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scrap-wavelength dispersive x-ray fluorescence spectrometry introduction technical background x-ray fluorescence spectrometry wavelength dispersive x-ray fluorescence spectrometer printed circuit board waste copper content silk scarves optical fiber access biosafety risk assessment
HS/T 62-2019 in English

HS/T 62-2019 in English

VALID

Determinat ion of copper content in printed circuit board waste and scrap-Wavelength dispersive X-Ray fluorescence spectrometry

  • Issued on:2019-12-19
  • Implemented on:2020-06-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $160.00
$156.00
Standard No: HS/T 62-2019
Document status: VALID
Title in English: Determinat ion of copper content in printed circuit board waste and scrap-Wavelength dispersive X-Ray fluorescence spectrometry
Title in Chinese: 印刷电路板(PCB)废碎料中铜含量测定方法--波长色散型X 射线荧光光谱法
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 2019-12-19
Implemented on: 2020-06-01
ICS Classification: 71.040.50-Physicochemical methods of analysis
Professional Classification: HS-Customs
Related Keywords: scrap-wavelength dispersive x-ray fluorescence spectrometry introduction technical background
x-ray fluorescence spectrometry
wavelength dispersive x-ray fluorescence spectrometer
printed circuit board waste
copper content
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本标准规定了对PCB 废碎料中铜含量进行定量分析的测试方法。
本标准适用于PCB 废碎料中铜含量的测定,测定范围:10.0 g/100g~56.0 g/100g。


Introduction

Technical Background of the Standard

This standard aims at the demand for resource utilization of electronic waste and establishes a standardized method for determining the copper content in PCB waste using a wavelength dispersive X-ray fluorescence spectrometer. As the global electronic product scrapping volume increases by an average of 8.7% per year, this standard provides key technical support for customs supervision and the recycling industry.


Detailed explanation of the method principle

Processing stageEquipment requirementsKey parametersQuality control points
Crushing pretreatmentCrusher (5cm sieve)Particle size ≤5cmSample representativeness
Ignition treatmentMuffle furnace (≥850℃)775-825℃/10hWeight loss rate record
Flake preparationMelt Prototype Machine (≥1150℃)Li₂B₄O₇:LiBO₂=67:33Platinum Crucible Cleanliness

Key Technical Points

1. Sample Preparation Process

Use three-level particle size control: primary crushing → ring mill (100 mesh) → ball mill (500r/min), and burn to eliminate organic components, and finally obtain homogeneous glass frit.

2. Standard Curve Establishment

Configure 5 groups of standard frits (CuO content 10%-70%) according to Appendix A to ensure coverage of the 10.0-56.0g/100g measurement range. The typical ratio is as follows:

Components30%CuO group50%CuO group
CuO0.1200g0.2000g
SiO₂0.1624g0.0996g

Implementation Suggestions

1. Instrument calibration

It is recommended to use Bruker S8 TigerStandard conditions: voltage 50 kV, current 214 mA, analytical line CuKβ1 (2θ=40.461°), instrument drift correction was performed regularly using a platinum-gold alloy crucible (95% Pt+5% Au).

2. Error control

  • Loss on ignition measurement must be accurate to 0.1mg
  • In-house precision ≤0.8g/100g
  • Inter-laboratory comparison difference ≤1.5g/100g

Technology evolution analysis

Compared with traditional wet chemical methods, this standard's X-ray fluorescence spectrometry has the following advantages:

  1. Detection efficiency increased by 5-8 times
  2. Avoid strong acid digestion contamination
  3. Extend the detection limit to 10g/100g
In the future, it can be combined with micro-area XRF technology to achieve element distribution imaging.

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