SH/T 0625-1995 in English

VALID

Determination method for γ-Al2O3 content in silica alumina catalyst (X-ray diffraction method)

Issued on:1995-08-14
Implemented on:1995-12-01
File Format:PDF
Delivery:Via email within 1~3 business days

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Standard No:	SH/T 0625-1995
Document status:	VALID
Title in English:	Determination method for γ-Al2O3 content in silica alumina catalyst (X-ray diffraction method)
Title in Chinese:	硅铝催化剂中γ-Al2O3含量测定法(X射线衍射法)
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1995-08-14
Implemented on:	1995-12-01
Chinese Classification:	G75-Catalyst
Professional Classification:	SH-Petrochemical
Related Keywords:	x-ray diffraction method determination method silica alumina catalyst γ-al2o3 content method
Related Topics:	Ray standard Diffraction peak intensity Diffraction peaks shoot peak sh/t 1612.6-1995 Aluminum oxide standard content sh/t 1612.2-1995 Diffraction peak intensity copper silicon x-ray sh/t 1485.3-1995 sh/t3072-1995 sh/t 1612.7-1995 Diffraction peaks Zero Diffraction Silicon Standard Diffraction of Silicon sh t 1612.7 1995 sh/t 1485.1-1995 sh+t+1612.7+1995 broad diffraction peak Diffraction pattern x-ray diffraction x-ray diffraction Underwater Radiographic Inspection Ray Diffraction x-ray laboratory X-ray diffractometry x-ray laboratory How to Quantify by X-ray Diffraction X-ray Diffraction Silica X-ray Diffraction Intermediate Diffraction pattern Diffraction diagram Broadening of x-diffraction peaks Neutron Diffraction Peaks Diffraction standard data Ray Diffraction Silica X-ray Diffraction Peaks diffracted x-rays Diffraction method X-diffraction rays x-ray diffraction diffracted rays X-ray content Silicon standard diffraction peaks Diffraction peaks of x-diffraction silicon Diffraction Broadening no diffraction Diffraction peak position of silicon standard diffraction peak x-ray aluminum Si diffraction peak X-ray diffraction peak broadening X-ray diffraction peak broadening What does x-ray diffraction measure? Catalyst Rays Silicon diffraction peak position Close-packed hexagonal diffraction spot calibration Standard diffractogram method Standard catalyst titanium content sh/t 0614-1995

本标准规定了用X射线的衍射仪测定硅铝催化剂中γ-Al2O3及其他过渡态氧化铝相对含量的方法。
本标准适用于含有氧化硅、氧化铝、硅酸铝（包括无定形硅酸铝、高岭土或硅酸铝分子筛）的催化剂。

More samples: JJG 21-2008 NB/T 47013.2-2015 DL/T 5154-2012

Sample only — not a preview of SH/T 0625-1995

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