GB/T 47239.6-2026 in English
TO BE VALIDSemiconductor devices—Flexible and stretchable semiconductor devices—Part 6:Test method for sheet resistance of flexible conducting films
- Issued on:2026-08-28
- Implemented on:2027-03-01
- File Format:PDF
- Delivery:RFQ
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| Standard No: | GB/T 47239.6-2026 |
| Document status: | TO BE VALID |
| Title in English: | Semiconductor devices—Flexible and stretchable semiconductor devices—Part 6:Test method for sheet resistance of flexible conducting films |
| Title in Chinese: | 半导体器件 柔性可拉伸半导体器件 第6部分：柔性导电薄膜的薄层电阻测试方法 |
| Language: | English |
| File Format: | Electronic (PDF) |
| Delivery: | RFQ |
| Issued on: | 2026-08-28 |
| Implemented on: | 2027-03-01 |
| ICS Classification: | 31.080.99-Other semiconductor devices |
| Chinese Classification: | L40-Semiconductor discrete devices in general |
| Professional Classification: | GB-National Standard |
《GB/T 47239.6-2026半导体器件 柔性可拉伸半导体器件 第6部分：柔性导电薄膜的薄层电阻测试方法》由TC78（全国半导体器件标准化技术委员会）归口，主管部门为工业和信息化部（电子）。
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