178-2:2014 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
BH GSO IEC 61178-3:2016 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
GSO IEC 61178-3:2014 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
OS GSO IEC 61178-3:2014 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval

European Committee for Electrotechnical Standardization（CENELEC）

EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices

German Institute for Standardization

DIN EN 62416:2010-12 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010
DIN 52341:1993 Testing of glass; chemical analysis of lead crystal glass and crystal glass
DIN EN ISO 11979-7:2018-08 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018); German version EN ISO 11979-7:2018
DIN EN 120003:1996 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
DIN EN ISO 11979-7:2023-04 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO/DIS 11979-7:2023); German and English version prEN ISO 11979-7:2023 / Note: Date of issue 2023-03-03*Intended as replace...
DIN EN 120003:1996-11 Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
DIN EN ISO 11979-10:2018-08 Ophthalmic implants - Intraocular lenses - Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes (ISO 11979-10:2018); German version EN ISO 11979-10:2018
DIN IEC 61178-2:1995 A specification in the IEC quality assessment system for electronic components (IECQ) - Quartz crystal units - Part 2: Sectional specification, capability approval; identical with IEC 61178-2:1993
DIN EN 61747-2:1999 Liquid crystal and solid-state display devices - Part 2: Liquid crystal display modules; sectional specification (IEC 61747-2:1998); German version EN 61747-2:1999

SCC

DANSK DS/EN ISO 11979-10/A1:2006 Ophthalmic implants – Intraocular lenses – Part 10: Phakic intraocular lenses
CEI EN 62416:2011 Semiconductor devices - Hot carrier test on MOS transistors
DANSK DS/EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
AENOR UNE-EN ISO 11979-10:2007 Ophthalmic implants. Intraocular lenses. Part 10: Phakic intraocular lenses. (ISO 11979-10:2006)
NS-EN ISO 11979-10:2006 Ophthalmic implants — Intraocular lenses — Part 10: Phakic intraocular lenses (ISO 11979-10:2006)
07/30163748 DC BS EN 62416. Hot carrier test on MOS transistors
AENOR UNE-EN ISO 11979-10/A1:2007 Ophthalmic implants. Intraocular lenses. Part 10: Phakic intraocular lenses. (ISO 11979-10:2006)
08/30177349 DC BS EN 62416. Hot carrier test on MOS transistors
BS EN ISO 11979-10:2006+A1:2014 Ophthalmic implants. Intraocular lenses-Phakic intraocular lenses
ANSI Z80.13-2007(R2017) Ophthalmics - Phakic Intraocular Lenses
DIN EN ISO 11979-10/A1 E:2013 Draft Document - Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006/DAM1:2013); German version EN ISO 11979-10:2006/prA1:2013
CEI EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices Part 5: Die and wafer device
DANSK DS/EN 62435-5:2017 Electronic components – Long-term storage of electronic semiconductor devices – Part 5: Die and wafer devices
NS-EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018)
DANSK DS/EN ISO 11979-9/A1:2006 Ophthalmic implants – Intraocular lenses – Part 9: Multifocal intraocular lenses
MIL MIL-C-24066/1A-1965 CLIP, CRYSTAL HOLDER (NO S/S DOCUMENT) (SUPERSEDING MIL-C-24066/1)
DANSK DS/EN ISO 11979-9:2006 Ophthalmic implants – Intraocular lenses – Part 9: Multifocal intraocular lenses
DANSK DS/EN ISO 11979-7:2018 Ophthalmic implants – Intraocular lenses – Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018)
DANSK DS/ISO 11979-7:2024 Ophthalmic implants – Intraocular lenses – Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
DANSK DS/EN 120003:2016 Blank Detail Specification: Phototransistors, photodarlington transistors, phototransistor arrays
BS IEC 60747-4-1:2000 Semiconductor devices. Discrete devices-Microwave diodes and transistors. Microwave field effect transistors. Blank detail specification-BDS for microwave field-effect transistors
BS EN 168000:1996 Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units
IEC 60122-2:1962 Quartz crystal units for oscillators - Part 2: Guide to the use of quartz oscillator crystals

RO-ASRO

STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties
STAS 9675-1974 CRYSTALLINE SILICON
STAS 11381/10-1980 Graphical symbols for electrical diagrams PIEZOELECTRIC CRISTALS ELECTRET
STAS 9007-1971 ELECTRONIC-NUCLEAR EQUIPMENTS Supply voltages for tranzistorized devices intended for nuclear electronics

ES-UNE

UNE-EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)
UNE-EN 120003:1992 BDS: PHOTOTRANSISTORS, PHOTOCARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS. (Endorsed by AENOR in September of 1996.)
UNE-EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018) (Endorsed by Asociación Española de Normalización in June of 2018.)
UNE-EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (Endorsed by Asociación Española de Normalización in May of 2017.)
UNE-EN ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses - Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes (ISO 11979-10:2018) (Endorsed by Asociación Española de Normalización in June of 2018.)

IECQ - IEC: Quality Assessment System for Electronic Components

PQC 83 ISSUE 1.1-1989 Generic Specification: Quartz Crystal Units for Use in Electronic Equipment
PQC 84 ISSUE 1.1-1989 Blank Detail Specification: Quartz Crystal Units for Use in Electronic Equipment

CU-NC

NC 66-29-1984 Electronics. Bipolar Transistors Measurement Methods
NC 66-28-1984 Electronics. High-Frequency Bipolar Transistors. Type BF 199. Quality Specifications
NC 66-27-1984 Electronics High-Frequency Bipolar Transistors, Type BF 310 Quality Specifications

Lithuanian Standards Office

LST EN ISO 11979-10:2007 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006)
LST EN 62416-2010 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010)
LST EN 120003-2001 Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays

AENOR

UNE-EN ISO 11979-10:2007 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006)
UNE-EN ISO 11979-10:2007/A1:2014 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses (ISO 11979-10:2006/Amd 1:2014)

American National Standards Institute （ANSI)

ANSI Z80.13-2007 Phakic Intraocular Lenses
ANSI/EIA 417-A:1991 Crystal Outlines
ANSI/EIA 699:1997 Test Method for the Visual Inspection of Quartz Crystal Resonator Blanks

HU-MSZT

MSZ 9200/34-1984 Electronic signals. Crystalline electrical switches, wires and electromechanical filters
MSZ 4749-1970 crystalline asbestos
MSZ 9519-1958 Crystalline sodium acetate for analysis
MNOSZ 24141-1955 Transparent crystal calcium. Analysis purpose
MSZ 9275-1982 Crystalline sodium sulfate for analysis
MSZ 9274-1957 Cadmium sulfate of crystalline water for analysis

International Organization for Standardization (ISO)

ISO/DIS 11979-7 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
ISO/FDIS 11979-7:2011 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses- Part 10:Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
ISO 11979-10:2006 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses
ISO 11979-1:2018 Ophthalmic implants — Intraocular lenses — Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
ISO 11979-9:2006 Ophthalmic implants - Intraocular lenses - Part 9: Multifocal intraocular lenses
ISO 11979-10:2006/Amd 1:2014 Ophthalmic implants - Intraocular lenses - Part 10: Phakic intraocular lenses; Amendment 1

KR-KS

KS P ISO 11979-7-2021 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
KS P ISO 11979-10-2019 Ophthalmic implants — Intraocular lenses — Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes
KS C IEC 60679-2-2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 60679-2-2018(2023) Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 61178-2-2018 Quartz crystal units — A specification in the IEC Quality Assessment System for Electronic Components (IECQ) — Part 2: Sectional specification – Capability approval

SE-SIS

SIS SS CECC 20003-1988 Blank detail specification: Phototransistors, photodar/ington transistors, phototransistor arrays

PH-BPS

PNS IEC 62435-5:2021 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices

DIN

DIN EN ISO 11979-7:2024 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2024); German version EN ISO 11979-7:2024

Indonesia Standards

SNI 3140.1-2008 Cristal sugar - Part 1: raw sugar

European Committee for Standardization (CEN)

EN ISO 11979-7:2024 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2024)
EN ISO 11979-10:2018 Ophthalmic implants - Intraocular lenses - Part 10: Clinical investigations of intraocular lenses for correction of ametropia in phakic eyes

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JES2-1992 Transistor, Gallium Arsenide Power Fet, Generic Specification

European Standard for Electrical and Electronic Components

EN 120003:1992 Blank detail specification: phototransistors, photodarlington transistors, phototransistor arrays

Others: molecular crystal