IEC60444-6 Measurement of Quartz Crystal Parameters Part 6

IEC60444-6 Measurement of Quartz Crystal Parameters Part 6, Total:126 items.

The international standard classification for "IEC60444-6 Measurement of Quartz Crystal Parameters Part 6" includes: Piezoelectric and dielectric devices .

The Chinese standard classification for "IEC60444-6 Measurement of Quartz Crystal Parameters Part 6" includes: Quartz crystal and piezoelectric element .

Professional Standard - Electron

SJ/T 11212-1999 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
SJ/Z 9154.2-1987 Measurement of quartz crystal unit parameters by zero phase technique in a π-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

未注明发布机构

DIN EN IEC 60444-6 E:2021-07 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
DIN EN 60444-8 E:2014-08 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
DIN EN 60444-6:1997 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 22319.6-2023 Measurement of quartz crystal unit parameters—Part 6: Measurement of drive level dependence(DLD)
GB/T 22319.7-2015 Measurement of quartz crystal unit parameters―Part 7:Measurement of activity dips of quartz crystal units
GB/T 22319.8-2008 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 22319.9-2018 Measurement of quartz crystal unit parameters—Part 9:Measurement of spurious resonances of piezoelectric crystal units

Association Francaise de Normalisation

NF C93-626:2001 Measurement of quartz crystal unit parameters - Part 6 : measurement of drive level dependance (DLD).
NF C93-621-6*NF EN IEC 60444-6:2021 Measurement of quartz crystal unit parameters - Part 6 : measurement of drive level dependence (DLD)
NF C93-621-6*NF EN 60444-6:2014 Measurement of quartz crystal unit parameters - Part 6 : measurement of drive level dependence (DLD)
NF C93-621-8*NF EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
NF C93-621-7*NF EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7 : measurement of activity and frequency dips of quartz crystal units
NF C93-621-8:2005 Measurement of quartz crystal unit parameters - Part 8 : test fixture for surface mounted quartz crystal units.
NF C93-621-9*NF EN 60444-9:2014 Measurement of quartz crystal unit parameters - Part 9 : measurement of spurious resonances of piezoelectric crystal units
NF EN IEC 60444-6:2021 Measurement of parameters of quartz resonators - Part 6: measurement of excitation level dependence (DNE)
NF C93-620-6*NF EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6 : phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

SCC

08/30191241 DC BS EN 60444-6. Measurement of quartz crystal unit parameters. Part 6. Measurement of drive level dependence (DLD)
DIN EN IEC 60444-6:2023 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:2021); German version EN IEC 60444-6:2021
DANSK DS/EN IEC 60444-6:2021 Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD)
CEI EN IEC 60444-6:2023 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
CEI EN 60444-6:2014 Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
DANSK DS/EN 60444-6:2013 Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD)
CEI EN 60444-7:2005 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
DANSK DS/EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
DIN IEC 60444-6 E:2009 Draft Document - Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 49/812/CD:2008)
DANSK DS/EN 60444-8:2017 Measurement of quartz crystal unit parameters – Part 8 : Test fixture for surface mounted quartz crystal units
CEI EN 60444-8:2017 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
DANSK DS/EN 60444-9:2007 Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units
CEI EN 60444-9:2009 Measurement of quartz crystal unit parameters Part 9: Measurement of spurious resonances of piezoelectric crystal units
DIN EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017
DIN EN IEC 60444-6 E:2021 Draft Document - Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 49/1344/CD:2020); Text in German and English
08/30191168 DC BS EN 60679-6. Quartz crystal controlled oscillators of assessed quality. Part 6. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
DIN EN 60444-8/A1 E:2013 Draft Document - Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 49/1061/CD:2013)
DIN EN 60444-8 E:2014 Draft Document - Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 49/1099/CD:2014)
DANSK DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
CEI EN 60679-6:2015 Quartz crystal controlled oscillators of assessed quality Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

Lithuanian Standards Office

LST EN 60444-6-2001 Measurement of quartz crystal unit parameters. Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:1995)
LST EN 60444-7-2004 Measurement of quartz crystal unit parameters. Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004)
LST EN 60444-8-2004 Measurement of quartz crystal unit parameters. Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003)
LST EN 60679-6-2011 Quartz crystal controlled oscillators of assessed quality -- Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011)
LST EN 60444-9-2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007)

British Standards Institution (BSI)

20/30406252 DC BS EN 60444-6. Measurement of quartz crystal unit parameters. Part 6. Measurement of drive level dependence (DLD)
BS EN 60444-7:2004 Measurement of quartz crystal unit parameters - Measurement of activity and frequency dips of quartz crystal units
BS EN 60444-2:1997 Measurement of quartz crystal unit parameters. Phase offset method for measurement of motional capacitance of quartz crystal units
BS EN 60444-2:1993 Measurement of quartz crystal unit parameters - Phase offset method for measurement of motional capacitance of quartz crystal units
BS EN 60444-8:2003 Measurement of quartz crystal unit parameters - Test fixture for surface mounted quartz crystal units
BS EN 60444-8:2017 Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
BS EN 60444-9:2007 Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units

