Cubic crystal

Cubic crystal, Total:91 items.

The international standard classification for "Cubic crystal" includes: Semiconducting materials , Testing of metals , Piezoelectric and dielectric devices , Optics and optical measurements in general , Optoelectronics. Laser equipment , Optics and optical measurements , Ophthalmic equipment .

The Chinese standard classification for "Cubic crystal" includes: Metal nondestructive testing method , Metal physical property test method , Semimetal and semiconductor material in general , Quartz crystal and piezoelectric element , Material and component for instrument and meter , Special electronic technology material , Artificial lens , Medical optical instrument and endoscope .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB/T 43724-2024 Test method for liquid crystal monomers
GB/T 1555-2023 Test methods for determining the orientation of a semiconductive single crystal
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
GB/T 6430-1986 The rule of type designation for crystal holders (enclosures)
GB/T 44567-2024 Optics crystal—Ultraviolet grade calcium fluride crystal
GB/T 11295-1989 The rule of designation for laser crystal rods
GB 6430-1986 The rule of type designation for crystal holders (enclosures)
GB/T 16863-1997 Method for testing refractive index of crystals
GB/T 14144-1993 Test method for determination of radial interstitial oxygen variation in silicon

Group Standards of the People's Republic of China

T/CAB 0180-2022 Measurement method for characteristic parameters of GAGG crystal and crystal array

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 39865-2021 Method for measuring refractive index of uniaxial optical crystals

Professional Standard - Electron

SJ/T 10638-1995 Measurement methods for quartz crystal oscillators
SJ/T 10333-1993 Methods of measurement for uni-junction transistors

Professional Standard - Machinery

JB/T 9495.2-1999 Measuring method for refractive index of optical crystals
JB/T 9495.3-1999 Measuring method for transmittance of optical crystal
JB/T 9395.3-1999 Measuring method for transmittance of optical crystal

Professional Standard - Medicine

YY 0290.10-2009 Intraocular lenses—Part 10:Phakic intraocular lenses

Professional Standard - Commodity Inspection

SN/T 1175-2003 Methods for the inspection of thin film transistor color liquid crystal display devices for import and export

British Standards Institution (BSI)

BS EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Crystal units with thermistors
BS EN 60122-1:2003 Quartz crystal units of assessed quality. Generic specification
BS EN 60122-1:2002 Quartz crystal units of assessed quality. Generic specification
BS EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality. Generic specification
BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
BS EN 60122-3:2011 Quartz crystal units of assessed quality. Standard outlines and lead connections
BS EN 60122-3:2010 Quartz crystal units of assessed quality. Standard outlines and lead connections
BS EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality. Standard outlines and lead connections
BS EN 60679-5:1998 Quartz crystal controlled oscillators of assessed quality. Sectional specification. Qualification approval
BS EN 60679-4:1998 Quartz crystal controlled oscillators of assessed quality. Sectional specification. Capability approval

International Electrotechnical Commission (IEC)

IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
IEC 60122-1:2002+AMD1:2017 CSV Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
IEC 60679-1:1997 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
IEC 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 60122-1:2002/AMD1:2017 Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
IEC 60679-5:1998 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
IEC 60679-4:1997 Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide

SCC

BS 9610:1982 Specification for quartz crystal units of assessed quality: generic data and methods of test
BS EN 60679-1:1998 Quartz crystal controlled oscillators of assessed quality-Generic specification
CEI EN 60122-1/A1:2004 Quartz crystal units of assessed quality Part 1: Generic specification
CEI EN 60122-1:2004 Quartz crystal units of assessed quality Part 1: Generic specification
BS 9364:1973 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: switching transistors
BS 9361:1971 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: high frequency, low power transistors
BS EN ISO 11979-10:2006+A1:2014 Ophthalmic implants. Intraocular lenses-Phakic intraocular lenses
BS 9360:1971 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low frequency, low power transistors
08/30191168 DC BS EN 60679-6. Quartz crystal controlled oscillators of assessed quality. Part 6. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
BS 9602:1984 Blank detail specification for quartz crystal filters of assessed quality: full assessment level

German Institute for Standardization

DIN EN 60122-1:2003 Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 60122-1:2002); German version EN 60122-1:2002
DIN EN 60679-1:2008 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2007); German version EN 60679-1:2007

Korean Agency for Technology and Standards (KATS)

