Amorphous and Polycrystalline

Amorphous and Polycrystalline, Total:143 items.

The international standard classification for "Amorphous and Polycrystalline" includes: Semiconducting materials , Other iron and steel products , Steels with special magnetic properties , Glass products , Testing of metals , Testing of metals in general , Magnetic materials , Other non-ferrous metals and their alloys , Sugar. Sugar products. Starch , Measurement of electrical and magnetic quantities , Production. Production management , Other methods of testing of metals , Ophthalmic equipment .

The Chinese standard classification for "Amorphous and Polycrystalline" includes: Elemental semiconductor material , Precision alloy , Compound semiconductor material , Semimetal , Industrial technical glass , Semimetal and semiconductor material in general , Electrician alloy parts , Rare scattered metals and their alloys , Processed sugar , Sugar refining , Metal physical property test method , Technical management , Medical optical instrument and endoscope .

Group Standards of the People's Republic of China

T/CBCSA 36-2021 Corundum polycrystalline slab
T/CISA 025-2020 High-silicon raw alloy for amorphous alloy
T/CECA 72-2022 Gyromagnetic polycrystalline ferrite materials
T/CNIA 0013-2019 Graphite products for polysilicon production
T/CNIA 0014-2019 Porcelain rings for polysilicon production
T/ZZB 0061-2016 Polycrystalline silicon ingot production furnace
T/NXCL 015-2022 Columnar polysilicon for silicon parts
T/ZZB 1041-2019 Polycrystalline silicon solar cell
T/ZZB 0916-2018 Gyromagnetic polycrystalline ferrite
T/ACRI 0025-2020 Multi-composite spinel brick

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 29054-2012 Solar-grade casting multi-crystalline silicon brick
GB/T 31958-2023 Substrate glass for amorphous silicon thin film transistor liquid crystal display device
GB/T 19346-2003 Measuring method of magnetic properties at alternative current for amorphousand nanocrystalline soft magnetic alloys
GB/T 11072-1989 Indium antimonide polycrystal, single crystals and as-cut slices
GB/T 19345.1-2017 Amorphous and nanocrystalline alloys―Part 1:Fe-based amorphous soft magnetic alloy strips
GB/T 12963-2009 Specification for Polycrystalline Silicon
GB/T 3519-2008(英文版) Amorphous graphite
GB/T 12963-2014 Electronic-grade polycrystalline silicon
GB/T 29057-2023 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy
GB/T 12963-2022 Electronic-grade polycrystalline silicon
GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices
GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices
GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy
GB/T 44654-2024 Amorphous soft magnetic alloy wire
GB/T 44655-2024 Amorphous soft magnetic alloy powder
GB/T 25074-2010 Solar-grade polycrystalline silicon
GB/T 29055-2012 Multi-crystalline silicon wafer for solar cell
GB/T 12963-1996 Polycrystalline silicon
GB/T 5238-2009e Monocrystalline germanium and monocrystalline germanium slices
GB 51034-2014 Code for design of polysilicon plant
GB/T 25074-2017(英文版) Solar grade polycrystalline silicon
GB/T 19345.2-2017 Amorphous and nanocrystalline alloy - Part 2: Fe-based nanocrystalline soft magnetic alloy strips
GB/T 19345-2003 Amorphous and nanocrystalline soft magnetic alloy strips

Professional Standard - Light Industry

QB/T 1174-2002 Multicrystal rock sugar
QB/T 1174-1991 Multicrystal rock sugar

轻工业部

QB 1174-1991 Multicrystal Rock Sugar

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices
GB/T 38907-2020 Water saving enterprises- - Polysilicon industry
GB/T 36706-2018 Polycrystalline indium phosphide
GB/T 37051-2018 Test method for determination of crystal defect density in PV silicon ingot and wafer
GB/T 29055-2019 Multicrystalline silicon wafers for photovoltaic solar cell
GB/T 19346.3-2021 Methods of measurement of amorphous and nanocrystalline alloys-Part 3:AC magnetic properties of Fe-based amorphous strip using a single sheet specimen

