crystal phase

crystal phase, Total:62 items.

The international standard classification for "crystal phase" includes: Advanced ceramics .

The Chinese standard classification for "crystal phase" includes: Laser device .

Professional Standard - Building Materials

JC/T 2146-2012 Heavily MgO-doped lithium niobate crystal for quasi-phase-matching application

Professional Standard - Electron

SJ/Z 9154.2-1987 Measurement of quartz crystal unit parameters by zero phase technique in a π-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Group Standards of the People's Republic of China

T/CPIA 0046-2022 Fixing tape for crystalline silicon photovoltaic modules

Professional Standard - Non-ferrous Metal

YS/T 1655-2023 Chemical vapor deposition of zinc sulfide crystals

Korean Agency for Technology and Standards (KATS)

KS C IEC 60444-2-2002(2017) Measurement of quartz crystal unit parameters by zero phase technique in a p-network－Part 2：Phase offset method for measurement of motional capacitance of quartz crystal units
KS C IEC 60444-2-2022 Measurement of quartz crystal unit parameters by zero phase technique in a p-network－Part 2：Phase offset method for measurement of motional capacitance of quartz crystal units
KS C IEC 60444-2-2002(2022) Measurement of quartz crystal unit parameters by zero phase technique in a p-network－Part 2：Phase offset method for measurement of motional capacitance of quartz crystal units

Spanish Association for Standardization (UNE)

UNE-EN 60444-2:1997 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE IN A PI-NETWORK. PART 2: PHASE OFFSET METHOD FOR MEASUREMENT OF MOTIONAL CAPACITANCE OF QUARTZ CRYSTAL UNITS (Endorsed by AENOR in October of 1997.)
UNE-EN 60444-1/A1:1999 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network. (Endorsed...
UNE 21099:1966 INDICATIVE TIMETABLE INDEX OF PHASE POSITION FOR TRIPHASIC NETWORKS CONDUCTORS

German Institute for Standardization

DIN EN 60444-2:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
DIN EN 60444-2:1997-10 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
DIN EN 60444-1:2000 Measurement of quartz crystal unit parameters by zero phase technique in a -network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network (IEC 60444

Association Francaise de Normalisation

NF C93-622*NF EN 60444-2:2001 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2 : phase offset method for measurement of motional capacitance of quartz crystal units.
NF C93-621*NF EN 60444-1 + A1:2000 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1 : basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
NF EN 60679-6:2011 Quality assured crystal driven oscillators - Part 6: Phase jitter measurement method for crystal oscillators and SAW oscillators - Application guidelines
NF C93-620-6*NF EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6 : phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

British Standards Institution (BSI)

BS EN 60444-2:1997 Measurement of quartz crystal unit parameters. Phase offset method for measurement of motional capacitance of quartz crystal units
BS EN 60444-2:1993 Measurement of quartz crystal unit parameters - Phase offset method for measurement of motional capacitance of quartz crystal units
BS EN 60444-1:1997 Measurement of quartz crystal unit parameters. Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a π-network
BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines

International Electrotechnical Commission (IEC)

IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 2 : phase offset method for measurement of motional capacitance of quartz crystal units
IEC 60444-1:1986 Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 1: basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network
IEC 60444-1:1986/AMD1:1999 Measurement of quartz crystal unit parameters by zero phase technique in a -network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network; Amendment
IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
IEC 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide

IN-BIS

IS 9728-1981 Specification for phase shift method for measurement of moving capacitance of quartz crystals

Danish Standards Foundation

DS/EN 60444-2:1998 Measurement of quartz crystal unit parameters by zero phase technique in a PI-Network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
DS/EN 60444-1:1998 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
DS/EN 60444-1/A1:2001 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
DS/EN 60444-3:1998 Measurement of quartz crystal unit parameters by zero phase technique in a pi-Network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the p

GSO

GSO IEC 60444-2:2015 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
OS GSO IEC 60444-1:2014 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
BH GSO IEC 60679-6:2016 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
OS GSO IEC 60679-6:2014 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

Lithuanian Standards Office

LST EN 60444-2-2001 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980)
LST EN 60444-1+A1-2001 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network (IEC 60444-1:
LST EN 60444-3-2001 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the pa

SCC

DANSK DS/EN 60444-2:1997 Measurement of quartz crystal unit parameters by zero phase technique in a PI-Network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
DANSK DS/EN 60444-1:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
BS DD IEC/PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality-Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
DANSK DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
AENOR UNE 21099:1966 Indicative hourly indices of the phase position for the conductors of three-phase networks.
CEI EN 60679-6:2015 Quartz crystal controlled oscillators of assessed quality Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

U.S. Military Regulations and Norms

ARMY MIL-PRF-3098 K-2010 CRYSTAL UNITS, QUARTZ GENERAL SPECIFICATION FOR
ARMY MIL-PRF-3098 K (1) SUPP 1-2013 CRYSTAL UNITS, QUARTZ GENERAL SPECIFICATION FOR
ARMY MIL-PRF-3098 K (1)-2011 CRYSTAL UNITS, QUARTZ GENERAL SPECIFICATION FOR

Defense Logistics Agency

DLA QPL-3098-99-2013 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA QPL-3098-93-2010 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA QPL-3098-98-2013 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA QPL-3098-92-2008 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA QPL-3098-95-2010 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA QPL-3098-97-2013 CRYSTAL UNITS, QUARTZ, GENERAL SPECIFICATION FOR
DLA DSCC-DWG-94023 REV B-2007 CRYSTAL UNIT, QUARTZ, MINIATURE, SURFACE MOUNT
DLA DSCC-DWG-94024 REV B-2007 CRYSTAL UNIT, QUARTZ, MINIATURE, PRINTED CIRCUIT MOUNT

YU-JUS

JUS N.R9.031-1986 Piezoelectric vibrators. Measurement of qu'?rtz crystal unit parameters by zero phase technique in a n-network. Phase offsetmethod of measurement of motionaf capacitance of guartz crystal unit

CZ-CSN

CSN 35 8490 Z1-1996 Piezoelectric Crystal Units for Oscillators and Filters

IEC - International Electrotechnical Commission

PAS 60679-6-2008 Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide (Edition 1.0)

CENELEC - European Committee for Electrotechnical Standardization

EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

KR-KS

KS C IEC 60679-6-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
KS C IEC 60679-6-2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines