SJ/T 11212-1999 in English

VALID

Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)

Issued on:1999-08-26
Implemented on:1999-12-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $210.00
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Standard No:	SJ/T 11212-1999
Document status:	VALID
Title in English:	Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
Title in Chinese:	石英晶体元件参数的测量第6部分：激励电平相关性（DLD）的测量
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1999-08-26
Implemented on:	1999-12-01
Chinese Classification:	L21-Quartz crystal and piezoelectric element
Professional Classification:	SJ-Electronics
Related Keywords:	quartz crystal unit parameters drive level dependence excitation level dependence crystal components fundamental frequency quartz
Related Topics:	Correlation IEC60444-6 Measurement of Quartz Crystal Parameters Part 6 dld Excitation unit level Crystal parameters Crystal parameters sj/t11209-1999 correlation measure sj t 11213-1999 sj1999 polariton measurement MYPTJ-6/10 specific parameters Quartz crystal quality measurement procedures Quartz crystal excitation power calculation method quartz crystal element Barite quality requirements related

本规范适用于石英晶体件激励电平相关性（DLD）的测量。本标准规定两种试验方法。方法A，以SJ/Z9154.1-87的π型网络为基础，适宜和于该标覆盖的整个频率范围。方法B，是振荡器法，适用于固定条件下大批量基频石英晶体件的测量。

Scope

This standard applies to the measurement of excitation level dependence (DLD) of quartz crystal components. This standard specifies two test methods. Method A, based on the π-type network of SJ/Z 9154.1-1987, is applicable to the entire frequency range covered by this standard. Method B is the oscillator method, which is suitable for the measurement of large quantities of fundamental frequency quartz crystal components under fixed conditions.

More samples: QC/T 942-2021 NB/T 47013.2-2015 GB 50021-2001(2009)

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