T/CIE 152-2022 in English
VALIDTest method and procedure for identification of physical characteristics of fake and counterfeit microelectronics devices
- Issued on:2022-12-31
- Implemented on:-
- File Format:PDF
- Delivery:Via email within 1~3 business days
Price(USD)：
$250.00
$243.00
$243.00
| Standard No: | T/CIE 152-2022 |
| Document status: | VALID |
| Title in English: | Test method and procedure for identification of physical characteristics of fake and counterfeit microelectronics devices |
| Title in Chinese: | 微电子器件假冒翻新物理特征识别方法与程序 |
| Language: | English |
| File Format: | Electronic (PDF) |
| Delivery: | Via email within 1~3 business days |
| Issued on: | 2022-12-31 |
| ICS Classification: | 19.020-Test conditions and procedures in general |
| Chinese Classification: | L74-Program language |
| Professional Classification: | T/-Social Organization Standard |
| Related Keywords: | counterfeit microelectronics devices scopethis document
physical characteristics microelectronic devices internal feature analysis internal microscopic feature analysis |
| Related Topics: | Microelectronics
Representation and Identification Characteristic peak identification Microelectronics recognition methods Procedural method features summer vacation news Microelectronic device test methods and procedures Counterfeit component standards |
本文件规定了微电子器件假冒翻新物理特征识别方法与程序，包括外部特征分析、内部特征分析以及内部微观特征分析。
本文件适用于塑封及气密封装的微电子器件。
Scope
This document specifies the methods and procedures for identifying the physical characteristics of counterfeit and refurbished microelectronic devices, including external feature analysis, internal feature analysis and internal microscopic feature analysis. This document applies to microelectronic devices for military and civilian use.
Sample only — not a preview of T/CIE 152-2022
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