German Institute for Standardization

DIN EN 60444-6:2014-02 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:2013); German version EN 60444-6:2013 / Note: DIN EN 60444-6 (1997-10) remains valid alongside this standard until 2016-07-24.*To be replac...
DIN EN IEC 60444-6:2023-11 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:2021); German version EN IEC 60444-6:2021 / Note: DIN EN 60444-6 (2014-02) remains valid alongside this standard until 2024-10-06.
DIN EN 60444-6:2014 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 60444-6:2013); German version EN 60444-6:2013
DIN EN IEC 60444-6:2021-07 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 49/1344/CD:2020); Text in German and English / Note: Date of issue 2021-06-11*Intended as replacement for DIN EN 60444-6 (2014-02).
DIN EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004); German version EN 60444-7:2004
DIN EN 60444-7:2004-11 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004); German version EN 60444-7:2004
DIN EN 60444-8:2017-11 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017 / Note: DIN EN 60444-8 (2004-03) remains valid alongside this standard until 2020-01-19.
DIN EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007
DIN EN 60444-8:2004 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003); German version EN 60444-8:2003
DIN EN 60444-9:2007-12 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007
DIN EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011); German version EN 60679-6:2011

GSO

OS GSO IEC 60444-6:2014 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
BH GSO IEC 60444-6:2016 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
BH GSO IEC 60444-7:2016 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
GSO IEC 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
GSO IEC 60444-6:2014 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
BH GSO IEC 60679-6:2016 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
GSO IEC 61080:2014 Guide to the measurement of equivalent electrical parameters of quartz crystal units
OS GSO IEC 60679-6:2014 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
OS GSO IEC 61080:2014 Guide to the measurement of equivalent electrical parameters of quartz crystal units
GSO IEC 60679-6:2014 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
BH GSO IEC 61080:2016 Guide to the measurement of equivalent electrical parameters of quartz crystal units

ES-UNE

UNE-EN 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (Endorsed by AENOR in November of 2013.)
UNE-EN IEC 60444-6:2021 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (Endorsed by Asociación Española de Normalización in November of 2021.)
UNE-EN 60444-7:2004 Measurement of queartz crystal unit parameters -- Part 7: Measurement of activity and frequency dips of quartz crystal units (Endorsed by AENOR in September of 2004.)
UNE-EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units (Endorsed by Asociación Española de Normalización in May of 2017.)
UNE-EN 60444-2:1997 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE IN A PI-NETWORK. PART 2: PHASE OFFSET METHOD FOR MEASUREMENT OF MOTIONAL CAPACITANCE OF QUARTZ CRYSTAL UNITS (Endorsed by AENOR in October of 1997.)
UNE-EN 60444-9:2007 Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007). (Endorsed by AENOR in August of 2007.)

International Electrotechnical Commission (IEC)

IEC 60444-6:2021 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
IEC 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
IEC 60444-6:2021 RLV Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
IEC 60444-6:1995 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
IEC 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
IEC 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
IEC 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
IEC 61080:1991 Guide to the measurement of equivalent electrical parameters of quartz crystal units
IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide

European Committee for Electrotechnical Standardization（CENELEC）

EN 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
EN 60444-7:2004 Measurement of quartz crystal unit parameters Part 7: Measurement of activity and frequency dips of quartz crystal units
EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
EN 60444-8:2003 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units

KR-KS

KS C IEC 60444-6-2023 Measurement of quartz crystal unit parameters — Part 6: Measurement of drive level dependence(DLD)
KS C IEC 60444-8-2016 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
KS C IEC 60444-7-2016 Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
KS C IEC 61080-2018 Guide to the measurement of equivalent electrical parameters of quartz crystal units
KS C IEC 60444-9-2016 Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
KS C IEC 61080-2018(2023) Guide to the measurement of equivalent electrical parameters of quartz crystal units
KS C IEC 60679-6-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines

Danish Standards Foundation

DS/EN 60444-6:2013 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
DS/EN IEC 60444-6:2021 Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD)
DS/EN 60444-6:1998 Measurement of quartz crystal unit parameters - part 6: Measurement of drive level dependence (DLD)
DS/EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
DS/EN 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
DS/EN 60444-9:2007 Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units
DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

CENELEC - European Committee for Electrotechnical Standardization

EN 60444-6:1997 Measurement of Quartz Crystal Unit Parameters Part 6: Measurement of Drive Level Dependence (DLD)
EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

AT-OVE/ON

OVE EN IEC 60444-6:2021 Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 49/1354/CDV) (english version)

Korean Agency for Technology and Standards (KATS)

KS C IEC 60444-8:2016 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
KS C IEC 60444-7-2016(2021) Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
KS C IEC 60444-7-2021 Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
KS C IEC 60444-7:2016 Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
KS C IEC 60444-8-2021 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
KS C IEC 60444-8-2016(2021) Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
KS C IEC 60444-9-2016(2021) Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
KS C IEC 60444-9:2016 Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
KS C IEC 60444-9-2021 Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
KS C IEC 61080:2018 Guide to the measurement of equivalent electrical parameters of quartz crystal units
KS C IEC 61080-2023 Quartz Crystal Equivalent Electrical Parameter Measurement Guide
KS C IEC 60444-2-2002(2017) Measurement of quartz crystal unit parameters by zero phase technique in a p-network－Part 2：Phase offset method for measurement of motional capacitance of quartz crystal units
KS C IEC 60444-2-2022 Measurement of quartz crystal unit parameters by zero phase technique in a p-network－Part 2：Phase offset method for measurement of motional capacitance of quartz crystal units
KS C IEC 60444-2-2002(2022) Measurement of quartz crystal unit parameters by zero phase technique in a p-network－Part 2：Phase offset method for measurement of motional capacitance of quartz crystal units

IN-BIS

IS 8271 Pt.6/Sec.6-1991 Specification for Quartz Crystal Units for Frequency Control and Selection Part 6 BF Series Oscillators Section 6: Quartz Crystal Unit Types BF-06

IEC - International Electrotechnical Commission

PAS 60679-6-2008 Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide (Edition 1.0)

Others: IEC60444-6 Measurement of Quartz Crystal Parameters Part 6