工业和信息化部

YS/T 1359-2020 Lithium tantalate polycrystalline powder
YS/T 724-2016 Silicon power for polycrystalline
YS/T 1195-2017 Silicon tetrachloride, a by-product of polysilicon

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 25074-2017 Solar-grade polycrystalline silicon
GB/T 19346.2-2017 Methods of measurement for amorphous and nanocrystalline alloys--Part 2: Lamination factor of amorphous alloy strips

Military Standard of the People's Republic of China-General Armament Department

GJB 582A-2020 Specification for polycrystalline magnesium fluoride for lenses
GJB 582-1988 Polycrystalline magnesium fluoride for lenses

Hebei Provincial Standard of the People's Republic of China

DB13/T 1632-2012 Solar Grade Polysilicon Block
DB13/T 1633-2012 Solar Grade Polysilicon Wafer
DB13/T 1631-2012 Solar Grade Polysilicon Ingot

Yunnan Provincial Standard of the People's Republic of China

DB53/T 499-2013 Trichlorosilane for polysilicon

Professional Standard - Electron

SJ/T 10698-1996 Amorphous silicon reference solar cell

Professional Standard - Medicine

YY 0290.9-2010 Ophthalmic implants—Intraocular lenses—Part 9:Multifocal intraocular lenses

Fujian Provincial Standard of the People's Republic of China

DB35/T 1126-2011 Low-light amorphous silicon solar cell

British Standards Institution (BSI)

BS EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-2:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Procedures
BS EN 13925-3:2005(2009) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Instruments
BS EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
BS EN 13925-1:2003(2008) Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - General principles
BS EN ISO 11979-9:2006+A1:2014 Ophthalmic implants — Intraocular lenses — Part 9 : Multifocal intraocular lenses

German Institute for Standardization

DIN EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN EN 13925-3:2005-07 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN EN 13925-3:2005 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments; German version EN 13925-3:2005
DIN EN 13925-2:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 2: Procedures; German version EN 13925-2:2003
DIN EN 13925-1:2003-07 Non-destructive testing - X-ray diffraction from polycristalline and amorphous material - Part 1: General principles; German version EN 13925-1:2003
DIN EN 1330-11:2007-09 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycristalline and amorphous materials; Trilingual version EN 1330-11:2007
DIN EN 1330-11:2007 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycristalline and amorphous materials; Trilingual version EN 1330-11:2007

Association Francaise de Normalisation

NF A09-280-3*NF EN 13925-3:2005 Non destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 3 : instruments.
NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11: X-ray diffraction of polycrystalline and amorphous materials
NF A09-280-2*NF EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycristalline and amorphous materials - Part 2 : procedures
NF A09-280-1*NF EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1 : general principles.
NF EN 13925-2:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 2 : procédures
NF EN 13925-3:2005 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 3 : appareillage
NF EN 13925-1:2003 Essais non destructifs - Diffraction des rayons X appliquée aux matériaux polycristallins et amorphes - Partie 1 : principes généraux
NF A09-020-11*NF EN 1330-11:2007 Non-destructive testing - Terminology - Part 11 : Terms used in X-ray diffraction from polycrystalline and amorphous materials.
NF ISO 18535:2016 Amorphous carbon coatings - Determination of friction and wear characteristics of amorphous carbon coatings by the ball-on-disk method
NF B30-004:1974 GLASS.CRYSTAL,CRYSTAL GLASS,CRYSTALLIN.
NF C26-400:1971 POLYCRYSTALLINE ALUMINA CERAMICS. METHODS OF TEST.

