SJ/Z 9154.2-1987 in English

VALID

Measurement of quartz crystal unit parameters by zero phase technique in a π-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Issued on:1988-01-06
Implemented on:1988-01-06
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $210.00
$204.00

Standard No:	SJ/Z 9154.2-1987
Document status:	VALID
Title in English:	Measurement of quartz crystal unit parameters by zero phase technique in a π-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Title in Chinese:	用π型网络零相位法测量石英晶体件参数第二部分：测量石英晶体件动态电容的相位偏置法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1988-01-06
Implemented on:	1988-01-06
Professional Classification:	SJ-Electronics
Related Keywords:	quartz crystal unit parameters quartz crystal components quartz crystal units scopethis standard total measurement error measurement circuit
Related Topics:	quartz crystal the crystal quartz IEC60444-6 Measurement of Quartz Crystal Parameters Part 6 quartz crystal phase binary unit of measure binary aspect binary phase analysis binary phase structure lattice phase Crystal parameters Crystal parameters Quartz Standard phase of xrd crystal xrd crystal phase Crystalline amorphous phase Constant phase element crystal phase phase field crystal relative potential measurement SJ/Z 3206.8 Quartz crystal quality measurement procedures Phase determination quartz crystal element

Scope

This standard describes a method for measuring the dynamic capacitance of quartz crystal components from 1 to 125MHz, with a total measurement error of approximately 5%. The advantage of this method is that it only uses the measurement circuit described in the SJ/Z 9154-87 (IEC 444) standard, and No additional parts or instruments are required, which can be a source of error.

More samples: DL/T 5154-2012 JGJ 94-2008 JJG 21-2008

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