SJ 20831-2002 in English

VALID

Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly

Issued on:2002-10-30
Implemented on:2003-03-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $150.00
$146.00

Standard No:	SJ 20831-2002
Document status:	VALID
Title in English:	Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly
Title in Chinese:	4N红钱焦平面探测器杜瓦组件参数测试方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2002-10-30
Implemented on:	2003-03-01
Chinese Classification:	L52-Infrared device
Professional Classification:	SJ-Electronics
Related Keywords:	infrared focal plane detector dewar infrared focal plane detector dewar assembly parameter test method test plane
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