SCC

DANSK DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
AENOR UNE-EN 13925-2:2004 Non destructive essays. X-ray diffraction applied to polycrystalline and amorphous materials. Part 2: Procedures
NS-EN 13925-2:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous materials — Part 2: Procedures
NS-EN 13925-3:2005 Non destructive testing — X ray diffraction from polycrystalline and amorphous materials — Part 3: Instruments
AENOR UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DANSK DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
NS-EN 1330-11:2007 Non-destructive testing — Terminology — Terms used in X-ray diffraction from polycrystalline and amorphous materials
AENOR UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
DANSK DS/EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
AENOR UNE-EN 1330-11:2008 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
NS-EN 13925-1:2003 Non-destructive testing — X-ray diffraction from polycrystalline and amorphous material — Part 1: General principles
DANSK DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
04/19973037 DC BS EN 1330-11. Non-destructive testing. Terminology. Part 11. X-ray diffraction from polycrystalline and amorphous materials
DIN VDE 0556:1966 Regulations for polycrystal semiconductor-rectifiers
DANSK DS/EN ISO 11979-9/A1:2006 Ophthalmic implants – Intraocular lenses – Part 9: Multifocal intraocular lenses

Danish Standards Foundation

DS/EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
DS/EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
DS/EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
DS/EN 13925-1:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles

Lithuanian Standards Office

LST EN 13925-2-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
LST EN 13925-3-2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
LST EN 1330-11-2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
LST EN 13925-1-2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles

Spanish Association for Standardization (UNE)

UNE-EN 13925-3:2006 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
UNE-EN 13925-2:2004 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
UNE-EN 13925-1:2006 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous material - Part 1: General principles
UNE-EN 1330-11:2008 Non-destructive testing - Terminology - Part 11: Terms used in X-ray diffraction from polycrystalline and amorphous materials

European Committee for Standardization (CEN)

EN 13925-3:2005 Non destructive testing - X ray diffraction from polycrystalline and amorphous materials - Part 3: Instruments
EN 13925-2:2003 Non-destructive testing - X-ray diffraction from polycrystalline and amorphous materials - Part 2: Procedures
EN 1330-11:2007 Non-destructive testing - Terminology - Terms used in X-ray diffraction from polycrystalline and amorphous materials
EN 13383-1:2013 Armourstone - Part 1: Specification

CZ-CSN

CSN 42 4991-1970 Polycristallinic germanium
CSN 34 5911-1986 Polycrystalline silicion

UNKNOWN

YB 1601-83 Silicon polycrystalline
YB 1601-1983 Silicon polycrystalline

Korean Agency for Technology and Standards (KATS)

KS E 3802-1975 Amorphous graphite
KS E 3802-1974 Amorphous graphite
KS D 2715-2006 Tensile specimen of single- and poly-crystal nano/micro thin film materials
KS D 0069-2002 Method of determining the crystallization temperatures of amorphous metals
KS D 0069-2002(2022) Method of determining the crystallization temperatures of amorphous metals
KS D 2715-2017 Tensile specimen of single- and poly-crystal nano/micro thin film materials
KS D 0069-2022 Method of determining the crystallization temperatures of amorphous metals
KS D 0068-2002 Glossary of terms used in amorphous metals
KS D 0069-2002(2017) Method of determining the crystallization temperatures of amorphous metals
KS D 0068-2022 Glossary of terms used in amorphous metals
KS D 0068-2002(2022) Glossary of terms used in amorphous metals
KS C IEC 60119-2014(2019) Recommendations for polycrystalline semiconductor rectifier stacks and equipments
KS B 3620-2012 Polycrystalline diamond dies for wire drawing
KS C IEC 60119-2019 Recommendations for polycrystalline semiconductor rectifier stacks and equipments

Japanese Industrial Standards Committee (JISC)

JIS H 7151:1991 Method of determining the crystallization temperatures of amorphous metals
JIS B 4133:1983 Polycrystalline diamond dies for wire drawing
JIS H 7004:1990 Glossary of terms used in amorphous metals
JIS C 8939:1995 Amorphous solar PV modules