GB/T 17007-1997 in English

ABOLISHED

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Standard No:	GB/T 17007-1997
Document status:	ABOLISHED
Superseded on:	2004-10-14
Title in English:	Measuring methods for insulated-gate bipolar transistor
Title in Chinese:	绝缘栅双极型晶体管测试方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1997-10-05
Implemented on:	1998-08-01
ICS Classification:	31.080.30-Transistors
Chinese Classification:	K46-Power semiconductor device and parts
Professional Classification:	GB-National Standard
Related Keywords:	insulated-gate bipolar transistor insulated-gate transistor bipolar methods
Related Topics:	Insulated Gate Bipolar Transistor Insulated Gate Bipolar Transistor Crystal form detection method flexible bipolar tube two-electrode system method of producing crystals Transistor tester method of making crystals polar crystals and non-polar crystals crystal pole Two-electrode method and three-electrode method Transistor ft tester Pole figure test method test test double open Grating Grating type double monochromator twin crystal interface GBT17007 bipolar transistor electrolyte gated transistor Insulating pad test method Two-electrode gradient detection method Band gap test method for insulators hydrogen peroxide crystals How to reset the insulation tester to zero Crystal Form Methodology Test method for insulation performance of copper tube

《GB/T 17007-1997绝缘栅双极型晶体管测试方法》由TC78（全国半导体器件标准化技术委员会）归口，主管部门为工业和信息化部（电子）。
本标准适用于N沟道绝缘栅双极型晶体管的电、热特性测量和额定值检验。

More samples: DL/T 5154-2012 DL/T 368-2010 JC/T 2453-2018

Sample only — not a preview of GB/T 17007-1997

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