QJ 2689-1994 in English

Name: QJ 2689-1994 English Version
Brand: China Standards Store
SKU: QJ2689-1994-EN
Availability: InStock
Rating: 4.9 (128 reviews)

VALID

X-Radiographic Examination Test for Remainder in Electronic Devices

Issued on:1994-06-24
Implemented on:1994-12-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $120.00
$117.00

Details of QJ 2689-1994
Sample PDF

Standard No:	QJ 2689-1994
Document status:	VALID
Title in English:	X-Radiographic Examination Test for Remainder in Electronic Devices
Title in Chinese:	电子器件中多余物的X射线照相检验方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1994-06-24
Implemented on:	1994-12-01
ICS Classification:	19.100-Non-destructive testing
Chinese Classification:	L10-Electronic element in general
Professional Classification:	QJ-Aerospace
Related Keywords:	x-radiographic examination test electronic devices test devices examination
Related Topics:	x-ray Electrical component inspection x-ray standard as2689 x-ray classification x-ray classification x-ray Electronic component inspection Electronic component inspection How long is the ray in xrd electrons in x-ray atoms Radiography Radiography Radiography atomic x-ray Component Standards event x squared x-ray device Electronic Component excess Rays Tool for cutting excess leads Multi-group experimental control method Testing methods for polyols Multicomponent mobile phase preparation method

More samples: YD/T 3934-2021 JJG 21-2008 GB 50021-2001(2009)

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