KS C IEC 60122-1:2022 Quartz crystal units of assessed quality — Part 1: Generic specification
KS C 6024-2002 MEASURING METHODS FOR TRANSISTORS
KS C IEC 60679-6:2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
KS C IEC 60679-6-2023 Qualified Quartz Crystal Oscillators Part 6: Application Guidelines for Phase Jitter Measurement Methods for Quartz Crystal Oscillators and Surface Acoustic Wave Oscillators

European Committee for Electrotechnical Standardization（CENELEC）

EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

KR-KS

KS C IEC 60122-1-2022 Quartz crystal units of assessed quality — Part 1: Generic specification
KS C IEC 60679-6-2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines

Japanese Industrial Standards Committee (JISC)

JIS C 7030:1993 Measuring methods for transistors
JIS H 7151:1991 Method of determining the crystallization temperatures of amorphous metals
JIS B 4131:1998 Diamond/CBN products -- Diamond or CBN grinding wheels
JIS B 4138:1998 Diamond/CBN products -- Diamond or CBN segmented saws
JIS B 4130:1998 Diamond/CBN products -- Grain sizes of diamond or cubic boron nitride

CENELEC - European Committee for Electrotechnical Standardization

EN 60679-1:1998 Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification (Incorporates Amendment A1: 2002)

Association Francaise de Normalisation

NF C93-618-1*NF EN 60122-1:2003 Quartz crystal units of assessed quality - Part 1 : generic specification
NF C93-620-1:2013 Quartz crystal controlled oscillators of assessed quality - Part 1: generic specification

U.S. Military Regulations and Norms

ARMY MIL-PRF-55310/8 J-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 50 Hz THROUGH 50 MHz, HERMETIC SEAL, SQUARE WAVE, TTL
ARMY MIL-PRF-55310/18 F-2009 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.01 Hz THROUGH 15.0 MHz, HERMETIC SEAL, SQUARE WAVE, CMOS
ARMY MIL-PRF-55310/28 C-2008 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.0 MHz THROUGH 85 MHz, HERMETIC SEAL, SQUARE WAVE, TTL

YU-JUS

JUS N.R1.450-1981 Bipolar transistors. Measuring methods
JUS N.R1.471-1985 Bipolar transistors. Reference methods of measurement

American National Standards Institute （ANSI)

ANSI Z80.13-2007 Phakic Intraocular Lenses
ANSI Z80.13-2007(R2017) Ophthalmics - Phakic Intraocular Lenses

Danish Standards Foundation

DS/EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

IEEE 218-1956 STANDARD METHODS OF TESTING TRANSISTORS

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Std 218-1956(R1980)*56 IRE 28.S2 IEEE Standard Methods of Testing Transistors

CZ-CSN

CSN 35 8757 Cast.9-1986 Transistors. Methods for measurement of thermal resistance

GB-REG

REG NASA-LLIS-1607--2005 Lessons Learned - Fin Actuator System/Hinge Torque and Output Transistor Failure
REG NASA-LLIS-0924--2000 Lessons Learned ?Tin Whiskers Cause Electrical Shorts

PL-PKN

PN T01208-03-1992 Semiconductor devices Bipolar transistors Measuring methods
PN T01504-04-1987 Transistors Measuring methods Breakdown voltages U(BR) CBO and U(BR) ebo

Spanish Association for Standardization (UNE)

UNE-EN 120003:1992 BDS: PHOTOTRANSISTORS, PHOTOCARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS. (Endorsed by AENOR in September of 1996.)

Lithuanian Standards Office

LST EN 60122-1-2003 Quartz crystal units of assessed quality. Part 1: Generic specification (IEC 60122-1:2002)

HU-MSZT

MSZ 4749-1970 crystalline asbestos

SE-SIS

SIS SS CECC 20003-1988 Blank detail specification: Phototransistors, photodar/ington transistors, phototransistor arrays

RU-GOST R

GOST 18604.8-1974 Transistors. Method for measuring output conductivity
GOST 12578-2016 Sugar lump. Method for determination of small lumps (sugar scraps and crystals)

RO-ASRO

STAS 9675-1974 CRYSTALLINE SILICON

GSO

GSO ISO 11979-10:2014 Ophthalmic implants -- Intraocular lenses -- Part 10: Phakic intraocular lenses
BH GSO ISO 11979-10:2016 Ophthalmic implants -- Intraocular lenses -- Part 10: Phakic intraocular lenses

Others: Prescription,Cubic crystal,Prescription,Microcrystalline