SN/T 3346-2012 in English
VALIDDetermination of silicon, manganese, phosphorus, chromium, vanadium in chrome-vanadium steel-Wave dispersive X-ray fluorescence spectrometry
- Issued on:2012-12-12
- Implemented on:2013-07-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$136.00
Scope
This standard specifies the wavelength dispersive X-ray fluorescence spectrometry method for the determination of silicon, manganese, phosphorus, chromium and vanadium content in chromium vanadium steel. This standard is applicable to the determination of silicon, manganese, phosphorus, chromium and vanadium content in chromium vanadium steel. The measurement range is shown in Table 1.

Loading PDF document...
Error loading PDF. Please make sure the file is valid and try again.
We also recommend
-

SN 0283-1994 in English
\"Method for Inspection of Dichlorodipyridinol Residues in Exported Poultry Meat\"
1994-02-18 -

SN/T 0337-2019 in English
Determination of carbofuran and its metabolite residues in plant-derived food for export-HPLC-MS/MS method
2019-12-27 -

SN/T 0621-2013 in English
Determination of hydrocarbon in beeswax for export
2013-03-01 -

SN/T 0420-2010 in English
Inspection method of Trichinella spiralis in pork for export—Magnetic stirrer method for pooled sample digestion
2010-11-01 -

SN/T 4747.2-2017 in English
Determination of macrolide residues in live animal for import and export-MIA method
2017-05-12 -

SN/T 0244-1994 in English
\"General Rules for Inspection and Certification of Imported Mechanical and Electrical Instruments\"
1993-08-01