Amorphous preparation method
Amorphous preparation method, Total:37 items.
The international standard classification for "Amorphous preparation method" includes: Semiconducting materials , Testing of metals , Optics and optical measurements in general , Measurement of electrical and magnetic quantities .
The Chinese standard classification for "Amorphous preparation method" includes: Metal physical property test method , Semimetal and semiconductor material in general , Material and component for instrument and meter .
Group Standards of the People's Republic of China
- T/CSAE 58-2017 Test method for estimating average grain size of microalloying non-quenched and tempered steel and its products
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
- GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
- GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
- GB/T 16863-1997 Method for testing refractive index of crystals
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 19346.3-2021 Methods of measurement of amorphous and nanocrystalline alloys-Part 3:AC magnetic properties of Fe-based amorphous strip using a single sheet specimen
Japanese Industrial Standards Committee (JISC)
- JIS H 7151:1991 Method of determining the crystallization temperatures of amorphous metals
- JIS H 7153:1991 Measuring method for high frequency core loss in amorphous magnetic cores
- JIS C 8934:1995 Measuring method of output power for amorphous solar cells
- JIS C 8935:1995 Measuring method of output power for amorphous solar modules
- JIS H 7152:1996 Methods of measurement of the magnetic properties of amorphous metals by means of a single sheet tester
- JIS C 7030:1993 Measuring methods for transistors
- JIS C 8936:1995 Measuring methods of spectral response for amorphous solar cells and modules
- JIS C 8935 AMD 1:2005 Measuring method of output power for amorphous solar modules (Amendment 1)
- JIS C 8934 AMD 1:2005 Measuring method of output power for amorphous solar cells (Amendment 1)
- JIS C 8940:1995 Outdoor measuring method of output power for amorphous solar cells and modules
- JIS C 8938:1995 Environmental and endurance test methods for amorphous solar cell modules
Korean Agency for Technology and Standards (KATS)
- KS D 0069-2002(2022) Method of determining the crystallization temperatures of amorphous metals
- KS D 0069-2022 Method of determining the crystallization temperatures of amorphous metals
- KS D 0069-2002(2017) Method of determining the crystallization temperatures of amorphous metals
- KS D 0069-2002 Method of determining the crystallization temperatures of amorphous metals
- KS C 6024-2002 MEASURING METHODS FOR TRANSISTORS
GOST
- GOST 25734-1983 Alumina. Method for the crystallooptic determination of monocrystals in non metallurgical alumina
RO-ASRO
- STAS 11437-1980 UNI.IONCTION TRANSISTORS Methods de test
- STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties
- STAS 12124/1-1982 Semiconductor devices BIPOLAR TRANZISTORS Methods for measuring electrical static parameters
- STAS 12124/3-1983 Semiconductor devices FIFL D-EFFECT TRANZISTORS Methods for measuring electrical static parameters
- STAS 12124/4-1983 Semiconductor devices FIELD-EFECT TRANZISTORS Methods for measuring electrical static parameters
CZ-CSN
- CSN 35 8759-1977 Semiconductor devices. Transistors. Methods of measurement of switching times
- CSN 35 8752-1976 Semiconductor devices. Transistors. Measuring methods for common base output capacitance.
- CSN 64 0209-1974 Preparation of test specimens of amorphous crmoplastic materials with a defined levcl l shrinkage
- CSN 35 8757 Cast.9-1986 Transistors. Methods for measurement of thermal resistance
PL-PKN
- PN BN 8093-02-1965 Long-lasting sugar products. Non-crystalline gummies. total requirements
- PN T01504 ArkusZ26-1974 Transislors rbb' measuremen?s
European Committee for Standardization (CEN)
- EN 13383-2:2013 Armourstone - Part 2: Test methods
IEEE - The Institute of Electrical and Electronics Engineers@ Inc.
- IEEE 218-1956 STANDARD METHODS OF TESTING TRANSISTORS
SCC
- BS 2782-9 METHOD 940B:1981 Methods of testing plastics. Sampling and test specimen preparation-Preparation of test specimens of amorphous thermoplastic moulding material with a defined level of shrinkage in the form of rectangular plates by injection moulding
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