SN/T 3348-2012 in English
VALIDDetermination of silicon, manganese, phosphorus, chromium, nickel and tungsten in chrome-nickel-tungsten steel - Wave-length dispersive X-ray fluorescence spectrometry
- Issued on:2012-12-12
- Implemented on:2013-07-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$156.00
Scope
This standard specifies the wavelength dispersive X-ray fluorescence spectrometry method for the determination of silicon, manganese, phosphorus, chromium, nickel and tungsten content in chromium-nickel tungsten steel. This standard is applicable to the determination of silicon, manganese, phosphorus, chromium, nickel and tungsten content in chromium-nickel tungsten steel. The measurement range is shown in Table 1.

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